Cathodoluminescence Studies of InGaN Quantum Wells

1997 ◽  
Vol 482 ◽  
Author(s):  
F. A. Ponce ◽  
S. A. Galloway ◽  
W. Goetz ◽  
R. S. Kern

AbstractLow temperature cathodoluminescence has been used to investigate the spatial characteristics of light emission in InxGa1−xN single quantum wells. High spatial resolution, narrow band pass imaging shows the luminescence to be strongly inhomogeneous in wavelength as well as in intensity on a sub-micron scale. Cathodoluminescence spectra correlate favorably with photoluminescence spectra. However, when spectra are recorded from different areas in spot mode, the quantum emission varies significantly in wavelength. The observed variations are consistent with composition inhomogeneities in the quantum well.

2006 ◽  
Vol 89 (23) ◽  
pp. 232109 ◽  
Author(s):  
S. Sonderegger ◽  
E. Feltin ◽  
M. Merano ◽  
A. Crottini ◽  
J. F. Carlin ◽  
...  

2005 ◽  
Vol 87 (13) ◽  
pp. 131911 ◽  
Author(s):  
S. Srinivasan ◽  
M. Stevens ◽  
F. A. Ponce ◽  
T. Mukai

2004 ◽  
Vol 831 ◽  
Author(s):  
Barbara Neubert ◽  
Frank Habel ◽  
Peter Bruckner ◽  
Ferdinand Scholz ◽  
Till Riemann ◽  
...  

ABSTRACTNon (0001) GalnN QWs have been grown by low pressure MOVPE on side facets of triangular shaped selectively grown GaN stripes. By analysing low temperature photo- and cathodoluminescence and room temperature electroluminescence, we found strong indications, that both, In and Mg are less efficiently incorporated on these side facets compared to the common (0001) plane with even lower efficiency for stripes running along (1–100) compared to (11–20). Nevertheless, we observed strong light emission from these quantum wells, supposed to be at least partly caused by the reduced piezo-electric field.


2008 ◽  
Vol 600-603 ◽  
pp. 1305-1308
Author(s):  
Masanobu Yoshikawa ◽  
Masataka Murakami ◽  
Takaya Fujita ◽  
K. Inoue ◽  
K. Matsuda ◽  
...  

We have measured cathodoluminescence (CL) spectra in the vicinity of V-defects in InGaN single-quantum-well(SQW) films at nanometer level, using newly developed CL apparatus (SE-SEM-CL). From spectroscopic CL measurement, it has been found that the spectra change dramatically in the vicinity of V-defects in the region of £50nm. The SE-SEM-CL has a potential to detect the CL spectral variation at spatial resolution with £50nm.


1992 ◽  
Vol 280 ◽  
Author(s):  
M.J.S.P. Brasil ◽  
R. E. Nahory ◽  
M. C. Tamargo ◽  
S. Schwarz

ABSTRACTWe have investigated the interface roughness of single thin InP/InAs quantum wells grown by Chemical Beam Epitaxy. We report results of low temperature photoluminescence and secondary ion mass spectroscopy. The interface roughness is characterized by multiple-line photoluminescence spectra and is very sensitive to parameters such as the growth temperature. Details of the interface roughness are discussed based on the shifts of the excitonic energies observed by photoluminescence.


2009 ◽  
Vol 2 (12) ◽  
pp. 121002 ◽  
Author(s):  
Chaowang Liu ◽  
Alexander Šatka ◽  
Lethy Krishnan Jagadamma ◽  
Paul R. Edwards ◽  
Duncan Allsopp ◽  
...  

1991 ◽  
Vol 59 (7) ◽  
pp. 820-822 ◽  
Author(s):  
K. F. Longenbach ◽  
S. Xin ◽  
C. Schwartz ◽  
Y. Jiang ◽  
W. I. Wang

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