The Use of Energy Loss Structures in XPS Characterisation of Surfaces

1985 ◽  
Vol 48 ◽  
Author(s):  
J. E. Castle ◽  
I. Abu-Talib ◽  
S. A. Richardson
Keyword(s):  
Energy Loss ◽  
Aqueous Media ◽  
Mean Free Path ◽  
Organic Films ◽  
Surface Distribution ◽  
Near Surface ◽  
Fitting Procedure ◽  
Peak Fitting ◽  
Distribution Of Elements ◽  
Composite Peak

ABSTRACTThis paper describes advances in the use of the energy loss background associated with individual photoelectron peaks. The subtraction of a Shirley-type background is now normal practice in quantitative XPS analysis. However, in the case of a composite peak containing features from differing depths the subtraction of a common background has a clear disadvantage: i.e. the proportion of background rise associated with each component should be different but is, in fact, fixed. A peak-fitting procedure is described which enables individual backgrounds to be used for each component. The method has been tested using evaporated overlayers and this enables a mean free path for electrons undergoing small energy losses (less than 10 eV) to be determined. The findings are in accord with those of Tougaard and Sigmund and suggest that the use of background intensities in conjunction with the peaks themselves enables the information depth of XPS to be extended by about 10%. A few observations on the behaviour and use in analysis of the large energy loss structure are made.The use of the findings to aid in characterisation of the near surface distribution of elements and ions is described for the following systems: the distribution within oxide films on alloys; the locus of disbondment of organic films on metals; and the surface contamination of surfaces removed from aqueous media.

Comparison of Calculated and Recorded Electron Energy-Loss Spectra of Aluminium and Carbon

1990 ◽  
Vol 48 (2) ◽  
pp. 64-65
Author(s):  
L. Reimer ◽  
R. Oelgeklaus
Keyword(s):  
Fourier Transform ◽  
Energy Loss ◽  
Electron Energy ◽  
Rotational Symmetry ◽  
Mean Free Path ◽  
Single Scattering ◽  
Specimen Thickness ◽  
Two Dimensional ◽  
Image Position ◽  
Electron Energy Loss

Quantitative electron energy-loss spectroscopy (EELS) needs a correction for the limited collection aperture α and a deconvolution of recorded spectra for eliminating the influence of multiple inelastic scattering. Reversely, it is of interest to calculate the influence of multiple scattering on EELS. The distribution f(w,θ,z) of scattered electrons as a function of energy loss w, scattering angle θ and reduced specimen thickness z=t/Λ (Λ=total mean-free-path) can either be recorded by angular-resolved EELS or calculated by a convolution of a normalized single-scattering function ϕ(w,θ). For rotational symmetry in angle (amorphous or polycrystalline specimens) this can be realised by the following sequence of operations :(1)where the two-dimensional distribution in angle is reduced to a one-dimensional function by a projection P, T is a two-dimensional Fourier transform in angle θ and energy loss w and the exponent -1 indicates a deprojection and inverse Fourier transform, respectively.

Local thickness determination by Electron Energy Loss Spectroscopy

1994 ◽  
Vol 52 ◽  
pp. 944-945
Author(s):  
Suichu Luo ◽  
John R. Dunlap ◽  
Richard W. Williams ◽  
David C. Joy
Keyword(s):  
Energy Loss ◽  
Analytical Electron Microscopy ◽  
Mean Free Path ◽  
Single Scattering ◽  
Specimen Thickness ◽  
Three Dimension ◽  
Angular Correction ◽  
Electron Intensity ◽  
Image Position ◽  
Inelastic Mean Free Path

In analytical electron microscopy, it is often important to know the local thickness of a sample. The conventional method used for measuring specimen thickness by EELS is:where t is the specimen thickness, λi is the total inelastic mean free path, IT is the total intensity in an EEL spectrum, and I0 is the zero loss peak intensity. This is rigorouslycorrect only if the electrons are collected over all scattering angles and all energy losses. However, in most experiments only a fraction of the scattered electrons are collected due to a limited collection semi-angle. To overcome this problem we present a method based on three-dimension Poisson statistics, which takes into account both the inelastic and elastic mixed angular correction.The three-dimension Poisson formula is given by:where I is the unscattered electron intensity; t is the sample thickness; λi and λe are the inelastic and elastic scattering mean free paths; Si (θ) and Se(θ) are normalized single inelastic and elastic angular scattering distributions respectively ; F(E) is the single scattering normalized energy loss distribution; D(E,θ) is the plural scattering distribution,

Monte Carlo Modelling of Secondary Electron Yield from Rough Surfaces

1990 ◽  
Vol 48 (1) ◽  
pp. 422-423
Author(s):  
John C. Russ
Keyword(s):  
Monte Carlo ◽  
Energy Loss ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Analytical Calculation ◽  
Mean Free Path ◽  
Single Scattering ◽  
High Energy ◽  
Secondary Electron Yield ◽  
Electron Yield

Monte-Carlo programs are well recognized for their ability to model electron beam interactions with samples, and to incorporate boundary conditions such as compositional or surface variations which are difficult to handle analytically. This success has been especially powerful for modelling X-ray emission and the backscattering of high energy electrons. Secondary electron emission has proven to be somewhat more difficult, since the diffusion of the generated secondaries to the surface is strongly geometry dependent, and requires analytical calculations as well as material parameters. Modelling of secondary electron yield within a Monte-Carlo framework has been done using multiple scattering programs, but is not readily adapted to the moderately complex geometries associated with samples such as microelectronic devices, etc.This paper reports results using a different approach in which simplifying assumptions are made to permit direct and easy estimation of the secondary electron signal from samples of arbitrary complexity. The single-scattering program which performs the basic Monte-Carlo simulation (and is also used for backscattered electron and EBIC simulation) allows multiple regions to be defined within the sample, each with boundaries formed by a polygon of any number of sides. Each region may be given any elemental composition in atomic percent. In addition to the regions comprising the primary structure of the sample, a series of thin regions are defined along the surface(s) in which the total energy loss of the primary electrons is summed. This energy loss is assumed to be proportional to the generated secondary electron signal which would be emitted from the sample. The only adjustable variable is the thickness of the region, which plays the same role as the mean free path of the secondary electrons in an analytical calculation. This is treated as an empirical factor, similar in many respects to the λ and ε parameters in the Joy model.

Probing of near surface semiconductor layers by electron energy loss spectroscopy

1990 ◽  
Vol 54-55 ◽  
pp. 1163-1172 ◽  
Author(s):  
T.S. Jones ◽  
M.Q. Ding ◽  
N.V. Richardson ◽  
C.F. McConville ◽  
M.O. Schweitzer
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Near Surface ◽  
Electron Energy Loss

scholarly journals Advanced test of the model stellar atmospheres: the nature of the light variability of magnetic chemically peculiar stars

2008 ◽  
Vol 4 (S252) ◽  
pp. 347-348
Author(s):  
J. Krtička ◽  
Z. Mikulášek ◽  
J. Zverko ◽  
J. Žižňovský ◽  
P. Zvěřina
Keyword(s):  
Chemical Elements ◽  
Horizontal Distribution ◽  
Stellar Atmospheres ◽  
Silicon Iron ◽  
Surface Distribution ◽  
Chemically Peculiar ◽  
Peculiar Stars ◽  
Distribution Of Elements ◽  
Chemically Peculiar Stars ◽  
Light Variability

AbstractThe magnetic chemically peculiar stars exhibit both inhomogeneous horizontal distribution of chemical elements on their surfaces and the light variability. We show that the observed light variability of these stars can be successfully simulated using models of their stellar atmospheres and adopting the observed surface distribution of elements. The most important elements that influence the light variability are silicon, iron, and helium.

THE COLLIDING PARTICLES MASS RATIO INFLUENCE ON PECULIARITIES OF LOW-ENERGY ION NEAR-SURFACE IMPLANTATION AT CHANNELING CONDITIONS

2018 ◽  
Vol 20 (4) ◽  
pp. 265-274
Author(s):  
F.F. Umarov ◽  
A.M. Rasulov ◽  
A.A. Dzhurakhalov
Keyword(s):  
Energy Loss ◽  
Normal Incidence ◽  
Binary Collision ◽  
Low Energy ◽  
Main Peak ◽  
Mass Ratio ◽  
Near Surface ◽  
Collision Approximation ◽  
Thin Crystal ◽  
Depth Distributions

In the present work the peculiarities of ion implantation and colliding particles mass ratio influence on the ranges, energy loss and profiles of distribution for 1−5 keV P+ ions channelling in Si(110) and SiC(110) at normal incidence, and 1 keV Be+ and Se+ ions in GaAs(100), as well as 5 keV Ar+ and Kr+ on Cu(001) surface at glancing incidence are carried out by computer simulation in binary collision approximation. It is shown that for paraxial part of a beam the main contribution to the total energy loss comes from inelastic ones. It has been established that the energy loss of ions transmitted through thin crystal and depth profile distributions depend on width of the channel and mass ratio of colliding atoms. It was shown that at grazing surface channeling conditions the main peak of the implanted depth distributions is considerably shallow, the range for Se+ ions is shallower and the half-width of profile for these ions is narrow than that for Be+ ions. The results allow one to select the optimum for implanted depth distributions with demanded shape at narrow near-surface area of crystals obtaining.

Planetary aerosol electrification: Lessons learned from a terrestrial analogy for Venus

2021 ◽  
Author(s):  
Amethyst Johnson ◽  
Karen Aplin
Keyword(s):  
Atmospheric Stability ◽  
Ionic Mobility ◽  
Mean Free Path ◽  
Lessons Learned ◽  
Lower Atmosphere ◽  
Aerosol Layer ◽  
Electrical Measurements ◽  
Near Surface ◽  
Charged Aerosol ◽  
The Mean

<p>Planetary atmospheric electrification has the potential to damage spacecraft, yet for planets with thick, deep atmospheres such as Venus, the level of electrification remains open to interpretation. Partly due to the difficulty of access and potential hostility to spacecraft, there are limited in-situ observations of deep atmospheres, making terrestrial analogies attractive. One proposed explanation of the observations of near-surface electrification on Venus from sensors on Venera 13 & 14 is a haze of charged aerosol. As the Sahara is an environment with lofted dust that is potentially similar to Venus in terms of atmospheric stability, a simple model was developed estimating a mean aerosol charge based on typical Saharan haze aerosol distributions. Spacecraft surface area and descent speeds were used to estimate the accumulated charge and discharge current measured by the Venera missions, but this model underestimated Venera's electrical measurements by three orders of magnitude. This suggests that an aerosol layer alone cannot explain the charge apparently present in the lower atmosphere of Venus. The simple terrestrial analogy employed may not have been suitable due to the modified pressure and temperature profile affecting the mean free path, ionic mobility and consequently the mean charge. Discrepancies in atmospheric stability and wind patterns must also be evaluated, as the effect of terrestrial wind on aerosol distributions may not be directly applicable to other planets. More detailed calculations of ion-aerosol attachment and re-evaluation of the terrestrial analogy may be able to resolve some these issues, but it looks likely that additional significant sources of charge are required to explain the Venera observations. Triboelectric charging of lofted surface material could exceed charging observed in terrestrial situations, or some unknown atmospheric or non-atmospheric source of charge could have contributed to the Venera electrical measurements. </p>

scholarly journals Doppler Images of Rapidly Rotating Ap Stars

1988 ◽  
Vol 132 ◽  
pp. 199-204
Author(s):  
Artie P. Hatzes
Keyword(s):  
Magnetic Field ◽  
Magnetic Fields ◽  
Stellar Surface ◽  
Surface Distribution ◽  
Distribution Of Elements ◽  
Local Equivalent ◽  
Field Geometry ◽  
A New Technique ◽  
Ap Stars

The magnetic Ap stars are characterized by the presence of large magnetic fields which undergo periodic variations. These magnetic field variations are accompanied by spectral variations caused by the inhomogeneous distribution of elements on the stellar surface. It is believed that the magnetic field plays an important role in determining this distribution. Accurate maps of the surface distribution of elements would provide valuable probes as to the field geometry as well as provide clues to the role of the magnetic fields in the atmospheres of these stars. We have developed a new technique for mapping the local equivalent width on a stellar surface from the observed spectral line variations.

Hydroacoustical Survey of Near-Surface Distribution, Abundance and Biomass of Small Pelagic Fish in the Gulf of California

2012 ◽  
Vol 66 (3) ◽  
pp. 311-326 ◽  
Author(s):  
José Francisco Domínguez-Contreras ◽  
Carlos J. Robinson ◽  
Jaime Gómez-Gutiérrez
Keyword(s):  
Gulf Of California ◽  
Pelagic Fish ◽  
Small Pelagic Fish ◽  
Surface Distribution ◽  
Near Surface
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