Roughening of Au(111) Surfaces During Ion Beam Erosion: A Scanning Tunneling Microscope and X-Ray Diffraction Study

1999 ◽  
Vol 570 ◽  
Author(s):  
A. Judy ◽  
M.V. Ramana Murty ◽  
E. Butler ◽  
J. Pomeroy ◽  
B.H. Cooper ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Normal Incidence ◽  
Scanning Tunneling ◽  
Layer By Layer ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
X Ray ◽  
Glancing Angle

ABSTRACTUsing Scanning Tunneling Microscopy(STM) and X-ray diffraction(XRD), we have studied the development of surface roughness on Au(111) during 500eV Ar+ ion irradiation at different angles. During normal incidence erosion the surface roughens and pattern formation occurs. The surface morphology is a mixture of mounds and pits superimposed onto a larger structure of channels and valleys. The characteristic spacing between features grows with a power law behavior t27, where t is the amount of time the sample was irradiated, in agreement with previous measurements[l]. At glancing angles, erosion proceeds smoothly, but not in layer-by-layer fashion. Finally, a combination of glancing angle and normal incidence erosion is used to create a rippled morphology

Growth of highly oriented La0.84Sr0.16MnO3 perovskite films

1995 ◽  
Vol 10 (10) ◽  
pp. 2518-2522 ◽  
Author(s):  
Brandon W. Chung ◽  
Eric L. Brosha ◽  
Fernando H. Garzon ◽  
Ian D. Raistrick ◽  
Robert J. Houlton ◽  
...  
Keyword(s):  
Thin Films ◽  
Ion Beam ◽  
Rf Magnetron Sputtering ◽  
Scanning Tunneling ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Tunneling Microscopy ◽  
Sputtering Deposition ◽  
X Ray ◽  
Deposited Films

We have grown thin films of La0.84Sr0.16MnO3 on SrTiO3 (100), MgO (100), CeO2 (100)/Al2O3, and (100) oriented yttria-stabilized zirconia (YSZ) substrates by using a 90°off-axis RF magnetron sputtering deposition. X-ray diffraction analysis and ion beam channeling experiments reveal that the deposited films grow epitaxially on SrTiO3, biaxially textured on MgO, and highly textured on YSZ. Scanning tunneling microscopy reveals that the thin films possess extremely smooth surfaces.

scholarly journals Interface morphology of a Cr(001)/Fe(001) superlattice determined by scanning tunneling microscopy and x-ray diffraction: A comparison

2001 ◽  
Vol 89 (1) ◽  
pp. 181-187 ◽  
Author(s):  
C. M. Schmidt ◽  
D. E. Bürgler ◽  
D. M. Schaller ◽  
F. Meisinger ◽  
H.-J. Güntherodt ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Interface Morphology ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
X Ray

Scanning Tunneling Microscopy Imaging of Defects in Layered Compounds

1990 ◽  
Vol 209 ◽  
Author(s):  
G. P. E. M. Van Bakell ◽  
J. Th. M. De Hosson ◽  
T. Hibma
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Structural Features ◽  
Layered Compounds ◽  
Scanning Tunneling ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
Microscopy Imaging ◽  
X Ray ◽  
Sample Orientation ◽  
Stm Images

ABSTRACTStructural features of TiS2 were studied by scanning tunneling microscopy (STM) and single-crystal X-ray diffraction was applied as a complementary technique. STM images in air and at room temperature revealed, beside the trigonal symmetry of the lattice, several new features having this symmetry as well. We conclude that these features not only are to be described by structural defect phenomena which affect octahedral sites in the 1T-CdI2 structure but tetrahedral sites as well. Sample orientation determination by X-ray diffraction provides a unique relation between feature types and sites. A model is proposed in which displaced Ti atoms account for the observed features.

scholarly journals Structural examination of Au/Ge(001) by surface x-ray diffraction and scanning tunneling microscopy

2012 ◽  
Vol 85 (23) ◽  
Author(s):  
S. Meyer ◽  
T. E. Umbach ◽  
C. Blumenstein ◽  
J. Schäfer ◽  
R. Claessen ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
Structural Examination ◽  
X Ray

Approaching microtubule structure with the scanning tunneling microscope (STM)

1994 ◽  
Vol 107 (11) ◽  
pp. 3127-3131
Author(s):  
M. Maaloum ◽  
D. Chretien ◽  
E. Karsenti ◽  
J.K. Horber
Keyword(s):  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Close Inspection ◽  
Tunneling Microscope ◽  
X Ray ◽  
Macromolecular Assemblies ◽  
Left Handed ◽  
X Ray Scattering ◽  
Type Lattice

We demonstrate that the scanning tunneling microscope can be used to obtain information about arrangement of tubulin subunits in the microtubule wall. Long rows of subunits with a periodicity of 3.8 +/- 0.4 nm were clearly visible in the images of microtubules. The separation between the rows of subunits was 4.8 +/- 0.4 nm. Close inspection of two images revealed another periodicity of 7.8 +/- 0.4 nm in the contour levels of the protofilaments. This indicates that alpha and beta tubulin monomers can be resolved. In these areas the monomers were arranged according to a ‘B-type’ lattice. Scanning tunneling microscope images confirm that the lateral contacts between tubulin monomers in adjacent protofilaments are compatible with a three-start, left-handed helix model. This study demonstrates that scanning tunneling microscopy can give direct information on the structure and organization of macromolecular assemblies and can complement the classical methods of electron microscopy and X-ray scattering.

Growth and Magnetic Properties of La0.65Pb0.35MnO3 Films

1999 ◽  
Vol 602 ◽  
Author(s):  
Q. L. Xu ◽  
M. T. Liu ◽  
Y. Liu ◽  
C. N. Borca ◽  
H. Dulli ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Defect Density ◽  
Rf Magnetron Sputtering ◽  
Scanning Tunneling ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
X Ray ◽  
Bulk Magnetization ◽  
Low Energy Electron ◽  
Diffraction Patterns

AbstractWe have successfully grown La0.65PbO.35MnO3 thin films by a RF magnetron sputtering method onto (100) LaAlO3 single crystal substrates. X-ray diffraction measurements are consistent with a (100) cubic orientation of the films. The fourfold symmetry showed by LEED(Low Energy Electron Diffraction) patterns indicate that the films have surface order. STM(Scanning Tunneling Microscopy) measurements indicate that the surface of the films were smooth, with approximate 5 nm roughness. XPS (X-ray Photoemission Spectroscopy) shows that the surface defect density in the films is comparatively low. The bulk magnetization of the films at 6K in 1 T magnetic field reached 77 emu/g and a Curie temperature near 354 K, close to maximum resistivity. A negative magnetoresistance of 47% was observed at 320K in 5.5 T magnetic field.

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