Depth-Profiling of Near-Surface Atomic Correlations by Total Reflection of Synchrotron Radiation

1986 ◽  
Vol 69 ◽  
Author(s):  
H. Dosch ◽  
D. C. Wack ◽  
B. W. Batterman
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
Depth Profiling ◽  
Total Reflection ◽  
Independent Control ◽  
Near Surface ◽  
Grazing Angles

AbstractWe report measurement of Bragg intensities obtained from an Fe3Al(110) single crystal under the condition of total reflection. It is demonstrated that depth-resolved near-surface atomic correlations can be achieved by the independent control of both ocurring grazing angles.

Near-Surface Analysis of Semicondutor Using Grazing Incidence X-Ray Fluorescence

1987 ◽  
Vol 31 ◽  
pp. 487-494 ◽  
Author(s):  
Atsuo Iida ◽  
Kenji Sakurai ◽  
Yohichi Gohshi
Keyword(s):  
Surface Layer ◽  
High Temperature ◽  
Synchrotron Radiation ◽  
Fluorescence Analysis ◽  
Grazing Incidence ◽  
Total Reflection ◽  
Near Surface ◽  
X Ray ◽  
Gaas Wafer ◽  
Glancing Angle

SummaryThe X-ray external total reflection was used for the x-ray fluorescence analysis of the near surface layer of a GaAs wafer and a GaAlAs epilayer. Synchrotron radiation was used as an excitation source. The intensity ratio between the Ga K and As K fluorescence signals was measured as a function of the glancing angle. The reduction of As atoms near the surface of less than a hundred Å was observed for the high temperature annealed GaAlAs epilayer.

Hgl-xCdxTe-Cr Interface Reaction

1984 ◽  
Vol 37 ◽  
Author(s):  
P. Philip ◽  
A. Wall ◽  
A. Franciosi ◽  
D. J. Peterman
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
Exchange Reaction ◽  
Room Temperature ◽  
Interface Reaction ◽  
Surface Layers ◽  
Near Surface ◽  
Subsurface Region

AbstractWe summarize photoemission studies using Synchrotron Radiation of the formation of the HgCdTe-Cr interface at room temperature on in situcleaved single crystal substrates. Evidence is found of a Cr-Hg exchange reaction in the subsurface region. The surface and near surface layers appear completely depleted of mercury.

Insituobservation of phase transition in potassium niobate single crystal by synchrotron radiation topography

1991 ◽  
Vol 59 (16) ◽  
pp. 1952-1953 ◽  
Author(s):  
Jiyong Zhao ◽  
Ping Yang ◽  
Shusheng Jiang ◽  
Xiaoming Jiang ◽  
Jianhua Jiang ◽  
...  
Keyword(s):  
Phase Transition ◽  
Synchrotron Radiation ◽  
Single Crystal ◽  
Potassium Niobate

Refinement of the crystal structure of sieleckiite and revision of its symmetry

2017 ◽  
Vol 81 (4) ◽  
pp. 917-922
Author(s):  
Peter Elliott
Keyword(s):  
Crystal Structure ◽  
Synchrotron Radiation ◽  
Single Crystal ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Aluminium Phosphate ◽  
Unit Cell Parameters ◽  
X Ray ◽  
Cell Parameters ◽  
Phosphate Mineral

AbstractThe crystal structure of the copper aluminium phosphate mineral sieleckiite, Cu3Al4(PO4)2 (OH)12·2H2O, from the Mt Oxide copper mine, Queensland, Australia was solved from single-crystal X-ray diffraction data utilizing synchrotron radiation. Sieleckiite has monoclinic rather than triclinic symmetry as previously reported and is space group C2/m with unit-cell parameters a = 11.711(2), b = 6.9233(14), c = 9.828(2) Å, β = 92.88(3)°, V = 795.8(3) Å3and Z = 2. The crystal structure, which has been refined to R1 = 0.0456 on the basis of 1186 unique reflections with Fo > 4σF, is a framework of corner-, edge- and face- sharing Cu and Al octahedra and PO4 tetrahedra.

Update On Synchrotron Radiation TXRF: New Results

1998 ◽  
Vol 524 ◽  
Author(s):  
S. Brennan ◽  
P. Pianetta ◽  
S. Ghosh ◽  
N. Takaura ◽  
C. Wiemer ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Total Reflection ◽  
Synchrotron Source ◽  
X Ray ◽  
Non Destructive

ABSTRACTSynchrotron-based total-reflection x-ray fluorescence(SR-TXRF) has been developed as a leading technique for measuring wafer cleanliness. It holds advantages over other techniques in that it is non-destructive and allows mapping of the surface. The highest sensitivity observed thus far is 3x108 atoms/cm 2 (- 3fg) for 1000 second count time. Several applications of SR-TXRF are presented which take advantage of the energy tunability of the synchrotron source or the mapping capability.

Recent diamond single-crystal x-ray optics developments at the European Synchrotron Radiation Facility

1998 ◽  
Author(s):  
Andreas K. Freund ◽  
Jacques P. Sellschop ◽  
Konrad Lieb ◽  
Sylvain Rony ◽  
Clemens Schulze-Briese ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
European Synchrotron Radiation Facility ◽  
Diamond Single Crystal ◽  
Ray Optics ◽  
X Ray

Determination of Residual Stress Distribution in Severe Surface Deformed Steel by Shot Peening

2008 ◽  
Vol 571-572 ◽  
pp. 15-20 ◽  
Author(s):  
Yoshiaki Akiniwa ◽  
Hidehiko Kimura
Keyword(s):  
Carbon Steel ◽  
Synchrotron Radiation ◽  
Stress Distribution ◽  
Optimization Technique ◽  
High Energy ◽  
Medium Carbon Steel ◽  
X Rays ◽  
Near Surface ◽  
Medium Carbon ◽  
Order Polynomial

The compressive stress distribution below the specimen surface of a nanocrystalline medium carbon steel was investigated nondestructively by using high-energy X-rays from a synchrotron radiation source, SPring-8 (Super Photon ring-8 GeV) in the Japan Synchrotron Radiation Research Institute. A medium carbon steel plate was shot-peened with fine cast iron particles of the size of 50 μm. By using the monochromatic X-ray beam with three energy levels of 10, 30 and 72 keV, the stress values at the arbitrary depth were measured by the constant penetration depth method. The stress was calculated from the slope of the sin2ψ diagram. Measured stress corresponds to the weighted average associated with the attenuation of the X-rays in the material. The real stress distribution was estimated by using the optimization technique. The stress distribution was assumed by the third order polynomial in the near surface layer and the second order polynomial. The coefficients of the polynomials were determined by the conjugate gradient iteration. The predicted stress distribution agreed well with that measured by the conventional surface removal method.

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