Investigating Atomic Scale Phenomena at Materials Interfaces With Correlated Techniques in STEM/TEM
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AbstractA complete understanding of the complexities behind the structure-property relationships at materials interfaces requires the structure, composition and bonding to be characterized on the fundamental atomic scale. This level of characterization is beyond the scope of a single imaging or microanalysis technique and so to solve practical interface problems, correlation between multiple techniques must be achieved. Here we describe recent advances in the JEOL 2010F 200kV field-emission STEM/TEM that now allow atomic resolution imaging and analysis to be obtained in both TEM and STEM mode and discuss two applications of these techniques
2017 ◽
Vol 47
(1)
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pp. 175-198
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