Electrical Transport in thin Silicide Films

1985 ◽  
Vol 54 ◽  
Author(s):  
J. C. Hensel

ABSTRACTThis paper reviews our recent studies of electrical transport in thin suicide films. Resistivity as a function of temperature, Hall effect, and magnetoresistance have been characterized for CoSi2 and NiSi2 and in conjunction with band theory provide estimates of important electronic parameters, viz. carrier densities and carrier scattering lengths. Resistivity data for TiSi2 and TaSi2 are included. Also examined in resistivity are (i) effects produced by ion bombardment which show CoSi2 to have an unusual susceptibility to radiation damage and (ii) classical size effects in the very thin film regime which show the boundary scattering to be principally specular. As an application we describe a Si/CoSi2/Si heterostructure transistor recently developed.

2000 ◽  
Author(s):  
D.-J. Yao ◽  
C.-J. Kim ◽  
G. Chen

Abstract Thin-film thermoelectric devices have potentially higher efficiency than bulk ones due to quantum and classical size effects of electrons and phonons. In this paper, we discuss the design of thin-film thermoelectric microcoolers for achieving high performance. The devices considered are membrane structures based on electron transport along the film plane. A model is developed to include the effects of heat loss and leg shape. Design optimization is performed based on the modeling results.


2013 ◽  
Vol 102 (5) ◽  
pp. 051608 ◽  
Author(s):  
Ricardo Henriquez ◽  
Luis Moraga ◽  
German Kremer ◽  
Marcos Flores ◽  
Andres Espinosa ◽  
...  

1984 ◽  
Vol 37 ◽  
Author(s):  
J. C. Hensel ◽  
R. T. Tung ◽  
J. M. Poate ◽  
F. C. Unterwald

AbstractWe have investigated electrical transport in thin films of CoSi2 at low temperatures as a function of film thickness and observe in conductivity a size effect much smaller than seen heretofore indicative of a high degree of specularity in the boundary scattering. This in large part owes to the unique characteristics of these films, i.e., they are single crystal and continuous down to ∼60Å thickness with long bulk scattering lengths (≈1000Å) in transport at liquid He temperatures and have nearly atomically perfect interfaces.


2020 ◽  
Author(s):  
Roshan Kumar Patel ◽  
Shobha Gondh ◽  
Harish Kumar ◽  
Shuchi Shyam Chitrakar ◽  
A. K. Pramanik

1997 ◽  
Vol 229 (6) ◽  
pp. 401-405 ◽  
Author(s):  
A. Crépieux ◽  
C. Lacroix ◽  
N. Ryzhanova ◽  
A. Vedyayev

2006 ◽  
Vol 100 (11) ◽  
pp. 114905 ◽  
Author(s):  
M. Cattani ◽  
M. C. Salvadori ◽  
A. R. Vaz ◽  
F. S. Teixeira ◽  
I. G. Brown

2012 ◽  
Vol 1404 ◽  
Author(s):  
A.A. Maznev

ABSTRACTThe onset of size effects in phonon-mediated thermal transport along a thin film at temperatures comparable or greater than the Debye temperature is analyzed theoretically. Assuming a quadratic frequency dependence of phonon relaxation rates in the low-frequency limit, a simple closed-form formula for the reduction of the in-plane thermal conductivity of thin films is derived. The effect scales as the square root of the film thickness, which leads to the prediction of measurable size-effects even at “macroscopic” distances ~100 μm. However, this prediction needs to be corrected to account for the deviation from the ω−2 dependence of phonon lifetimes at sub-THz frequencies due to the transition from Landau-Rumer to Akhiezer mechanism of phonon dissipation.


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