Morphology of Low Temperature Carbon Films Prepared by VHF CVD: Correlation with Field Emission

1998 ◽  
Vol 509 ◽  
Author(s):  
A.N. Titkov ◽  
A.I. Kosarev ◽  
A.J. Vinogradov ◽  
Z. Waqar ◽  
I.V. Makarenko ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperature ◽  
Field Emission ◽  
Significant Influence ◽  
Substrate Surface ◽  
Carbon Films ◽  
Emission Characteristics ◽  
Force Microscopy ◽  
Atomic Force ◽  
Deposition Parameters

AbstractThe effect of deposition parameters and substrate on the morphology of carbon films prepared in VHF plasma at low temperature has been studied by Atomic Force Microscopy. Carbon films demonstrating superior emission characteristics were the smoothest, but not all of the smoothest films demonstrated good emission. Significant influence of pre-growth treatment of the substrate surface on the emission characteristics of the films was found.

Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

1994 ◽  
Vol 76 (6) ◽  
pp. 3443-3447 ◽  
Author(s):  
J. M. Yáñez‐Limón ◽  
F. Ruiz ◽  
J. González‐Hernández ◽  
C. Vázquez‐López ◽  
E. López‐Cruz
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Carbon Films ◽  
Force Microscopy ◽  
Atomic Force

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

Low temperature corneal laser welding investigated by atomic force microscopy

2009 ◽  
Author(s):  
Paolo Matteini ◽  
Francesca Sbrana ◽  
Bruno Tiribilli ◽  
Roberto Pini
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperature ◽  
Laser Welding ◽  
Force Microscopy ◽  
Atomic Force

Bovine Serum Albumin Adhesion Force Measurements Using an Atomic Force Microscopy

2008 ◽  
Vol 32 ◽  
pp. 49-52 ◽  
Author(s):  
Chun Chih Lai ◽  
John M. Bell ◽  
Nunzio Motta
Keyword(s):  
Atomic Force Microscopy ◽  
Bovine Serum Albumin ◽  
Serum Albumin ◽  
Bovine Serum ◽  
Adhesion Force ◽  
Direct Method ◽  
Substrate Surface ◽  
Liquid Environment ◽  
Force Microscopy ◽  
Atomic Force

A new, direct method has been developed to measure the adhesion forces of bovine serum albumin (BSA) on surfaces by using Atomic Force Microscopy (AFM) in liquid environment. We were able to measure interactions between proteins and substrate surface in PBS solution directly without any modification to the substrate or the AFM tip. Two different surfaces have been used in the experiments: mica (hydrophilic surface) and polystyrene (hydrophobic surface). The results show that a polystyrene surface is more adhesive to BSA than a mica surface. This is consistent with previous research, which assessed that hydrophobic surfaces enhance protein adhesion but hydrophilic surfaces do not, demonstrating the effectiveness of the technique.

Atomic Force Microscopy of Self-Assembled Nanostructures of TPPS4 on SAM Substrates

2004 ◽  
Vol 97-98 ◽  
pp. 195-200 ◽  
Author(s):  
R. Augulis ◽  
R. Valiokas ◽  
B. Liedberg ◽  
R. Rotomskis
Keyword(s):  
Atomic Force Microscopy ◽  
Substrate Surface ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Polar Groups ◽  
Atomic Force ◽  
Adsorption Of Organic Molecules ◽  
J Aggregates ◽  
Self Assembled ◽  
Highly Correlated

The adsorption of organic molecules on solid surfaces is one of the fundamental processes for the development of molecular-based nanodevices. Here we focus on the adsorption and ordering of the TPPS4-based J-aggregates on silicon and gold as well as on self-assembled monolayer (SAM) surfaces. The SAMs used for the experiments were based on the chemisorption of thiol containing compounds onto gold. Long ω-substituted alkanethiols are spontaneously assembled on gold to form highly ordered and densely packed layers with controllable chemical and physical properties. TPPS4 J-aggregates were dispersed on SAM surfaces, and on plain gold and silicon substrates for comparison. The dimensions of aggregates, measured by means of atomic force microscopy, varied depending on the type of substrate. Long stripe-like aggregates were flattened on the substrate surface, and the height and width of aggregates highly correlated with the polarity of surface groups. For example, the J-aggregates were narrower on hydrophobic substrates (with non-polar groups) and wider on hydrophilic substrates (with polar groups). These observations support the hypothesis, that TPPS4 forms .soft. cylindrical aggregates, that appear flattened on the substrate.

Sign in / Sign up

Export Citation Format

Share Document