Correlation Between Electrical Properties and Composition / Microstructure of Si-C-N Ceramics
Keyword(s):
X Ray
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ABSTRACTIn this paper we report on the measurement of electrical properties of multielement ceramics in the ternary Si-C-N system using the impedance spectroscopy. The results were correlated to the chemical composition, the hybridization state and the microstructural characteristics investigated by chemical analysis, X-Ray absorption near edge spectroscopy (XANES), Raman Spectroscopy, high resolution transmission electron microscopy (HRTEM) and X-Ray powder diffraction (XRD).
2005 ◽
Vol 109
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pp. 12738-12741
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1988 ◽
Vol 92
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pp. 1903-1916
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2007 ◽
Vol 180
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pp. 2682-2689
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2006 ◽
Vol 21
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pp. 3109-3123
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2012 ◽
Vol 52
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pp. 17-28
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1982 ◽
Vol 40
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pp. 722-723
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