A Broad Perspective on the Dynamics of Highly Confined Polymer Films

2001 ◽  
Vol 710 ◽  
Author(s):  
Christopher L. Soles ◽  
Jack F. Douglas ◽  
Wen-Li Wu ◽  
Huagen Peng ◽  
David W. Gidley
Keyword(s):  
Thin Film ◽  
Broad Perspective ◽  
X Ray ◽  
Positron Annihilation Lifetime ◽  
Incoherent Neutron Scattering ◽  
Thermal Expansion Coefficients ◽  
Chemically Amplified ◽  
Expansion Coefficients ◽  
Technological Significance ◽  
Incoherent Neutron

ABSTRACTThe manner in which the dynamics of a polymer are affected by thin film confinement is of technological significance, impacting thin film applications such as lubricants, adhesives, and chemically amplified photoresists. In this manuscript we use specular X-ray reflectivity (SXR), beam positron annihilation lifetime spectroscopy (PALS), and incoherent neutron scattering (INS) to study the influence of thin film confinement on the apparent glass transition temperature Tg and the thermal expansion coefficients of thin polycarbonate (PC) films. Both the SXR and PALS indicate a significant suppression of Tg when the film thickness becomes less than 200 Å. However, the INS measurements suggest an increase in the apparent Tg below this same length scale. These disparate estimates of the thin film Tg seem to indicate that each technique is sensitive to slightly different aspects of the glass formation process. However, all three agree that thin film confinement results in reduced thermal motion, regardless of the precise temperature that is ‘designated' as the thin film Tg.

Temperature dependence of lattice constants of the rare-earth hexaborides EuB6and GdB6

2001 ◽  
Vol 34 (2) ◽  
pp. 208-209 ◽  
Author(s):  
Yasuhiko Takahashi ◽  
Masayoshi Fujimoto ◽  
Masashi Tsuchiko ◽  
Ken-Ichi Ohshima
Keyword(s):  
Rare Earth ◽  
Temperature Dependence ◽  
Linear Thermal Expansion ◽  
X Ray ◽  
Lattice Constants ◽  
Thermal Expansion Coefficients ◽  
Temperature Dependences ◽  
Expansion Coefficients ◽  
Ray Patterns ◽  
The Rare Earth

The temperature dependences of the lattice constants of single crystals of the rare-earth hexaborides EuB6and GdB6were determined by analysing the low-temperature X-ray patterns. The lattice constant decreases monotonously with decreasing temperature. The linear thermal expansion coefficients for the two compounds were also obtained by analysing the temperature dependence of the lattice constants.

The crystal structure and thermal expansion of the CCl4 adduct of Dianin's compound

1990 ◽  
Vol 68 (8) ◽  
pp. 1352-1356 ◽  
Author(s):  
Walter Abriel ◽  
André Du Bois ◽  
Marek Zakrzewski ◽  
Mary Anne White
Keyword(s):  
Crystal Structure ◽  
Thermal Expansion ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Guest Molecules ◽  
X Ray ◽  
Thermal Expansion Coefficients ◽  
Expansion Coefficients ◽  
Dianin's Compound

The crystal structure of the title compound has been determined by single crystal X-ray diffraction data collected at 293 K, and refined to a final Rw of 0.057. The crystals are rhombohedral, space group [Formula: see text], with a = 27.134(8) Å, c = 10.933(2) Å, and Z = 18. The mole ratio of Dianin's compound (4-p-hydroxyphenyl-2,2,4-trimethylchroman) to CCl4 is 6:1. The guest molecules are disordered. X-ray powder diffraction was carried out in the temperature range from 10 to 300 K. From this, the thermal expansion coefficients for the a- and c-axes and the volume have been determined. Keywords: thermal expansion, crystal structure, clathrate.

Measurement of thermal expansion coefficient of substrate GGG and its epitaxial layer YIG

1999 ◽  
Vol 14 (1) ◽  
pp. 2-4 ◽  
Author(s):  
Rui-sheng Liang ◽  
Feng-chao Liu
Keyword(s):  
Thin Film ◽  
Thermal Expansion ◽  
Single Crystal ◽  
Thermal Expansion Coefficient ◽  
Epitaxial Layer ◽  
Expansion Coefficient ◽  
Linear Thermal Expansion ◽  
New Method ◽  
Thermal Expansion Coefficients ◽  
Expansion Coefficients

A new method is used in measuring the linear thermal expansion coefficients in composite consisting of a substrate Gd3Ga2Ga3O12 (GGG) and its epitaxial layer Y3Fe2Fe3O12 (YIG) within the temperature range 13.88 °C–32.50 °C. The results show that the thermal expansion coefficient of GGG in composite is larger than that of the GGG in single crystal; the thermal expansion coefficient of thick film YIG is also larger than that of thin film. The results also show that the thermal expansion coefficient of a composite consisting of film and its substrate can be measured by using a new method.

Structure and Thermal Expansion Behavior of Dy2-xGdxMo4O15 Solid Solution

2008 ◽  
Vol 368-372 ◽  
pp. 1665-1667
Author(s):  
M.M. Wu ◽  
X.L. Xiao ◽  
Y.Z. Cheng ◽  
J. Peng ◽  
D.F. Chen ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Solid Solution ◽  
Thermal Expansion ◽  
Monoclinic Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thermal Expansion Coefficients ◽  
Expansion Behavior ◽  
Expansion Coefficients ◽  
Cell Volumes

A new series of solid solutions Dy2-xGdxMo4O15 (x = 0.0-0.9) were prepared. These compounds all crystallize in monoclinic structure with space group P21/c. The lattice parameters a, b, c and unit cell volumes V increase almost linearly with increasing gadolinium content. The intrinsic thermal expansion coefficients of Dy2-xGdxMo4O15 (x = 0.0 and 0.25) were obtained in the temperature range of 25 to 500°C with high-temperature X-ray diffraction. The correlation between thermal expansion and crystal structure was discussed.

scholarly journals An examination of the thermal expansion of urea using high-resolution variable-temperature X-ray powder diffraction

2005 ◽  
Vol 38 (6) ◽  
pp. 1038-1039 ◽  
Author(s):  
Robert Hammond ◽  
Klimentina Pencheva ◽  
Kevin J. Roberts ◽  
Patricia Mougin ◽  
Derek Wilkinson
Keyword(s):  
Thermal Expansion ◽  
High Resolution ◽  
Variable Temperature ◽  
X Ray Diffraction ◽  
Polymorphic Transformations ◽  
X Ray ◽  
Thermal Expansion Coefficients ◽  
Cell Dimensions ◽  
Expansion Coefficients ◽  
Unit Cell Dimensions

Variable-temperature high-resolution capillary-mode powder X-ray diffraction is used to assess changes in unit-cell dimensions as a function of temperature over the range 188–328 K. No evidence was found for any polymorphic transformations over this temperature range and thermal expansion coefficients for urea were found to be αa= (5.27 ± 0.26) × 10−5 K−1and αc= (1.14 ± 0.057) × 10−5 K−1.

A temperature-dependent structure study of gem-quality hibonite from Myanmar

2010 ◽  
Vol 74 (5) ◽  
pp. 871-885 ◽  
Author(s):  
M. Nagashima ◽  
T. Armbruster ◽  
T. Hainschwang
Keyword(s):  
Room Temperature ◽  
Structure Study ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
X Ray ◽  
Thermal Expansion Coefficients ◽  
Trigonal Bipyramidal ◽  
Expansion Coefficients ◽  
Increasing Temperature ◽  
Length Distortion

AbstractThe structure of hibonite from Myanmar (space group P63/mmc, Z = 2, at room temperature a = 5.5909(1), c = 21.9893(4) Å), with simplified formula CaAl12O19 and composition (Ca0.99Na0.01)Σ1.00 was investigated between temperatures of 100 K and 923 K by single-crystal X-ray diffraction methods. Structure refinements have been performed at 100, 296, 473 and 923 K. In hibonite from Myanmar, Ti substitutes for Al mainly at the octahedral Al4 site and, to a lesser degree, at the trigonal bipyramidal site, Al2. The Al4 octahedra build face-sharing dimers. If Ti4+ substitutes at Al4, adjacent cations repulse each other for electrostatic reasons, leading to off-centre cation displacement associated with significant bond-length distortion compared to synthetic (Ti-free) CaAl12O19. Most Mg and smaller proportions of Zn and Si are assigned to the tetrahedral Al3 site. 12-coordinated Ca in hibonite replaces oxygen in a closest-packed layer. However, Ca is actually too small for this site and engages in a ‘rattling-type’ motion with increasing temperature. For this reason, Ca does not significantly increase thermal expansion coefficients of hibonite. The expansion of natural Ti,Mg-rich hibonite between 296 and 923 K along the x and the z axes is αa = 7.64×10–6 K–1 and αc = 11.19×10–6 K–1, respectively, and is thus very similar to isotypic, synthetic CaAl12O19 and LaMgAl11O19 (LMA).

Experimental Inverstigation on Thermal Expansion Coefficients of SnO2 Thin Film

2012 ◽  
Vol 591-593 ◽  
pp. 965-968
Author(s):  
Jing Wang ◽  
Hong Lai Li ◽  
Mei Hua Liu
Keyword(s):  
Thin Film ◽  
Thermal Expansion ◽  
Real Time ◽  
Correlation Method ◽  
Wide Band ◽  
Electric Heating ◽  
Image Correlation ◽  
Real Time System ◽  
Thermal Expansion Coefficients ◽  
Expansion Coefficients

As a kind of wide band-gap material focused on in recent years, SnO2 thin Film with μm level has been widely applied in many fields such as solar cells, electric heating devices, transparent electrodes, and gas sensors, ect. This paper develops a real-time system to measure thermal expansion coefficients of SnO2 thin film, which can obtain directly surface morphology information of the samples. Micro-imaging and digital image correlation method is adopted to investigate the correlation by comparing the object surface image before deformation with that after deformation. Because of the lower demand for measurement environment and no damage to object, it’s easy to acquire on-line images, calculate synchronously and display real-time results. In the paper, thermal expansion coefficients of SnO2 thin film are determined in situ with change of the temperature. Both of ceramic and SnO2 thin film have shown anisotropy thermal expansion, thermal and residual stress appears between the ceramic substrate and SnO2 thin film as a result of thermal expansion coefficients mismatch. According to experimental results, the maximum stress values can be calculated between film and substrate and inside the substrate.

Sign in / Sign up

Export Citation Format

Share Document