Growth and Characterization of Inas Quantum Dots on Silicon
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AbstractUp to 1011 cm−2 InAs quantum dots (QD) can be grown on Silicon(001) by molecular beam epitaxy. This very new material system is on the one hand interesting with regard to the integration of optoelectronics with silicon technology on the other hand it offers new insight into the formation of QDs. We report on RHEED, TEM and Raman studies about (in-) coherence of the QDs and on an according to our knowledge so far unknown dewetting transition in this material system. The results are being discussed on the basis of a thermodynamic model, assuming a liquid-like behavior of a strained adlayer.
1996 ◽
Vol 35
(Part 1, No. 2B)
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pp. 1217-1220
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2001 ◽
Vol 40
(Part 1, No. 3B)
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pp. 1885-1887
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2012 ◽
Vol 132
(2)
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pp. 289-292
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2002 ◽
Vol 13
(2-4)
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pp. 1151-1154
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