TWO DEFECT-RELATED PHOTOLUMINESCENCE SPECTRA AND CROSS-SECTION TEM OF MBE GROWN CdTe ON (100) InSb
Keyword(s):
Region I
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AbstractA series of MBE grown CdTe films were grown on (100) InSb substrates. The substrate temperature, Ts, was varied from 170° to 285°C in eleven steps. Low temperature (∿2K) photoluminescence measurements and TEM have been combined to show a strong correlation between defect density and the details of the luminescence spectra. A natural division is obtained for samples grown with substrate temperatures from 285°C to 250°C (Region I) and from 225°C to 170°C (Region II).
1986 ◽
Vol 35
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pp. 329-341
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Vol 14
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pp. 873-878
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1992 ◽
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Keyword(s):