Characterization of Ga-Mn Decagonal Quasicrystals in GaAs

2000 ◽  
Vol 643 ◽  
Author(s):  
K. Sun ◽  
N. D. Browning

AbstractGa-Mn decagonal quasicrystals (DQC), as well as a Ga-Mn approximant and a normal crystal in GaAs are investigated by electron energy-loss spectroscopy (EELS) and energy dispersive X- ray spectroscopy (EDS) combined with Z-contrast imaging. Plasmon peak positions (Ep), full- width-half-maxima (FWHM) and Mn L3/L2ratios of these three phases are derived from their low-loss spectra and core-loss spectra respectively. Mn, Ga and As distributions in ion implanted GaAs layers are characterized by EDS at line-scan mode. These results show that the Ga-Mn DQC has higher Ep and FWHMs than those of its normal crystal counterpart, as well as all other reported QCs. The much larger L3/L2 intensity ratio of the Ga-Mn DQC over that of the Al-Mn icosahedral quasicrystals (IQC) may suggest Mn atoms in the Ga-Mn DQC have much larger local magnetic moments.

2001 ◽  
Vol 7 (S2) ◽  
pp. 1094-1095
Author(s):  
K. Sun ◽  
J. Liu ◽  
N.D. Browning

Antimony-doped tin oxide (ATO) catalysts are used for the oxidation of propylene to acrolein, the ammoxidation of propylene to acrylonitrile and the oxidative dehydrogenation of butanes to 1,3- butadiene. The distribution and valence states of Sb in ATOs are key in determining their catalytic activities. While these materials have been subjects of intensive studies for more than 20 years, X-ray photoelectron spectroscopy, Mössbauer spectrometry, and X-ray absorption spectroscopy4 have so far provided only indirect data for the distribution of Sb and its valence states. in particular, while has been hypothesized that the tin (IV) oxide contains Sb (V) within the bulk lattice and Sb (III) located at surface sites, no direct experimental evidence for this has been provided.Here we use electron energy loss spectroscopy (EELS) combined with Z-contrast imaging in a JEOL 2010F field emission STEM/TEM operating at 200 KV to analyze ATO catalysts.


2004 ◽  
Vol 10 (S02) ◽  
pp. 322-323
Author(s):  
Melody P Agustin ◽  
Brendan Foran ◽  
Gennadi Bersuker ◽  
Joel Barnett ◽  
Susanne Stemmer

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


1998 ◽  
Vol 4 (S2) ◽  
pp. 776-777
Author(s):  
J. P. Buban ◽  
J. Zaborac ◽  
H. Moltaji ◽  
G. Duscher ◽  
N. D. Browning

Although grain boundaries typically account for only a small fraction of a material, they can have far reaching effects on the overall bulk scale properties. These effects are usually simply linked to the boundary having a different atomic arrangement to the bulk. A necessary first step in understanding the structure-property relationships is therefore a detailed determination of the boundary structure.One means of obtaining detailed information on the structure of grain boundaries is through correlated Z-contrast imaging and electron energy loss spectroscopy (EELS). The Z-contrast image generates a map of the grain boundary which can be used to position the probe in defined locations for spectroscopy. In the case of oxides, a structural model of the metal atom positions can be determined directly from the image. Furthermore, using a simple bond-valence sum minimization routine, the oxygen atoms can be placed so that the structure contains atoms that have valences consistent with their expected formal valence state.


1999 ◽  
Vol 5 (6) ◽  
pp. 437-444 ◽  
Author(s):  
Stephen B. Rice ◽  
Hazel H. Bales ◽  
John R. Roth ◽  
Allen L. Whiteside

Abstract: A set of uranium compound particles relevant to contaminated soils and other environmental concerns surrounding uranium bioavailability were studied by electron energy-loss spectroscopy (EELS). Core-loss EELS results suggest that uranium 4+ compounds have an energy loss resolvable from 6+ compounds. Shoulders on the uranium O4,5 edge further distinguish UO2 from UF4. Low-loss characteristics distinguish carbon-free uranium oxide specimens on holey substrates. In the presence of carbon, correction techniques must be applied. Uranium oxides, fluorides, and minerals show a tendency toward reduction of uranium toward 4+ under the beam. The electron dose required to achieve the transformation from 6+ to 4+ is more severe than that usually required to obtain satisfactory spectra, but the possibility for reduction should be considered. The conditions for low-loss analysis need not be as vigorous as those for core losses, and can be done without altering the valence of most oxides.


2014 ◽  
Vol 1708 ◽  
Author(s):  
Nabraj Bhattarai ◽  
Subarna Khanal ◽  
Daniel Bahena ◽  
Robert L. Whetten ◽  
Miguel Jose-Yacaman

ABSTRACTThe synthesis of bimetallic magnetic nanoparticles is very challenging because of the agglomeration and non-uniform size. In this paper, we present the synthesis of monodispersed 3-5 nm sized thiolated bimetallic alloyed Au/Co nanoparticles with decahedral and icosahedral shape, their characterization using Cs-corrected scanning transmission electron microscopy (STEM) and magnetic measurements using superconducting quantum interference device (SQUID) magnetometer. The Z-contrast imaging and energy dispersive X-ray spectroscopy (EDS) mapping showed an inhomogeneous alloying with minor segregation between Au and Co at nanoscale and the SQUID measurement exhibited the ferromagnetic behavior.


2001 ◽  
Vol 7 (S2) ◽  
pp. 400-401
Author(s):  
Y. Lei ◽  
Y. Ito ◽  
N. D. Browning

Yttria-stabilized zirconia (YSZ) has been the subject of many experimental and theoretical studies, due to the commercial applications of zirconia-based ceramics in solid state oxide fuel cells. Since the grain boundaries usually dominate the overall macroscopic performance of the bulk material, it is essential to develop a fundamental understanding of their structure-property relationships. Previous research has been performed on the atomic structure of grain boundaries in YSZ, but no precise atomic scale compositional and chemistry characterization has been carried out. Here we report a detailed analytical study of an [001] symmetric 24° bicrystal tilt grain boundary in YSZ prepared with ∼10 mol % Y2O3 by Shinkosha Co., Ltd by the combination of Z-contrast imaging and electron energy loss spectroscopy (EELS).The experimental analysis of the YSZ sample was carried out on a 200kV Schottky field emission JEOL 201 OF STEM/TEM4.


2000 ◽  
Vol 640 ◽  
Author(s):  
S. T. Pantelides ◽  
R. Buczko ◽  
M. Di Ventra ◽  
S. Wang ◽  
S.-G. Kim ◽  
...  

ABSTRACTThis paper presents a review of new results obtained by a combination of first-principles theory, Z-contrast imaging, and electron-energy-loss spectroscopy in the context of a broader experimental/theoretical program to understand and control the atomic-scale structure of SiCSiO2 interfaces. The ultimate purpose is to achieve low interface trap densities for device applications. Results are given for global bonding arrangements in comparison with those of the Si-SiO2 interface, the mechanism of the oxidation process, the nature of possible interface defects and their passivation by N and H, and the formation and dissolution of C clusters in SiO2 during oxidation and reoxidation.


1997 ◽  
Vol 3 (S2) ◽  
pp. 661-662
Author(s):  
H. Gu

High temperature mechanical properties of structural ceramics Si3N4 are controlled by ∼1 nm thick silicate amorphous films covering all grain boundaries. The composition of the film dictates the equilibrium film thickness resulted from a force balance at grain boundary. Many efforts arc brought to alter film chemistry and thickness, and this system offers ideal model materials to understand grain boundary and property relationship. Using a dedicated STEM (VG HB601) with high spatial resolution EELS analysis and high resolution Z-contrast imaging, various novel quantification data of the grain boundary in Si3N4 can be obtained. The methods described here can also be applied to other types of grain boundaries.EELS profiling was performed to acquire a full spectrum from each position at a lateral increment of 1Å across a boundary in a pure Si3N4 sample with only SiO2 impurities from surface oxidation. It gives directly elemental distributions near the boundary such as Si, N and O profiles shown in Fig. 1.


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