Cross-Sectional and Plan-View Observation of Cracks Introduced in Si at the Ductile-Brittle Transition Temperature
AbstractMode I cracks introduced in Si at the ductile-brittle transition temperature (DBTT) have been examined extensively using transmission electron microscopy. Cross-sectional as well as plane-view specimens suitable for the observation were prepared using a focused ion beam technique. Many small dislocation loops nucleate at the fracture surface of a mode I crack during the propagation at DBTT.
1991 ◽
Vol 57
(544)
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pp. 2916-2923
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Effect of the Composition of Sn–Zn Liquid on the Ductile-Brittle Transition Temperature of Aluminium
1969 ◽
Vol 10
(3)
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pp. 178-181
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2021 ◽
1964 ◽
Vol 9
(102)
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pp. 1063-1067
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2010 ◽
Vol 527
(26)
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pp. 7147-7150
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2011 ◽
Vol 312-315
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pp. 110-115