Broadband Determination of Microwave Permittivity and Loss in Tunable Dielectric Thin Film Materials

1999 ◽  
Vol 603 ◽  
Author(s):  
James C. Booth ◽  
Leila R. Vale ◽  
Ronald H. Ono
Keyword(s):  
Thin Film ◽  
Transmission Lines ◽  
Figure Of Merit ◽  
Propagation Constant ◽  
Unit Length ◽  
Coplanar Waveguide ◽  
Dielectric Materials ◽  
Dielectric Thin Film ◽  
Microwave Frequencies ◽  
Complex Propagation

AbstractWe demonstrate a new method for determining the frequency-dependent dielectric properties of thin-film materials at microwave frequencies using coplanar waveguide (CPW) transmission line measurements. The technique makes use of the complex propagation constant determined from multiline thru-reflect-line (TRL) calibrations for CPW transmission lines to determine the distributed capacitance and conductance per unit length. By analyzing data from CPW transmission lines of different geometries, we are able to determine the complex permittivity of the dielectric thin film under study as a function of frequency from 1 to 40 GHz. By performing these measurements under an applied bias voltage, we are able in addition to determine the tuning and figure of merit that are of interest for voltage-tunable dielectric materials over the frequency range 1 to 26.5 GHz. We demonstrate this technique with measurements of the permittivity, loss tangent, tuning, and figure of merit for a 0.4 µm film of Ba0.5Sr0.5TiO3 at room temperature.

Loss Measurement of Aluminum Thin-Film Coplanar Waveguide (CPW) Lines at Microwave Frequencies

2010 ◽  
Vol 57 (8) ◽  
pp. 2037-2040 ◽  
Author(s):  
Maliheh Ramazani ◽  
Haddad Miladi ◽  
Mahmoud Shahabadi ◽  
Shamsoddin Mohajerzadeh
Keyword(s):  
Thin Film ◽  
Coplanar Waveguide ◽  
Microwave Frequencies ◽  
Loss Measurement ◽  
Aluminum Thin Film

Study of planar transmission lines printed on a ferroelectric thin Film: Optimum tunability and figure of merit

2006 ◽  
Author(s):  
Arnaud-Gides Moussavou ◽  
Ronan Sauleau ◽  
Kouroch Mahdjoubi ◽  
Stephanie Deputier ◽  
Maryline Guilloux-Viry ◽  
...  
Keyword(s):  
Thin Film ◽  
Transmission Lines ◽  
Figure Of Merit ◽  
Ferroelectric Thin Film ◽  
Planar Transmission Lines

scholarly journals Applying the Retarded Solutions of Electromagnetic Fields to Transmission Line RLGC Modeling

2017 ◽  
Vol 6 (1) ◽  
pp. 56
Author(s):  
P. Ye ◽  
B. Gore ◽  
P. Huray
Keyword(s):  
Transmission Line ◽  
Transmission Lines ◽  
Analytical Approach ◽  
Propagation Constant ◽  
Unit Length ◽  
Characteristic Impedance ◽  
Simulation Methods ◽  
Arbitrary Length ◽  
Small Segment ◽  
Numerical Simulation Methods

The RLGC model, and its variations, is one of the most common techniques to simulate Transmission Lines. The RLGC model uses circuit network elements consisting of Resistance R, Inductance L, Conductance G and Capacitance C (per unit length) to represent a small segment of the Transmission Line, and then cascades multiple segments to simulate the Transmission Line of arbitrary length. Typically the parameters in RLGC model are extracted from the propagation constant and characteristic impedance of the transmission line, which are found using numerical simulation methods. These resulting RLGC parameters for multi-GHz signaling are usually frequency-dependent. This paper introduces an analytical approach to extract RLGC parameters to simulate transmission line, which results in a different model, the RLGC(p) model.

Development of Scanning Microwave Microscope for High-Throughput Characterization of Combinatorial Dielectric Thin Film

2001 ◽  
Vol 700 ◽  
Author(s):  
Noriaki Okazaki ◽  
Parhat Ahmet ◽  
Toyohiro Chikyow ◽  
Hiroyuki Odagawa ◽  
Yasuo Cho ◽  
...  
Keyword(s):  
Thin Film ◽  
Dielectric Constant ◽  
Frequency Shift ◽  
High Throughput ◽  
Accurate Determination ◽  
Dielectric Materials ◽  
Dielectric Thin Film ◽  
Outer Conductor ◽  
Microwave Microscope

AbstractA scanning microwave microscope (Sm M) for high-throughput characterization of combinatorial dielectric materials has been developed using a lumped constant resonator probe. The probe consists of a microwave oscillator module equipped with a thin conducting needle and an outer conductor ring, which detects the dielectric constant of the sample just beneath the needle as a frequency shift of the resonator. The quantitative analysis of the dielectric constant for the bulk and the thin-film samples was carried out based on the measurement of gap-length dependence of the frequency shift. The analysis method was successfully applied to the characterization of composition-spread BaxSr1-xTiO3 thin film sample. The evaluation of far-field contribution to the frequency shift was found to be crucial for the accurate determination of dielectric constant especially in the characterization of combinatorial thin films.

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