Microstructural Investigation of the Oxide Scale on Zr-2.5NB and its Interface with the Alloy Substrate

1998 ◽  
Vol 550 ◽  
Author(s):  
V. Benezra ◽  
S. Mangin ◽  
M. Treska ◽  
M. Spector ◽  
G. Hunter ◽  
...  

AbstractOxidized Zr-2.5Nb is being developed as an articular bearing surface for the femoral component in total joint arthroplasty. It has so far demonstrated superior wear performance against ultrahigh molecular weight polyethylene (UHMWPE) with respect to traditional articulating materials such as Co-Cr-Mo alloys. In this investigation, we used thermogravimetric analysis, transmission electron microscopy, and in situ x-ray diffraction techniques to study the microstructure and stress state of the oxide scale grown on Zr-2.5Nb.The oxidation temperature not only determines the kinetics of oxidation but the morphology of the various oxidation products. We have identified the oxidation products of both phases of the two phase alloy and correlated them with the original alloy microstructure. These include not only monoclinic zirconia but also small amounts of tetragonal zirconia and a mixed oxide phase combining both zirconium and niobium. The alloy microstructure both influences the final oxidation products and is reflected in the microstructure of the oxide. The oxide scale itself has a predominantly columnar microstructure which extends from the oxide/metal interface to the outer surface of the oxide. In situ x-ray diffraction measurements revealed that the oxide scale is stressed in compression following cooling and exhibits strong crystallographic texture. The oxide/metal interface is continuous, without pores or voids which might be detrimental to oxide adhesion. In addition, we have identified a phase which develops at the interface between the beta-zirconium grains and the oxide. We have also identified amorphous regions within the oxide scale which serve as sinks for silicon and other impurity elements found in the alloy.

2001 ◽  
Vol 15 (18) ◽  
pp. 2491-2497 ◽  
Author(s):  
J. L. ZHU ◽  
L. C. CHEN ◽  
R. C. YU ◽  
F. Y. LI ◽  
J. LIU ◽  
...  

In situ high pressure energy dispersive X-ray diffraction measurements on layered perovskite-like manganate Ca 3 Mn 2 O 7 under pressures up to 35 GPa have been performed by using diamond anvil cell with synchrotron radiation. The results show that the structure of layered perovskite-like manganate Ca 3 Mn 2 O 7 is unstable under pressure due to the easy compression of NaCl-type blocks. The structure of Ca 3 Mn 2 O 7 underwent two phase transitions under pressures in the range of 0~35 GPa. One was at about 1.3 GPa with the crystal structure changing from tetragonal to orthorhombic. The other was at about 9.5 GPa with the crystal structure changing from orthorhombic back to another tetragonal.


MRS Advances ◽  
2018 ◽  
Vol 3 (14) ◽  
pp. 773-778 ◽  
Author(s):  
Lei Wang ◽  
Alison McCarthy ◽  
Kenneth J. Takeuchi ◽  
Esther S. Takeuchi ◽  
Amy C. Marschilok

ABSTRACTZnFe2O4 (ZFO) represents a promising anode material for lithium ion batteries, but there is still a lack of deep understanding of the fundamental reduction mechanism associated with this material. In this paper, the complete visualization of reduction/oxidation products irrespective of their crystallinity was achieved experimentally through a compilation of in situ X-ray diffraction, synchrotron based powder diffraction, and ex-situ X-ray absorption fine structure data. Complementary theoretical modelling study further shed light upon the fundamental understanding of the lithiation mechanism, especially at the early stage from ZnFe2O4 up to LixZnFe2O4 (x = 2).


2014 ◽  
Vol 783-786 ◽  
pp. 2059-2064
Author(s):  
Andrzej Baczmański ◽  
Elżbieta Gadalińska ◽  
Chedly Braham ◽  
Sebastian Wroński ◽  
Lea le Joncour ◽  
...  

Diffraction methods for lattice strain measurement provide useful information concerning the nature of grains behaviour during elastoplastic deformation. The main advantage of the diffraction methods is the possibility of studying mechanical properties of polycrystalline materials separately in each phase and in groups of grains with a specific orientation. In this work we present application of the neutron and X-ray diffraction to study “in situ” deformation of two phase stainless steels during tensile loading. The experimental results are compared with self-consistent model.


2007 ◽  
Vol 546-549 ◽  
pp. 1485-1488 ◽  
Author(s):  
Shi Yu Qu ◽  
Ya Fang Han ◽  
Jin Xia Song ◽  
Yong Wang Kang

The effects of Cr and Al on high temperature oxidation resistance of Nb-Si system intermetallics have been investigated by scanning electron microscopy (SEM), X-ray diffraction (XRD) and weight gain method. The results showed that the high temperature oxidation resistance can be substantially improved by proper Cr or Al addition. The further analysis revealed that Cr promotes the formation of CrNbO4 in scale and improve the adherence between the oxide scale and the substrate. It also found that Al improves the surface morphology of oxide scale and changes oxidation products by promoting the AlNbO4 formation.


1998 ◽  
Vol 548 ◽  
Author(s):  
Young Joo Lee ◽  
Francis Wang ◽  
Clare P. Grey ◽  
Sanjeev Mukerjee ◽  
James McBreen

ABSTRACT6Li MAS NMR spectra of lithium manganese oxides with differing manganese oxidation states (LiMn2O4, Li4Mn5O12, Li2Mn4O9, and Li2Mn2O4) are presented. Improved understanding of the lithium NMR spectra of these model compounds is used to interpret the local structure of the LixMn2O4 cathode materials following electrochemical Li+ deintercalation to various charging levels. In situ x-ray diffraction patterns of the same material during charging are also reported for comparison. Evidence for two-phase behavior for x < 0.4 (LixMn2O4) is seen by both NMR and diffraction.


Author(s):  
R. E. Herfert

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.


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