In-Plane Anisotropy In CoCr(Ta,Pt)/Cr Films Deposited onto Substrates with Controlled Topography
Keyword(s):
AbstractIn-plane magnetic anisotropy can be induced in Cr-underlayer/Co-alloy thin films by grooves or scratches in the substrate. To quantify this effect, silica substrates have been prepared with large areas of submicron grooves using interferometric lithography. The growth of Cr films and Cr/Co-alloy bilayer films on these substrates has been investigated, and in-plane magnetic anisotropy has been observed.
2010 ◽
Vol 487
(1-3)
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pp. 97-100
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2014 ◽
Vol 50
(7)
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pp. 1-6
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2015 ◽
Vol 815
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pp. 227-232
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