Tie Importance of Contact Radius for Substrate-Independent Property Measurement of Thin Films

1998 ◽  
Vol 522 ◽  
Author(s):  
J. L. Hay ◽  
M. E. O'Hern ◽  
W. C. Oliver
Keyword(s):  
Thin Films ◽  
Contact Radius ◽  
Property Measurement ◽  
Substrate Independent ◽  
Independent Property

scholarly journals Micro-supercapacitors based on oriented coordination polymer thin films for AC line-filtering

RSC Advances ◽  
2018 ◽  
Vol 8 (53) ◽  
pp. 30624-30628 ◽  
Author(s):  
Weiwei Hua ◽  
Jingwei Xiu ◽  
Fei Xiu ◽  
Zepu Zhang ◽  
Juqing Liu ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Coordination Polymer ◽  
Polymer Thin Films ◽  
Polymer Thin Film ◽  
Electrode Fabrication ◽  
Thin Film Electrodes ◽  
Substrate Independent

Micro-supercapacitors exhibiting excellent AC line-filtering with oriented coordination polymer thin-film electrodes are fabricated based on a substrate-independent electrode fabrication strategy.

Measurement of the Thermal Conductivity and Heat Capacity of Freestanding Shape Memory Thin Films Using the 3ω Method

2008 ◽  
Vol 130 (10) ◽  
Author(s):  
Ankur Jain ◽  
Kenneth E. Goodson
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Conductivity ◽  
Heat Capacity ◽  
Shape Memory ◽  
Temperature Response ◽  
Thermal Response ◽  
Temperature Phase ◽  
Property Measurement ◽  
Low Temperature Phase

An accurate measurement of the thermophysical properties of freestanding thin films is essential for modeling and predicting thermal performance of microsystems. This paper presents a method for simultaneous measurement of in-plane thermal conductivity and heat capacity of freestanding thin films based on the thermal response to a sinusoidal electric current. An analytical model for the temperature response of a freestanding thin film to a sinusoidal heating current passing through a metal heater patterned on top of the thin film is derived. Freestanding thin-film samples of silicon nitride and nickel titanium (NiTi), a shape memory alloy, are microfabricated and characterized. The thermal conductivity of thin-film NiTi, which increases linearly between 243K and 313K, is 40% lower than the bulk value at room temperature. The heat capacity of NiTi also increases linearly with temperature in the low temperature phase and is nearly constant above 280K. The measurement technique developed in this work is expected to contribute to an accurate thermal property measurement of thin-film materials. Thermophysical measurements on NiTi presented in this work are expected to aid in an accurate thermal modeling of microdevices based on the shape memory effect.

Measurement on the Mechanical Properties of SiC Thin Films Based on Square Thin Films Theory

2015 ◽  
Vol 645-646 ◽  
pp. 287-290
Author(s):  
Yao Min Chen ◽  
Pei Tao Dong ◽  
Xue Zhong Wu ◽  
Yu Lie Wu
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Mechanical Property ◽  
Chemical Properties ◽  
Property Testing ◽  
Stable Chemical ◽  
Property Measurement ◽  
Sic Films

SiC films made of different methods may have different mechanical properties, so their mechanical properties need to be determined by mechanical property measurement [1]. Since SiC films have stable chemical properties, it’s very difficult to be etched [2]. This paper introduce a method for SiC films mechanical property testing without processing SiC. Moreover, in view of the lack of square SiC films’ mechanical properties research, this paper also do simulation on it.

Supramolecular Surface Chemistry: Substrate-Independent, Phosphate-Driven Growth of Polyamine-Based Multifunctional Thin Films

2015 ◽  
Vol 25 (26) ◽  
pp. 4144-4152 ◽  
Author(s):  
Waldemar A. Marmisollé ◽  
Joseba Irigoyen ◽  
Danijela Gregurec ◽  
Sergio Moya ◽  
Omar Azzaroni
Keyword(s):  
Thin Films ◽  
Surface Chemistry ◽  
Substrate Independent

Substrate independent oriented 2D growth of SnS thin films from sputtering

2019 ◽  
Vol 6 (11) ◽  
pp. 116427
Author(s):  
Pravakar P Rajbhandari ◽  
Ashok Chaudhari ◽  
Tara P Dhakal
Keyword(s):  
Thin Films ◽  
Sns Thin Films ◽  
Substrate Independent

Substrate-independent and large-area synthesis of carbon nanotube thin films using ZnO nanorods as template and dopamine as carbon precursor

Carbon ◽  
2015 ◽  
Vol 83 ◽  
pp. 275-281 ◽  
Author(s):  
Wei Gong ◽  
Wenshuang Chen ◽  
Jianping He ◽  
Ying Tong ◽  
Chun Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
Carbon Nanotube ◽  
Zno Nanorods ◽  
Carbon Precursor ◽  
Large Area ◽  
Substrate Independent

A method for making substrate-independent hardness measurements of soft metallic films on hard substrates by nanoindentation

2003 ◽  
Vol 18 (6) ◽  
pp. 1383-1391 ◽  
Author(s):  
Ting Y. Tsui ◽  
C. A. Ross ◽  
G. M. Pharr
Keyword(s):  
Thin Films ◽  
Contact Area ◽  
Empirical Relationship ◽  
New Method ◽  
Metallic Films ◽  
Aluminum Films ◽  
Sapphire Substrates ◽  
Substrate Independent ◽  
Hard Substrates ◽  
Penetration Depths

A new method for making substrate-independent hardness measurements by nanoindentation techniques that applies to soft metallic films on very hard substrates is presented. The primary issue to be addressed is substrate-induced enhancement of indentation pileup and the ways it influences the indentation contact area. On the basis of experimental observations of soft aluminum films deposited on silicon, glass, and sapphire substrates, an empirical relationship was derived that relates the amount of pileup to the contact depth. From this relationship and the associated experimental observations, a method was developed that allows the intrinsic hardness of the film to be estimated, even when the indenter penetrates through the film into the substrate. The method should prove useful for very thin films (<100 nm) in which it is not possible to make measurements at penetration depths small enough to avoid subtrate effects.

scholarly journals Substrate-independent analysis of microcrystalline silicon thin films using UV Raman spectroscopy

2017 ◽  
Vol 254 (9) ◽  
pp. 1700204 ◽  
Author(s):  
Joe V. Carpenter ◽  
Mark Bailly ◽  
Allison Boley ◽  
Jianwei Shi ◽  
Michael Minjares ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Microcrystalline Silicon ◽  
Silicon Thin Films ◽  
Independent Analysis ◽  
Uv Raman Spectroscopy ◽  
Uv Raman ◽  
Substrate Independent

Measuring substrate-independent modulus of thin films

2011 ◽  
Vol 26 (6) ◽  
pp. 727-738 ◽  
Author(s):  
Jennifer Hay ◽  
Bryan Crawford
Keyword(s):  
Thin Films ◽  
Image Position ◽  
Substrate Independent

Abstract

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