Measurement of Electrical Charge During Nanoindentation of Ferroelectric Thin Films

2000 ◽  
Vol 657 ◽  
Author(s):  
M. Algueró ◽  
A.J. Bushby ◽  
M.J. Reece
Keyword(s):  
Thin Films ◽  
Lead Titanate ◽  
Spherical Indenter ◽  
Ferroelectric Thin Films ◽  
Electrical Charge ◽  
Current Intensity ◽  
Indentation Force ◽  
Domain Reorientation ◽  
Distinct Maximum

Electrical charge transients have been measured during the nanoindentation of lanthanum modified lead titanate ferroelectric thin films. Using the spherical indenter as the top electrode, the films were locally poled. The films were then reindented at the exact same positions. The origin of the charge released is discussed in terms of piezoelectricity and depolarisation. The depolarisation must have been produced by a stress induced ferroelastic domain reorientation. Current intensity transients recorded during indentation showed a distinct maximum. This maximum corresponded to a force at which the depolarisation rate was a maximum. This provides the basis to define a coercive indentation force, and then a coercive indentation stress.

The role of nanoporosity on the local piezo and ferroelectric properties of lead titanate thin films

2015 ◽  
Vol 3 (5) ◽  
pp. 1035-1043 ◽  
Author(s):  
Alichandra Castro ◽  
Paula Ferreira ◽  
Brian J. Rodriguez ◽  
Paula M. Vilarinho
Keyword(s):  
Thin Films ◽  
Coercive Field ◽  
Lead Titanate ◽  
Ferroelectric Properties ◽  
Ferroelectric Thin Films ◽  
Piezoelectric Response ◽  
Nanoporous Films ◽  
Switching Behaviour ◽  
Dense Films

Nanoporous PbTiO3 films present enhanced tetragonality at lower temperatures than respective dense films. Moreover, the porosity present in the nanoporous films allows an increase of the local piezoelectric response and a decrease of the local coercive field. As a result, these nanoporous films might be used to improve the switching behaviour of ferroelectric thin films.

Direct measurement of mechanical properties of (Pb,La)TiO3 ferroelectric thin films using nanoindentation techniques

2001 ◽  
Vol 16 (4) ◽  
pp. 993-1002 ◽  
Author(s):  
M. Algueró ◽  
A. J. Bushby ◽  
M. J. Reece
Keyword(s):  
Thin Films ◽  
Plastic Deformation ◽  
Lead Titanate ◽  
Mechanical Response ◽  
High Spatial Resolution ◽  
Ferroelectric Thin Films ◽  
Intergranular Porosity ◽  
Major Mechanism ◽  
Wall Movement ◽  
Film Substrate

A procedure using nanoindentation with spherical tipped indenters is presented that allows separation of elastic, anelastic, and plastic contributions to the deformation of thin films. The procedure was demonstrated on a range of lanthanum-modified lead titanate (Pb,La)TiO3 (PTL) ferroelectric thin films. Indentation stiffness coefficients ranging from 110 to 147 GPa have been obtained depending on the microstructure and orientation of the PTL films. This coefficient was equivalent to (and so, can be directly compared with) Young's modulus of a nontextured, unpoled ceramic when films do not present preferred orientation. The trends of the anelastic contribution with the thickness, structure, microstructure, and stress level at the film/substrate interface of the films were consistent with it being produced by ferroelastic domain wall movement. Pore compaction was a major mechanism of plastic deformation for the PTL films. Grain size also affected plastic deformation, probably as a consequence of its correlation with intergranular porosity. The technique has a high spatial resolution (contact area < 10 μm2 for the results presented here), which allowed the mechanical homogeneity of the films to be studied and inhomogeneities to be identified from their mechanical response (elastic, anelastic, and plastic).

Ferroelectric thin films of calcium modified lead titanate by sol-gel processing

1994 ◽  
Vol 13 (24) ◽  
pp. 1804-1805 ◽  
Author(s):  
R. Sirera ◽  
M. L. Calzada ◽  
F. Carmona ◽  
B. Jim�nez
Keyword(s):  
Thin Films ◽  
Lead Titanate ◽  
Sol Gel ◽  
Ferroelectric Thin Films ◽  
Gel Processing

Application of the X-ray combined analysis to the study of lead titanate based ferroelectric thin films

2004 ◽  
Vol 450 (1) ◽  
pp. 128-133 ◽  
Author(s):  
J. Ricote ◽  
D. Chateigner ◽  
M. Morales ◽  
M.L. Calzada ◽  
C. Wiemer
Keyword(s):  
Thin Films ◽  
Lead Titanate ◽  
Ferroelectric Thin Films ◽  
Combined Analysis ◽  
X Ray
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