Surface Electronic Function Properties Characterization from Defect Heterogeneity Dominated Specular/Glancing/Grazing Versus Bulk Transmission Small-Angle-Scattering(SAS) Diffraction-Pattern via the Static Synergetics Algorithm/Exprimental Model

1985 ◽  
Vol 48 ◽  
Author(s):  
Edward Siegel
Keyword(s):  
Diffraction Pattern ◽  
Small Angle ◽  
Grazing Incidence ◽  
Small Angle Scattering ◽  
Static Structure Factor ◽  
Complex Frequency ◽  
Static Structure ◽  
Mathematical Algorithm ◽  
Angle Scattering ◽  
Diffraction Patterns

ABSTRACTThe ability of Static Synergetios,the universal,reversible,scalable mathematical algorithm/(used as an) experimental model, connecting external radiation small-angle-scattering diffraction-pattern/static structure factor SSAS (k),dominated by defect heterogeneities/clumps/clusters,to electronic (magniic,mechanical) complex,frequency-dependent electrical,dielectric, noise,optical…Function properties,can be enhanced by utilizing a comparison/difference of bulk transmission versus surface specular/glancing/grazing incidence small-angle-scattering diffraction-patterns.

Ceramic Microstructure-Property Fractal-Diffractal Calculus : Static Synergetics Yield Optimization During Processing Via Real–Time Q.A.and Interactive Q.C

1986 ◽  
Vol 73 ◽  
Author(s):  
Edward Siegel
Keyword(s):  
Pattern Recognition ◽  
Diffraction Pattern ◽  
Small Angle ◽  
Structure Factor ◽  
Static Structure Factor ◽  
Scaling Relation ◽  
Static Structure ◽  
Yield Optimization ◽  
Angle Scattering ◽  
Ceramic Microstructure

ABSTRACTCeramic microstructure-property relationships dominate any and all attempts at“better ceramics through chemistry”. Required is some universal calculus to allow analytic, universal, reversible scalable computation of one from the other. Static Synergetics universality-principle provides such a flexible versatile tool, heretofore not available. It is a reexpression of the very basic three laws of thermodynamics into r-,k-,and w-domainsthe equivalence of(symmetry-breaking/defect) Pattern-recognition(the “structure”) to signal-processing(the frequency-dependent FM) properties/ Functions. More basically, it is a manifestation of Noether's theoremthe basis of mechanics and orgin of the energy continuity equation that is the thermodynamic first law. Such an algorithm, the”software”of yield optimization(quality and quantity) real-time Q.A. and(in parallel with a specificity dominated process- model)interactive Q.C.requires as “hardware”produced input the small-angle-scattering(SAS)dominated diffraction-pattern/static structure factor SSAS(k) or Fourier transform r-domain Pattern/ photomicrograph-recognition imaging(of processing-introduced property-detrimental defects(heterogeneity heirarchy)). Output are universal FM:I/f flicker(voltage and/or current)noise power spectrum, signal-to-noise ratio over dynamic rangemulti-level system dominated anomalous low temperature/frequency thermalracoustic. properties, and 1/f relaxation response susceptibility polarization catastrophe derived dielectric, electrical, optical, noise, viscoelastic/mechanicalmagnetic,...property Functions. Input can be the ubiquitous,...universal Mandelbrot fractals,dominating ceramics;output(and internal)Functions are Berry-Nye-Jakeman wdomain diffractals,dominating all properties universally.How and Why it works are detailed exactly;universality, reversibility and scalability are analytically insured for self-similar(or selfaffine) fractal scaling-relation Pattern-recognition input;approximate. deviations from universal Functions output obtains from less than perfect mathematically ideal fractal scaling-relation Pattern-recognition input.Static Synergetics provides a new practical use for external radiation small-angle-scattering(SAS) diffraction-pattern/static structure factor measurements in ceramic material microstructure-property relationships during processing

Grazing-incidence small-angle scattering measurement of Ge islands capped with a Si layer

2002 ◽  
Vol 81 (13) ◽  
pp. 2358-2360 ◽  
Author(s):  
Hiroshi Okuda ◽  
Shojiro Ochiai ◽  
Kazuki Ito ◽  
Yoshiyuki Amemiya
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Small Angle Scattering ◽  
Angle Scattering ◽  
Scattering Measurement

SLADS: a parallel code for direct simulations of scattering of large anisotropic dense nanoparticle systems

2017 ◽  
Vol 50 (3) ◽  
pp. 951-958 ◽  
Author(s):  
Sen Chen ◽  
Juncheng E ◽  
Sheng-Nian Luo
Keyword(s):  
Analytical Solutions ◽  
Small Angle ◽  
Real Space ◽  
Small Angle Scattering ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Parallel Code ◽  
Diffraction Patterns

SLADS(http://www.pims.ac.cn/Resources.html), a parallel code for direct simulations of X-ray scattering of large anisotropic dense nanoparticle systems of arbitrary species and atomic configurations, is presented. Particles can be of arbitrary shapes and dispersities, and interactions between particles are considered. Parallelization is achieved in real space for the sake of memory limitation. The system sizes attempted are up to one billion atoms, and particle concentrations in dense systems up to 0.36. Anisotropy is explored in terms of superlattices. One- and two-dimensional small-angle scattering or diffraction patterns are obtained.SLADSis validated self-consistently or against cases with analytical solutions.

An X-Ray Small-Angle Scattering Instrument

1967 ◽  
Vol 11 ◽  
pp. 332-338 ◽  
Author(s):  
Donald M. Koffman
Keyword(s):  
Small Angle ◽  
Scintillation Counter ◽  
Small Angle Scattering ◽  
High Angular Resolution ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Angle Scattering ◽  
Diffraction Patterns

AbstractAn X-ray small-angle scattering instrument is described which is used for recording X-ray diffraction patterns or small-angle X-ray scattering curves in an angular region very close to the direct beam. The measurement of X-ray intensity is accomplished with standard geiger or scintillation counter techniques. The instrument is designed for use with a spot-focus or vertical-line X-ray source, In essence, it is a multiple-reflection double-crystal diffractometer, based on a concept developed by Bonse and Hart, employing two grooved perfect germanium crystals arranged in the parallel position. Multiple diffraction from these crystals produces a monochromated X-ray beam which can be several millimeters wide while still exhibiting extremely high angular resolution. As a result, effective sample volumes can be employed with maximum volume-to-thickness ratios. The principal features of the instrument are discussed with emphasis on the advantages of this device over those employing complex slit systems and film-re cording techniques, Data are presented to illustrate the operation, intensity, and resolution of the unit.

scholarly journals BornAgain: software for simulating and fitting grazing-incidence small-angle scattering

2020 ◽  
Vol 53 (1) ◽  
pp. 262-276 ◽  
Author(s):  
Gennady Pospelov ◽  
Walter Van Herck ◽  
Jan Burle ◽  
Juan M. Carmona Loaiza ◽  
Céline Durniak ◽  
...  
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Small Angle Scattering ◽  
Magnetic Scattering ◽  
Functional Requirements ◽  
Neutron Polarization ◽  
X Ray ◽  
Specular Scattering ◽  
Angle Scattering ◽  
Python Scripting

BornAgain is a free and open-source multi-platform software framework for simulating and fitting X-ray and neutron reflectometry, off-specular scattering, and grazing-incidence small-angle scattering (GISAS). This paper concentrates on GISAS. Support for reflectometry and off-specular scattering has been added more recently, is still under intense development and will be described in a later publication. BornAgain supports neutron polarization and magnetic scattering. Users can define sample and instrument models through Python scripting. A large subset of the functionality is also available through a graphical user interface. This paper describes the software in terms of the realized non-functional and functional requirements. The web site https://www.bornagainproject.org/ provides further documentation.

Normalization of grazing-incidence small angle scattering of phospholipid alloy systems at the K absorption edge of phosphorous: A standard sample approach

2014 ◽  
Vol 53 (5S1) ◽  
pp. 05FH02 ◽  
Author(s):  
Hiroshi Okuda ◽  
Takayoshi Yamamoto ◽  
Kohki Takeshita ◽  
Mitsuhiro Hirai ◽  
Kazunobu Senoo ◽  
...  
Keyword(s):  
Absorption Edge ◽  
Small Angle ◽  
Standard Sample ◽  
Grazing Incidence ◽  
Small Angle Scattering ◽  
Angle Scattering ◽  
Alloy Systems

Local defects in thin polymer films: a scanning sub-microbeam grazing incidence small angle scattering investigation

2005 ◽  
Vol 357 (1-2) ◽  
pp. 148-151 ◽  
Author(s):  
P. Müller-Buschbaum ◽  
S.V. Roth ◽  
M. Burghammer ◽  
E. Bauer ◽  
S. Pfister ◽  
...  
Keyword(s):  
Polymer Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Small Angle Scattering ◽  
Thin Polymer Films ◽  
Angle Scattering ◽  
Thin Polymer ◽  
Local Defects

Meeting Reports: Workshop on Grazing Incidence Small Angle Scattering at HASYLAB

2005 ◽  
Vol 18 (5) ◽  
pp. 17-18
Author(s):  
R. Gehrke ◽  
S. V. Roth ◽  
P. Müller-Buschbaum
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Small Angle Scattering ◽  
Angle Scattering

scholarly journals Grazing-incidence Small-angle Scattering as a Tool for Thin Film Microstructure and Interface Analysis

2007 ◽  
Vol 32 (1) ◽  
pp. 275-280
Author(s):  
Hiroshi Okuda ◽  
Shojiro Ochiai ◽  
M. Ohtaka ◽  
Tetsu Ichitubo ◽  
Ei-ichiro Matsubara, ◽  
...  
Keyword(s):  
Thin Film ◽  
Small Angle ◽  
Grazing Incidence ◽  
Small Angle Scattering ◽  
Interface Analysis ◽  
Angle Scattering ◽  
Film Microstructure
Sign in / Sign up

Export Citation Format

Share Document