Radiation Effects in Zircon, Hafnon, and Thorite: Implications for Pu Disposal

1998 ◽  
Vol 540 ◽  
Author(s):  
A. Meldrum ◽  
S.J. Zinkle ◽  
L.A. Boatner ◽  
M. Wu ◽  
R. Mu ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Optical Absorption ◽  
Single Crystal ◽  
Microstructural Evolution ◽  
Transmission Electron Microscope ◽  
Nd:Yag Laser ◽  
Radiation Effects ◽  
New Model ◽  
Transmission Electron

AbstractSynthetic ZrSiO4, HfSiO4, and ThSiO4 single-crystal specimens were irradiated by 800 keV Kr+ ions, and the microstructural evolution was observed in-situ in a transmission electron microscope. All three compounds were found to become amorphous up to temperatures in excess of 600°C. Using a new model, the activation energies for annealing were found to be in the range of 3.1 to 3.6 eV for these compounds. At temperatures above 600°C, the orthosilicates were observed to decompose into the component oxides (e.g., tetragonal ZrO2 + amorphous SiO2 in the case of zircon). A single-crystal zircon specimen was also irradiated with a pulsed picosecond Nd:YAG laser operated at 355 nm, and the resulting microstructure was investigated by optical absorption, SEM, AFM, and TEM techniques.

Reconstruction of electron holograms recorded in a non-FEG, non-biprism TEM

1995 ◽  
Vol 53 ◽  
pp. 618-619
Author(s):  
Z.L. Wang
Keyword(s):  
Electron Microscope ◽  
Single Crystal ◽  
Experimental Technique ◽  
Transmission Electron Microscope ◽  
The Other ◽  
Electron Holography ◽  
Transmission Electron ◽  
Coherent Sources ◽  
Imaging Theory ◽  
Normal Specimen

An experimental technique for performing electron holography using a non-FEG, non-biprism transmission electron microscope (TEM) has been introduced by Ru et al. A double stacked specimens, one being a single crystal foil and the other the specimen, are loaded in the normal specimen position in TEM. The single crystal, which is placed onto the specimen, is responsible to produce two beams that are equivalent to two virtual coherent sources illuminating the specimen beneath, thus, permitting electron holography of the specimen. In this paper, the imaging theory of this technique is described. Procedures are introduced for digitally reconstructing the holograms.

Observation of dislocations in dynamically loaded Cu-SiO2

1986 ◽  
Vol 44 ◽  
pp. 424-425
Author(s):  
D. S. Pritchard
Keyword(s):  
Electron Microscope ◽  
Strain Rate ◽  
Single Crystal ◽  
Transmission Electron Microscope ◽  
Volume Fraction ◽  
Screw Dislocations ◽  
Spherical Inclusions ◽  
Transmission Electron ◽  
Crystal Dispersion ◽  
Strain Rate Loading

The effect of varying the strain rate loading conditions in compression on a copper single crystal dispersion-hardened with SiO2 particles has been examined. These particles appear as small spherical inclusions in the copper lattice and have a volume fraction of 0.6%. The structure of representative crystals was examined prior to any testing on a transmission electron microscope (TEM) to determine the nature of the dislocations initially present in the tested crystals. Only a few scattered edge and screw dislocations were viewed in those specimens.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

scholarly journals In-Situ Stretching Patterned Graphene Nanoribbons in the Transmission Electron Microscope

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Zhongquan Liao ◽  
Leonardo Medrano Sandonas ◽  
Tao Zhang ◽  
Martin Gall ◽  
Arezoo Dianat ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Graphene Nanoribbons ◽  
Transmission Electron

scholarly journals In situ disordering of monoclinic titanium monoxide Ti5O5 studied by transmission electron microscope TEM

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
А. А. Rempel ◽  
W. Van Renterghem ◽  
А. А. Valeeva ◽  
M. Verwerft ◽  
S. Van den Berghe
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Titanium Monoxide ◽  
Transmission Electron
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