The Effect of Elastic Strain on the Electrical and Magnetic Properties of Epitaxial Ferromagnetic SrRuO3 Thin Films

1997 ◽  
Vol 494 ◽  
Author(s):  
Q. Gan ◽  
R. A. Rao ◽  
J. L. Garrett ◽  
Mark Lee ◽  
C. B. Eom

ABSTRACTWe report the direct measurement of elastic strain effect on the electrical and magnetic properties of single domain epitaxial SrRuO3 thin films, using a lift-off technique. The as-grown films on vicinal (001) SrTiO3 substrates are subjected to elastic biaxial compressive strain within the plane and tensile strain normal to the plane. In contrast, the lift-off films prepared by chemical etching of SrTiO3 substrates, are completely strain free with bulk like lattice. Our measurements indicate that the elastic strain can significantly affect the electrical and magnetic properties of epitaxial ferromagnetic SrRuO3 thin films. For the strained films, the Curie temperature (Tc) was suppressed to 150K and the saturation magnetic moment (Ms) was decreased to 1.15μB/Ru atom as compared to a Tc of 160K and Ms of 1.45μB/Ru atom for the strain free films. These property changes are attributed to the structural distortion due to the elastic strain in the as-grown epitaxial thin films. Our results provide direct evidence of the crucial role of lattice strain in determining the properties of the perovskite epitaxial thin films.

2019 ◽  
Vol 1 (4) ◽  
pp. 595-599
Author(s):  
Satoshi Fujiwara ◽  
Yuji Kurauchi ◽  
Yasushi Hirose ◽  
Isao Harayama ◽  
Daiichiro Sekiba ◽  
...  

2001 ◽  
Vol 32 (1) ◽  
pp. 62-65 ◽  
Author(s):  
Jun Zhang ◽  
Hidekazu Tanaka ◽  
Teruo Kanki ◽  
Tomoji Kawai

2020 ◽  
Vol 102 (21) ◽  
Author(s):  
Stephan Geprägs ◽  
Björn Erik Skovdal ◽  
Monika Scheufele ◽  
Matthias Opel ◽  
Didier Wermeille ◽  
...  

2010 ◽  
Vol 82 (18) ◽  
Author(s):  
E. Karhu ◽  
S. Kahwaji ◽  
T. L. Monchesky ◽  
C. Parsons ◽  
M. D. Robertson ◽  
...  

2005 ◽  
Vol 86 (11) ◽  
pp. 112513 ◽  
Author(s):  
Yasushi Ogimoto ◽  
Naoko Takubo ◽  
Masao Nakamura ◽  
Hiroharu Tamaru ◽  
Makoto Izumi ◽  
...  

1990 ◽  
Vol 195 ◽  
Author(s):  
T.E. Schlesinger ◽  
A. Gavrin ◽  
R.C. Cammarata ◽  
C.-L. Chien

ABSTRACTThe mechanical properties of sputtered Ni-Al2O3 granular thin films were investigated by low load microharaness testing. It was found that the microhardness of these films displayed a percolation threshold at a nickel volume fraction of about 0.6, below which the hardness is greatly enhanced. This behavior is qualitatively similar to the electrical and magnetic properties of these types of films. A percolation threshold in hardness can be understood as due to a change in the mechanism for plastic deformation.


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