Structural Stability Diagrams for Thin-Film Multilayers
Keyword(s):
New Type
◽
ABSTRACTStructural stability in thin-film multilayers is described in terms of classical thermodynamics, involving the competition between bulk and interfacial energies. A new type of phase diagram is introduced, the biphase diagram, in which concurrent phase stabilities are mapped as a function of two degrees of freedom, corresponding to two independent layer thicknesses in a periodic multilayer. The model is used to explain our observations of phase stabilities in Al/Ti multilayers, as a function of varying layer thicknesses. The model is also applied to explain the experimental observations made by other investigators on phase stability in Co/Cr thin-film multilayers.
2005 ◽
Vol 19
(15n17)
◽
pp. 2645-2650
◽
Keyword(s):
Vestnik of Volga State University of Technology Ser Radio Engineering and Infocommunication Systems
◽
2016 ◽
Vol 31
(3)
◽
pp. 53-65
2019 ◽
Vol 139
(4)
◽
pp. 520-521
Keyword(s):