Solidification Interface Morphologies in Zone Melting Recrystallization

1986 ◽  
Vol 74 ◽  
Author(s):  
J. S. Im ◽  
C. V. Thompson ◽  
H. Tomita
Keyword(s):  
Optical Microscopy ◽  
Radiation Intensity ◽  
Zone Melting ◽  
Spatial Gradient ◽  
Solid Interface ◽  
Solidification Interface ◽  
Moving Liquid

AbstractUsing in situ optical microscopy we have studied the morphology of the liquid-solid interface during zone melting recrystallization. We have observed a variety of interface morphologies, each of which corresponds to specific types and distributions of subboundaries in the solidified material. We have also observed a variety of morphologies for stationary interfaces. We propose that perturbations in both the stationary and moving liquid-solid interfaces develop, at least in part, due to the spatial gradient in the radiation intensity in the region of the interface.

Morphological Features of the Solid-Liquid Interface of a Gallium Film

1991 ◽  
Vol 237 ◽  
Author(s):  
Richard D. Robinson ◽  
Ioannis N. Miaoulis
Keyword(s):  
Preliminary Investigation ◽  
Zone Melting ◽  
Liquid Interface ◽  
Silicon Films ◽  
Processing Conditions ◽  
Scanning Velocity ◽  
Solidification Interface ◽  
Solid Liquid Interface ◽  
Solid Liquid

ABSTRACTThis paper presents a new experimental method to investigate solid-liquid interface morphologies during Zone-Melting-Recrystallization at lower than the typical processing temperatures. Gallium films were used as a substitute for silicon films. In situ preliminary investigation identified three phenomena typically occurring during ZMR of silicon films: a) Transition from planar to dendritic to cellular morphologies was observed for different processing conditions; b) cell period proved to be dependant on scanning velocity; c) instabilities at the solidification interface at low heating strip temperatures were caused by supercooling and optical property variations as the material changed phase.

Liquid-Solid Interface Morphologies and Defect Structures in Zone-Melting-Recrystallized Silicon-On-Insulator Films

1987 ◽  
Vol 107 ◽  
Author(s):  
J. S. Im ◽  
C. K. Chen ◽  
C. V. Thompson ◽  
M. W. Geis ◽  
H. Tomita
Keyword(s):  
Zone Melting ◽  
Silicon On Insulator ◽  
Radiative Heating ◽  
Interfacial Region ◽  
Defect Structures ◽  
Interface Morphology ◽  
Experimental Conditions ◽  
Solid Interface ◽  
Free Films

AbstractIn-situ optical microscopy has been used to observe liquid-solid interface morphologies during zone-melting recrystallization of silicon-on-insulator films. These morphologies have been correlated with the defect morphologies of the recrystallized films. Stable cellular solidification fronts, which are obtained at low zone velocities if the radiation intensity gradient in the interfacial region is small, yield subboundary free films. We suggest that under these experimental conditions the interface morphology is primarily the result of radiative heating rather than constitutional supercooling.

In situ synthesis of composite MTiO3–Al2O3 coatings via laser zone melting

2007 ◽  
Vol 9 (5) ◽  
pp. 404-409 ◽  
Author(s):  
V.V. Lennikov ◽  
J.M. Pedra ◽  
J.J. Gómez ◽  
G.F. de la Fuente ◽  
J.B. Carda
Keyword(s):  
Zone Melting ◽  
In Situ Synthesis

scholarly journals In-situ SEM and optical microscopy testing for investigation of fatigue crack growth mechanism under overload

2018 ◽  
Vol 165 ◽  
pp. 13013
Author(s):  
Wei Zhang ◽  
Liang Cai
Keyword(s):  
Growth Rate ◽  
Crack Growth Rate ◽  
Optical Microscopy ◽  
Crack Growth ◽  
Load Condition ◽  
Crack Tip ◽  
Initial Crack ◽  
Crack Growth Behavior ◽  
Single Overload

In this paper, the in-situ scanning electron microscope (SEM) and optical microscopy experiments are performed to investigate the crack growth behavior under the single tensile overload. The objectives are to (i) examine the overload-induced crack growth micromechanisms, including the initial crack growth acceleration and the subsequent retardation period; (ii) investigate the effective region of single overload on crack growth rate. The specimen is a small thin Al2024-T3 plate with an edge-crack, which is loaded and observed in the SEM chamber. The very high resolution images of the crack tip are taken under the simple variable amplitude loading. Imaging analysis is performed to quantify the crack tip deformation at any time instant. Moreover, an identical specimen subjected to the same load condition is observed under optical microscope. In this testing, fine speckling is performed to promote the accuracy of digital imaging correlation (DIC). The images around the crack tip are taken at the peak loads before, during and after the single overload. After that, the evolution of local strain distribution is obtained through DIC technique. The results show that the rapid connection between the main crack and microcracks accounts for the initial crack growth acceleration. The crack closure level can be responsible for the crack growth rate during the steady growth period. Besides that, the size of retardation area is larger than the classical solution.

In situ high temperature optical microscopy study of phase evolution in YBa2Cu3O7−δ films prepared by a fluorine-free sol–gel route

2006 ◽  
Vol 436 (2) ◽  
pp. 62-67 ◽  
Author(s):  
Yulong Zhang ◽  
Xin Yao ◽  
Jie Lian ◽  
Lumin Wang ◽  
Aihua Li ◽  
...  
Keyword(s):  
High Temperature ◽  
Optical Microscopy ◽  
Sol Gel ◽  
Phase Evolution ◽  
Microscopy Study

In-situ imaging of reacting single-particle zeolites by non-linear optical microscopy

2015 ◽  
Author(s):  
Paul J. Wrzesinski ◽  
Mikhail N. Slipchenko ◽  
Taslima A. Zaman ◽  
Robert M. Rioux ◽  
James R. Gord ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Single Particle ◽  
Non Linear ◽  
Linear Optical ◽  
In Situ Imaging

scholarly journals In situ 3D characterization of historical coatings and wood using multimodal nonlinear optical microscopy

2012 ◽  
Vol 20 (22) ◽  
pp. 24623 ◽  
Author(s):  
Gaël Latour ◽  
Jean-Philippe Echard ◽  
Marie Didier ◽  
Marie-Claire Schanne-Klein
Keyword(s):  
Optical Microscopy ◽  
Nonlinear Optical ◽  
Nonlinear Optical Microscopy

scholarly journals Study of Mural Paintings Using In Situ XRF, Confocal Synchrotron-μ-XRF, μ-XRD, Optical Microscopy, and SEM-EDS—The Case of the Frescoes from Misericordia Church of Odemira

2011 ◽  
Vol 17 (5) ◽  
pp. 702-709 ◽  
Author(s):  
S. Valadas ◽  
A. Candeias ◽  
J. Mirão ◽  
D. Tavares ◽  
J. Coroado ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Cross Sections ◽  
Fluorescence Spectrometry ◽  
Pigment Identification ◽  
X Ray ◽  
Color Changes ◽  
Spatially Resolved ◽  
Mural Paintings ◽  
Different Color

AbstractIn this work, we present the results of an analytical method developed for detailed pigment identification, stratigraphy, and degradation of the paint layers of mural paintings applied in the study of the 17th century frescoes from the Misericordia Church of Odemira (Southwest Portugal). In situ X-ray fluorescence spectrometry analyses were performed on three panels of the mural paintings and complemented by colorimetric measurements. The different color areas were also sampled as microfragments (approx. 1 mm2) that were studied as taken or mounted in epoxy resin to expose the different paint layers. The microfragments of paint layers and their cross sections were characterized by optical microscopy and scanning electron microscopy coupled with energy dispersive X-ray spectrometry. Furthermore, elemental analysis was obtained with spatially resolved confocal synchrotron radiation μ-X-ray fluorescence spectrometry performed at ANKA synchrotron FLUO beamline. Occasionally, phase analysis by μ-X-ray diffraction was also performed. Results from the different techniques allowed pigment identification and, in some cases, the evaluation of color changes due to degradation processes and, considering the Southern Portugal geology, the identification of their possible provenance. The pigments used were essentially yellow, brown and red ochres, smalt blue, copper green, and black earths, probably from local sources.

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