X-Ray Photoelectron Spectroscopy of In-Situ Fractured Reaction Bonded Silicon Nitride

1985 ◽  
Vol 60 ◽  
Author(s):  
M. S. Donley ◽  
T. G. Stoebe ◽  
M. T. Thomas
Keyword(s):  
Silicon Nitride ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Photoelectron Spectroscopy ◽  
Iron Species ◽  
Metallurgical Grade Silicon ◽  
X Ray ◽  
Grade Silicon ◽  
Boundary Chemistry

AbstractThe grain boundary chemistry of reaction bonded silicon nitride (RBSN) and the effects of iron species and content on this chemistry are investigated using X-ray photoelectron spectroscopy (XPS). Data are reported for semiconductor grade RBSN, Fe-doped semiconductor grade RBSN, and metallurgical grade RBSN specimens. Results indicate that the grain boundaries have an elemental composition of Si, N, O, and C, with important chemical differences depending on the purity of the starting material. In the RBSN made from metallurgical grade silicon, the grain boundaries have a distinct “oxide-like” layer, with a subregion of Si3N4. No distinct oxide layer was observed in the RBSN made from semiconductor-grade silicon, where the O appears to be uniformly incorporated into the Si3N4.

X-Ray Reflectivity Study of Single- and Bicrystals of Gold

1990 ◽  
Vol 208 ◽  
Author(s):  
M. R. Fitzsimmons ◽  
E. Burkel ◽  
J. Peisl
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Single Crystals ◽  
Diffuse Scattering ◽  
Direct Evidence ◽  
X Ray ◽  
Specular Reflectivity ◽  
Boundary Measurements

ABSTRACTX-ray reflectivity techniques have been used to characterize the surfaces of 0.4µm thick Au films epitaxially grown on single-crystals of NaCl. Measurements of both the specular and non-specular reflectivity suggest that the Au surface is very rough. The nonspecular reflectivity provides valuable information about the correlation of the heights at different points on the surface. The first in situ reflectivity study of the formation and destruction of a grain boundary shows direct evidence for the existence of diffuse scattering from the grain boundary. Measurements of several [0011 twist grain boundaries suggest that the roughness and texture of an interface depends upon the geometrical orientation of the surrounding substrates.

Improvement of polycrystalline Y–Ba–Cu–O by the addition of silver

1988 ◽  
Vol 3 (4) ◽  
pp. 605-609 ◽  
Author(s):  
G. G. Peterson ◽  
B. R. Weinberger ◽  
L. Lynds ◽  
H. A. Krasinski
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Optical Microscopy ◽  
Photoelectron Spectroscopy ◽  
Hydrocarbon Contamination ◽  
Boundary Effects ◽  
Metallic Silver ◽  
X Ray ◽  
Grain Boundary Effects ◽  
Lower Porosity

X-ray photoelectron spectroscopy, scanning Auger, and optical microscopy studies of polycrystalline superconducting pellets of Y–Ba–Cu–O/Ag are presented. Silver-laced samples have a lower porosity and a drastically reduced hydrocarbon contamination. Results indicate no detectable substitution of A g into the Y–Ba–Cu–O but a collection of metallic silver in voids and possibly along grain boundaries Intergranular silver could mitigate adverse grain boundary effects in polycrystalline Y–Ba–Cu–O.

The Effect of Grain Boundaries and Substrate Interactions with Hydrogen on the CVD Growth of Device-Quality Copper.

1991 ◽  
Vol 229 ◽  
Author(s):  
A. E. Kaloyeros ◽  
C. Dettelbacher ◽  
E. T. Eisenbraun ◽  
W. A. Lanford ◽  
H. Li ◽  
...  
Keyword(s):  
Grain Boundaries ◽  
Photoelectron Spectroscopy ◽  
Precursor Chemistry ◽  
X Ray Diffraction ◽  
Substrate Interactions ◽  
Metallic Substrates ◽  
X Ray ◽  
Profiling Techniques ◽  
Cvd Growth

AbstractThe effects of grain boundaries and substrate interactions with hydrogen on the CVD growth of device-quality copper were investigated by high-resolution x-ray photoelectron spectroscopy (HRXPS), Auger electron spectroscopy (AES), four-point resistivity probe, x-ray diffraction (XRD), and hydrogen profiling techniques. The films were deposited at 200° C in a stainless-steel cold-wall-type CVD reactor in an atmosphere of pure H2 from various β-diketonate precursors, including bis(6,6,7,7,8,8,8-heptafluoro-2,2- dimethyl-3,5-octanediono)copper(II), Cu(fod)2, and bis(2,2,6,6-tetramethyl- 3,5-heptanedionato)copper(II), Cu(tmhd)2. The results of these studies showed that films grown on in-situ plasma-cleaned metallic substrates were uniform, continuous, adherent, and highly pure. Films with grain size larger than 500Å exhibited very low resistivity, as low as 1.7 μΩcm. Preliminary investigations of the mechanisms of selective copper CVD showed that selectivity is independent of precursor chemistry and is a function of the nature and degree of substrate interactions with hydrogen.

Nano-probe microanalysis of grain boundary chemistry in YBa2Cu4O8 and its relationship to weak-link behavior

1993 ◽  
Vol 51 ◽  
pp. 598-599
Author(s):  
Z.L. Wang ◽  
J. Brynestad ◽  
D.M. Kroeger ◽  
Y.R. Sun ◽  
J.R. Thompson ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Weak Link ◽  
Oxygen Deficiency ◽  
High Temperature Superconductors ◽  
Cation Composition ◽  
X Ray ◽  
Transmission Electron ◽  
Boundary Chemistry ◽  
Electron Energy Loss

Weak-link behavior in high temperature superconductors limits bulk applications of polycrystalline high Tc compounds. Possible sources of the effect include grain boundary (GB) disorder, microcracks and nonstoichiometric material at grain boundaries. Recently, electron energy-loss spectroscopy (EELS) studies of YBa2Cu3O7-x (Y123) have shown that grain boundary oxygen deficiency is correlated with the crystallographic misorientations of between the Y123 grains. Studies of grain boundary chemistry in YBa2Cu4O8 (Y124) by nano-probe energy dispersive X-ray spectroscopy (EDS) and EELS are reported in this paper. Transmission electron microscopy (TEM) studies were performed at 100 kV in a Philips EM400 TEM/STEM equipped with a field emission gun (FEG), which generates an electron probe smaller than 2 nm in diameter. The cation composition was determined by EDS and the O:Ba composition was determined using EELS. Kikuchi patterns were recorded from both sides of the grain boundaries to determine the misorientation of the two adjacent grains.The observation of a pre-edge peak (Fig. 1) near the oxygen K ionization edge (O K) is related to the hole states produced by the O 2p state and Cu 3d states.

Grain-boundary compositional measurements in complex high-temperature Ni-base alloys using x-ray spectroscopy

1994 ◽  
Vol 52 ◽  
pp. 964-965
Author(s):  
E. L. Hall ◽  
C. P. Blankenship ◽  
M. F. Henry
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Base Alloy ◽  
Heat Treatments ◽  
Fatigue Crack Propagation Rate ◽  
Structure Property ◽  
X Ray ◽  
Collector Plate ◽  
Cr Depletion ◽  
Boundary Chemistry

Thermal treatment of advanced Ni-base alloys used in critical aircraft engine components can have a significant effect on both the microstructure and properties of these alloys. One important property that can be strongly affected by heat treatment is the time-dependent fatigue crack propagation rate along grain boundaries. It is possible for heat treatments to affect the morphology, chemistry, andphase distribution along the grain boundaries in these complex multiphase alloys. Structure-property correlations require the measurement of each of these parameters. By far, the least tractable of these is the measurement of grain boundary chemistry.X-ray spectroscopy in the AEM has been shown to be a very powerful method for measuring grain boundary chemistry in single-phase Fe and Ni-base alloys, among others. In the case of a singlephase Ni-base alloy such as IN600, heat treatments in the range of 500-750&C cause precipitation of Crrich carbides at grain boundaries and the depletion of Cr from the grain-boundary segments between precipitates via a collector-plate mechanism. Measurement of Cr-depletion at the grain boundaries and Cr-depletion profiles across boundaries is straightforward.

Ultra Thin SiNX on a-Si In Situ Hot-Wire CVD by Decomposing NH3 Gas

2014 ◽  
Vol 894 ◽  
pp. 421-426
Author(s):  
Dharmendra Kumar R. Rai ◽  
Dayanand S. Sutar ◽  
Chetan Singh Solanki ◽  
K.R. Balasubramaniam
Keyword(s):  
Raman Spectroscopy ◽  
Silicon Nitride ◽  
Photoelectron Spectroscopy ◽  
Profile Measurement ◽  
Hot Wire ◽  
X Ray ◽  
Superlattice Structures ◽  
Xps Depth Profile ◽  
Si Wafer

The fabrication of ultra thin silicon nitride (SiNX) layer (< 2 nm) on amorphous silicon (a-Si) in-situ hot-wire CVD by decomposing ammonia (NH3) gas is reported. Approximately 1.5 nm thin SiNXis formed by nitridation of 40 nm thick a-Si for 10 min at substrate temperature of 250 °C. The amorphous phase of SiNXformed on a-Si and a-Si layer deposited on c-Si wafer is identified by Raman spectroscopy. The formation of ultra thin SiNXby nitridation of a-Si at 250 °C is confirmed by X-ray photoelectron spectroscopy (XPS) depth profile measurement of SiNX/a-Si structured film. The report indicates that the HWCVD method can be used for fabricating superlattice structures consisting of ultra thin SiNXlayers (< 2 nm).

On In-Situ Study of Dislocation/Grain Boundary Interactions Using X-ray Topography and Tem

1993 ◽  
Vol 319 ◽  
Author(s):  
Ian Baker ◽  
Fuping Liu
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Stress Concentrations ◽  
X Ray ◽  
Advantages And Disadvantages ◽  
Transmission Electron ◽  
Low Dislocation Density ◽  
Dislocation Behavior ◽  
Generation Mechanisms

AbstractThe advantages and disadvantages of in-situ straining using both synchrotron x-ray topography and transmission electron microscopy for examining dislocation/grain boundary interactions are compared and examples given of the use of each technique. For x-ray topography, studies on ice polycrystals are discussed. Ice is well-suited for x-ray topographic studies since it has both low absorption and can be produced with a low dislocation density. Stress concentrations have been observed at grain boundaries in ice which are partially relieved by generation of 1/3<1120> dislocations. Interestingly, grain boundary generation of dislocations completely overwhelms lattice generation mechanisms. Examples of transmission electron microscope in-situ straining studies include dislocation/grain boundary interactions in L12-structured and B2-structured intermetallics. Slip transmission across grain boundaries by dislocations gliding ahead of an advancing crack is a principal feature of these studies. A significant advantage of the such studies is their inherently high resolution. However, the dislocation behavior is dominated by the inherent thinness of the specimens.

Sign in / Sign up

Export Citation Format

Share Document