Electron Microscopy Studies of the High Temperature Oxidation Behavior of NiAl

1996 ◽  
Vol 466 ◽  
Author(s):  
J. C. Yang ◽  
E. Schumann ◽  
I. Levin ◽  
H. Muellejans ◽  
M. Ruhle
Keyword(s):  
Electron Microscopy ◽  
Energy Loss ◽  
Electron Energy ◽  
High Resolution Electron Microscopy ◽  
Temperature Oxidation ◽  
Lattice Matching ◽  
Transmission Electron ◽  
Resolution Electron ◽  
High Temperature Oxidation Behavior ◽  
Electron Energy Loss

ABSTRACTThe transient oxidation stage of single crystal (001)NiAl was investigated using scanning electron microscopy, transmission electron microscopy, electron diffraction, high resolution electron microscopy and electron energy loss spectroscopy (EELS). (001)NiAl was oxidized in air at 950°C in order to produce transient forms of alumina on the surface. After oxidation, an oxide scale with plate-like surface morphology formed. We found that the main transient alumina polymorph is γ-Al2O3. The platelets which formed on the surface of the oxide are most likely α-A12O3, not θ-Al2O3. Randomly-oriented α-Al2O3 grains were observed at the oxide/metal interface. The NiAl/γ-Al2O3 interfaces were examined with EELS. From the changes observed in the electron energy loss spectra, the interfacial terminating plane is determined. Lattice matching arguments are given to explain why these terminating planes are energetically favorable.

Carbon Onion Films-Molecular Interactions of Multi-Layer Fullerenes

2009 ◽  
Vol 1204 ◽  
Author(s):  
Raed A. Alduhaileb ◽  
Virginia M. Ayres ◽  
Benjamin W. Jacobs ◽  
Xudong Fan ◽  
Kaylee McElroy ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Energy Loss ◽  
Electron Energy ◽  
High Resolution Electron Microscopy ◽  
Synthesis Temperature ◽  
Carbon Onion ◽  
Resolution Electron ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra ◽  
Scanning Electron

AbstractThe evolution of carbon onion structure from spherical to polyhedral is correlated with changes in the sp3/sp2 ratio as a function of increasing synthesis temperature using electron energy loss spectroscopy, scanning electron microscopy, and high resolution electron microscopy. Results that are obtained using asymmetric f-variance versus symmetric Gaussian deconvolution of electron energy loss spectra are compared. The possibility of a separate peak at 287 eV is discussed.

Nanoscale analysis of a Co-SrTiO3 interface in a Magnetic tunnel junction

2002 ◽  
Vol 746 ◽  
Author(s):  
J.-L. Maurice ◽  
F. Pailloux ◽  
D. Imhoff ◽  
J.-P. Contour ◽  
A. Barthélémy ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Tunnel Junction ◽  
Electron Energy Loss Spectroscopy ◽  
Magnetic Tunnel Junction ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron ◽  
Electron Energy Loss

ABSTRACTWe use High Resolution Electron Microscopy together with Electron Energy Loss Spectroscopy to analyze the crystallography and the chemical configuration of a Co/SrTiO3 interface in a Co/SrTiO3/La2/3Sr1/3MnO3 magnetic tunnel junction.PACS: 75.47.-m, 75.70.Cn, 68.37.Lp, 79.20.Uv

Investigation of Switching Mechanism in HfO2-Based Oxide Resistive Memories by In-Situ Transmission Electron Microscopy and Electron Energy Loss Spectroscopy

2017 ◽  
Author(s):  
T. Dewolf ◽  
D. Cooper ◽  
N. Bernier ◽  
V. Delaye ◽  
A. Grenier ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Hafnium Dioxide ◽  
Switching Mechanism ◽  
Transmission Electron ◽  
Electron Energy Loss

Abstract Forming and breaking a nanometer-sized conductive area are commonly accepted as the physical phenomenon involved in the switching mechanism of oxide resistive random access memories (OxRRAM). This study investigates a state-of-the-art OxRRAM device by in-situ transmission electron microscopy (TEM). Combining high spatial resolution obtained with a very small probe scanned over the area of interest of the sample and chemical analyses with electron energy loss spectroscopy, the local chemical state of the device can be compared before and after applying an electrical bias. This in-situ approach allows simultaneous TEM observation and memory cell operation. After the in-situ forming, a filamentary migration of titanium within the dielectric hafnium dioxide layer has been evidenced. This migration may be at the origin of the conductive path responsible for the low and high resistive states of the memory.

Electron Energy-Loss Spectroscopy (EELS) of Fe-Bearing Olivine and Laihunite (an Oxidized Olivine)

2000 ◽  
Vol 6 (S2) ◽  
pp. 208-209
Author(s):  
Huifang Xu ◽  
Pingqiu Fu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Structure Refinement ◽  
Iron Formation ◽  
Transmission Electron ◽  
Electron Energy Loss

Laihunite that has distorted olivine-type structure with ferric and ferrous irons and ordered distribution of vacancies was first discovered in a high-grade metamorphosed banded iron formation (BIF) [1, 2]. The laihunite coexisting with fayalite (Fe-olivine), magnetite, quartz, ferrosilite, garnet and hedenbergite, formed in the process of oxidation of fayalite [2, 3]. The structure refinement of 1-layer laihunite shows P21/b symmetry and ordered distribution of vacancies in half M1 sites of olivine structure [2, 3]. Early high-resolution transmission electron microscopy (HRTEM) study and HRTEM image simulation of the 1-layer laihunite verified the structure refinement [4].Specimens of weakly oxidized fayalite and laihunite containing fayalite islands collected from Xiaolaihe and Menjiagou of Liaoning Province, NE China, have been studied using selected area electron diffraction (SAED), high-resolution transmission electron microscopy (HRTEM), electron energy-loss spectroscopy (EELS), and X-ray energy-dispersive spectroscopy.

Sign in / Sign up

Export Citation Format

Share Document