Temperature Dependent Intermixing At The V/Ge(111) Interface
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ABSTRACTHigh resolution core level photoemission results show the temperature evolution of the V/Ge(111) interface in the range from 300 to 600 K. Three well-defined chemical environments are present for Ge at 300K (the first is the substrate and the other two are reaction products with overall shifts of−0.5 and −0.95 eV). Increasing the temperature enhances Ge outdiffusion, and a homogeneous reacted layer forms when deposition and measurements are done isothermally at 475K. The activation energy for this diffusion process is very low (5 kcal/mole), indicating the importance of grain boundary diffusion at reacting, heterogeneous interfaces.
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1966 ◽
Vol 21
(7)
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pp. 678-690
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2020 ◽
Vol 514
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pp. 167227
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On a possible temperature dependence of the activation energy for grain boundary diffusion in metals
1978 ◽
Vol 12
(8)
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pp. 709-714
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