Investigating Atomic Scale Phenomena at Materials Interfaces With Correlated Techniques in STEM/TEM

1999 ◽  
Vol 589 ◽  
Author(s):  
N. D. Browning ◽  
A. W. Nicholls ◽  
E. M. James ◽  
I. Arslan ◽  
Y. Xin ◽  
...  

AbstractA complete understanding of the complexities behind the structure-property relationships at materials interfaces requires the structure, composition and bonding to be characterized on the fundamental atomic scale. This level of characterization is beyond the scope of a single imaging or microanalysis technique and so to solve practical interface problems, correlation between multiple techniques must be achieved. Here we describe recent advances in the JEOL 2010F 200kV field-emission STEM/TEM that now allow atomic resolution imaging and analysis to be obtained in both TEM and STEM mode and discuss two applications of these techniques

1998 ◽  
Vol 4 (S2) ◽  
pp. 556-557
Author(s):  
S. Stemmer ◽  
G. Duscher ◽  
E. M. James ◽  
M. Ceh ◽  
N.D. Browning

The evaluation of the two dimensional projected atom column positions around a defect or an interface in an electronic ceramic, as it has been performed in numerous examples by (quantitative) conventional high-resolution electron microscopy (HRTEM), is often not sufficient to relate the electronic properties of the material to the structure of the defect. Information about point defects (vacancies, impurity atoms), and chemistry or bonding changes associated with the defect or interface is also required. Such complete characterization is a necessity for atomic scale interfacial or defect engineering to be attained.One instructive example where more than an image is required to understand the structure property relationships, is that of grain boundaries in Fe-doped SrTi03. Here, the different formation energies of point defects cause a charged barrier at the boundary, and a compensating space charge region around it. The sign and magnitude of the barrier depend very sensitively on the atomic scale composition and chemistry of the boundary plane.


2001 ◽  
Vol 7 (S2) ◽  
pp. 400-401
Author(s):  
Y. Lei ◽  
Y. Ito ◽  
N. D. Browning

Yttria-stabilized zirconia (YSZ) has been the subject of many experimental and theoretical studies, due to the commercial applications of zirconia-based ceramics in solid state oxide fuel cells. Since the grain boundaries usually dominate the overall macroscopic performance of the bulk material, it is essential to develop a fundamental understanding of their structure-property relationships. Previous research has been performed on the atomic structure of grain boundaries in YSZ, but no precise atomic scale compositional and chemistry characterization has been carried out. Here we report a detailed analytical study of an [001] symmetric 24° bicrystal tilt grain boundary in YSZ prepared with ∼10 mol % Y2O3 by Shinkosha Co., Ltd by the combination of Z-contrast imaging and electron energy loss spectroscopy (EELS).The experimental analysis of the YSZ sample was carried out on a 200kV Schottky field emission JEOL 201 OF STEM/TEM4.


CrystEngComm ◽  
2014 ◽  
Vol 16 (20) ◽  
pp. 4069-4083 ◽  
Author(s):  
Muwei Zhang ◽  
Mathieu Bosch ◽  
Thomas Gentle III ◽  
Hong-Cai Zhou

This highlight review will outline the recent advances on rational design of MOFs from both our and other groups based on their structure–property relationships, and provide a systematic overview of different methods for rational design of MOFs with desired porosities and functionalities.


2020 ◽  
Author(s):  
Bo Han ◽  
Chen Yang ◽  
Xiaolong Xu ◽  
Yuehui Li ◽  
Ruochen Shi ◽  
...  

Abstract Contact interface properties are important in determining the performances of devices that are based on atomically thin two-dimensional (2D) materials, especially for those with short channels. Understanding the contact interface is therefore important to design better devices. Herein, we use scanning transmission electron microscopy, electron energy loss spectroscopy, and first-principles calculations to reveal the electronic structures within the metallic (1T′)-semiconducting (2H) MoTe2 coplanar phase boundary across a wide spectral range and correlate its properties to atomic structures. We find that the 2H-MoTe2 excitonic peaks cross the phase boundary into the 1T′ phase within a range of approximately 150 nm. The 1T′-MoTe2 crystal field can penetrate the boundary and extend into the 2H phase by approximately two unit-cells. The plasmonic oscillations exhibit strong angle dependence, that is a red-shift of π+σ (approximately 0.3–1.2 eV) occurs within 4 nm at 1T′/2H-MoTe2 boundaries with large tilt angles, but there is no shift at zero-tilted boundaries. These atomic-scale measurements reveal the structure–property relationships of the 1T′/2H-MoTe2 boundary, providing useful information for phase boundary engineering and device development based on 2D materials.


Synthesis ◽  
2020 ◽  
Author(s):  
Zheng Duan ◽  
Lili Wang ◽  
Juan Ma ◽  
Erbing Si

AbstractThis review summarizes recent research on the molecular design, optical, and electronic properties of annulated borepins, silepins, and phosphepins, with emphasis on their structure–property relationships at the molecular level.1 Introduction2 Borepins3 Silepins4 Phosphepins5 Summary and Outlook


2017 ◽  
Vol 8 (1) ◽  
pp. 24-40 ◽  
Author(s):  
Richard Hoogenboom ◽  
Helmut Schlaad

Recent advances in thermoresponsive poly(2-oxazoline)s, polypeptoids, and polypeptides, with a specific focus on structure–property relationships, self-assembly, and applications, are reviewed.


1998 ◽  
Vol 4 (S2) ◽  
pp. 690-691
Author(s):  
C. Prouteau ◽  
G. Duscher ◽  
N. D. Browning ◽  
S. J. Pennycook ◽  
D. Verebelyi ◽  
...  

Developing an atomic scale study of the structure-property relationships of grain boundaries in high-Tc superconductors is essential to understand their current dissipation mechanism and for incorporating these materials into viable devices. Thin YBa2Cu3O7-δ films have been deposited by pulsed laser deposition (PLD) on SrTiO3 symmetric bicrystals. Transport measurements in a magnetic field have been conducted across the grain boundaries through a wide bridge. The data obtained are consistent with microstructural observation in a VG Microscopes HB603 U and a VG HB501 UX dedicated STEM. Of particular interest in the study of high-Tc materials is the use of EELS, which can highlight the presence of non-superconducting regions through interpretation of the onset positions and finestructure (ELNES) of characteristic core-edge features.The V(I) curves recorded across a 24° boundary for several magnetic fields (fig. 1 - left) show an onset critical current density followed by a linear differential ohmic behavior which gives a negative intercept.


1999 ◽  
Vol 5 (S2) ◽  
pp. 686-687
Author(s):  
Pratibha L. Gai

Major advances in the field of in situ environmental high resolution electron microscopy (EHREM) probe selective oxidation catalysis directly on the atomic scale. Dynamic gas-solid surface interactions are studied in real-time and under realistic reaction conditions to unravel atomic level insights into active sites and structure-property relationships in vital chemical and technological processes [1-3]. The recent developments include a pioneering approach with the controlled environmental cell (ECELL) facilities permanently mounted inside the EHREM [2]. Accessories have been added for simultaneous structural and compositional analyses of the reactor contents in real-time, and using atomic resolution imaging with transmission electron diffraction and parallel electron energy loss spectroscopy (PEELS). We are now developing innovative experimental methods that include very high temperature studies and combining in the same instrument facilities for both EHREM and environmental-SEM (ESEM), (EHREM-ESEM), with attractive possibilities for studying the science of selective oxidation catalysis.Alkane Catalysis, Chlorofluorocarbons and Nanotubes:In the domain of transition metal based oxides, discoveries of fundamental mechanisms underlying selective catalyzation have come from EHREM studies.


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