Lorentz Microscopy and Electron Holography of Nanocrystalline Magnetic Materials

1999 ◽  
Vol 577 ◽  
Author(s):  
Marc De Graef

ABSTRACTThis paper employs an analytical model for the phase shifts imparted on a beam electron by a spherical particle with a uniform magnetization. Model image simulations of Fresnel and Foucault type Lorentz microscopy contrast are presented. Estimates of a lower particle size limit for which no magnetic information can be extracted from the images are given and compared to similar estimates for the electron holography observation method. It is concluded that conventional Lorentz methods have a lower particle size limit of around 30 nm (for cobalt particles), while electron holography can be used to even smaller sizes.

2001 ◽  
Vol 34 (4) ◽  
pp. 381-385 ◽  
Author(s):  
Markus Gälli ◽  
Sergio A. Guazzotti ◽  
Kimberly A. Prather

1999 ◽  
Vol 5 (S2) ◽  
pp. 34-35
Author(s):  
M. De Graef ◽  
N.T. Nuhfer ◽  
M.R. McCartney

The recent increased interest in Lorentz Microscopy methods is due to two important factors: (1) the advent of digital detection systems (CCD cameras) and advanced computer controlled transmission electron microscopes, and (2) the continually decreasing length scale of magnetic recording media and related magnetic materials. Along with the increased experimental resolution and detection sensitivity one should ask the question: how small a magnetic moment can one detect with conventional Lorentz or electron holography techniques? And, perhaps more importantly, which technique should one use to obtain the best spatial resolution? To address these questions we identified a simple model system :the uniformly magnetized sphere.The phase of the electron wave after passing through a region with a non-zero magnetic vector potential and an internal electrostatic potential Vscan be computed from the Aharonov-Bohm trajectory integral. For a spherical particle with a uniform magnetization and a constant mean inner potential (see geometry in Fig. la), this phase shift can be analytically computed.


Author(s):  
K. Harada ◽  
T. Matsuda ◽  
J.E. Bonevich ◽  
M. Igarashi ◽  
S. Kondo ◽  
...  

Previous observations of magnetic flux-lines (vortex lattices) in superconductors, such as the field distribution of a flux-line, and flux-line dynamics activated by heat and current, have employed the high spatial resolution and magnetic sensitivity of electron holography. And recently, the 2-D static distribution of vortices was also observed by this technique. However, real-time observations of the vortex lattice, in spite of scientific and technological interest, have not been possible due to experimental difficulties. Here, we report the real-time observation of vortex lattices in a thin superconductor, by means of Lorentz microscopy using a 300 kV field emission electron microscope. This technique allows us to observe the dynamic motion of individual vortices and record the events on a VTR system.The experimental arrangement is shown in Fig. 1. A Nb thin film for transmission observation was prepared by chemical etching. The grain size of the film was increased by annealing, and single crystals were observed with a thickness of 50∼90 nm.


2010 ◽  
Vol 16 (S2) ◽  
pp. 576-577
Author(s):  
L Huang ◽  
Y Zhu

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.


2007 ◽  
Vol 13 (5) ◽  
pp. 329-335 ◽  
Author(s):  
Suk Chung ◽  
David J. Smith ◽  
Martha R. McCartney

The mean-free-paths for inelastic scattering of high-energy electrons (200 keV) for AlAs and GaAs have been determined based on a comparison of thicknesses as measured by electron holography and convergent-beam electron diffraction. The measured values are 77 ± 4 nm and 67 ± 4 nm for AlAs and GaAs, respectively. Using these values, the mean inner potentials of AlAs and GaAs were then determined, from a total of 15 separate experimental measurements, to be 12.1 ± 0.7 V and 14.0 ± 0.6 V, respectively. These latter measurements show good agreement with recent theoretical calculations within experimental error.


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