Discrete dislocation sim ulation of thin film plasticit y
ABSTRACTA discrete dislocation dynamics sim ulation is used to investigate dislocation motion in the confined geometry of a polycrystalline thin film. The repeated activ ation of a Frank-Read source is sim ulated. The stress to activate the sources and to initiate plastic fiow is significantly higher than predicted by models where the dislocations extend o ver the entire film thic kness. An efiective source size, which scales with the grain dimensions, yields fiow stresses in reasonable agreemen t with experimen ts. The infiuence of dislocations deposited at interfaces is investigated by comparing calculations for a film sandwic hed between a substrate and a capping layer with those for a free standing film.