Imaging Complex Fluids Under Confinement and Flow: Development of Bragg-Fresnel Optics for X-ray Microdiffraction

1996 ◽  
Vol 464 ◽  
Author(s):  
Youli Li ◽  
Stefan H.J. Idziak ◽  
Ernie Caine ◽  
G. Subramanian ◽  
Evelyn Hu ◽  
...  
Keyword(s):  
Complex Fluids ◽  
Incident Beam ◽  
Surface Force ◽  
Spot Size ◽  
Partial Coherence ◽  
Structural Studies ◽  
Process Technology ◽  
X Ray ◽  
Glass Substrates

ABSTRACTWe present results of simultaneous efforts to develop: 1.) Bragg-Fresnel Optics(BFO) to be used in X-ray microdiffraction methods, in particular as applied to structural studies of complex fluids and biomaterials under confinement and flow conditions; and 2.) Methodologies for confining complex fluids and biomaterials for in-situ structural studies. Using microelectronics process technology, we have fabricated linear and circular Bragg-Fresnel Lenses (BFL) in Si and III-V compound semiconductor substrates such as InP, GaAs and GaAs heterostructures with outermost zone width to 0.25 μm. X-ray characterization of linear BFLs were performed on a wiggler beamline at Stanford Synchrotron Radiation Laboratory (SSRL) at x-ray energies of 8 keV and 16 keV. A ∼5 μm focal spot size was obtained with a 50 μm incident beam, which was determined by the partial coherence of the source. On the confinement techniques, we have developed the X-ray Surface Force Apparatus (XSFA) which allows in-situ x-ray diffraction measurements to be made on fluid thin films confined between two atomically smooth surfaces. A new approach is being pursued to study the effects of confinement and flow on complex fluids and biological materials using microchannels fabricated on glass substrates.

scholarly journals Broadband X-ray ptychography using multi-wavelength algorithm

2021 ◽  
Vol 28 (1) ◽  
pp. 309-317
Author(s):  
Yudong Yao ◽  
Yi Jiang ◽  
Jeffrey Klug ◽  
Youssef Nashed ◽  
Christian Roehrig ◽  
...  
Keyword(s):  
High Resolution ◽  
Mixed State ◽  
Size Variation ◽  
Incident Beam ◽  
Spot Size ◽  
Partial Coherence ◽  
Step Size ◽  
X Ray ◽  
High Efficient ◽  
Multi Wavelength

Ptychography is a rapidly developing scanning microscopy which is able to view the internal structures of samples at a high resolution beyond the illumination size. The achieved spatial resolution is theoretically dose-limited. A broadband source can provide much higher flux compared with a monochromatic source; however, it conflicts with the necessary coherence requirements of this coherent diffraction imaging technique. In this paper, a multi-wavelength reconstruction algorithm has been developed to deal with the broad bandwidth in ptychography. Compared with the latest development of mixed-state reconstruction approach, this multi-wavelength approach is more accurate in the physical model, and also considers the spot size variation as a function of energy due to the chromatic focusing optics. Therefore, this method has been proved in both simulation and experiment to significantly improve the reconstruction when the source bandwidth, illumination size and scan step size increase. It is worth mentioning that the accurate and detailed information of the energy spectrum for the incident beam is not required in advance for the proposed method. Further, we combine multi-wavelength and mixed-state approaches to jointly solve temporal and spatial partial coherence in ptychography so that it can handle various disadvantageous experimental effects. The significant relaxation in coherence requirements by our approaches allows the use of high-flux broadband X-ray sources for high-efficient and high-resolution ptychographic imaging.

Structural Studies on the Effects of ZrO[sub 2] Coating on LiCoO[sub 2] during Cycling Using In Situ X-Ray Diffraction Technique

2006 ◽  
Vol 153 (11) ◽  
pp. A2152 ◽  
Author(s):  
Kyung Yoon Chung ◽  
Won-Sub Yoon ◽  
James McBreen ◽  
Xiao-Qing Yang ◽  
Si Hyoung Oh ◽  
...  
Keyword(s):  
Structural Studies ◽  
X Ray Diffraction ◽  
X Ray

X-Ray Absorption Spectroscopy as an in-situ Tool in Materials Science

1997 ◽  
Vol 502 ◽  
Author(s):  
T. Ressler ◽  
Joe Wong ◽  
W. Metz
Keyword(s):  
Absorption Spectroscopy ◽  
Materials Science ◽  
Ex Situ ◽  
Structural Studies ◽  
Time Resolved ◽  
X Ray ◽  
Complementary Techniques ◽  
X Ray Absorption ◽  
Established Technique

ABSTRACTIn addition to being an established technique for ex-situ structural studies, x-ray absorption spectroscopy (XAS) has recently been realized to be a powerful tool for in-situ time-resolved investigations in materials science. This paper describes two complementary techniques: quick-scanning EXAFS (QEXAFS) and energy-dispersive XAS (DXAS) which offer time resolution in the seconds and milliseconds range, respectively. Formation of a heterogeneous catalyst from a solid-state reaction of a precursor is presented as an example of a time-resolved XAS application.

Statistical measures of spottiness in diffraction rings

2013 ◽  
Vol 47 (1) ◽  
pp. 166-172 ◽  
Author(s):  
Bridget Ingham
Keyword(s):  
Carbon Dioxide ◽  
Size Distribution ◽  
Intensity Variation ◽  
Incident Beam ◽  
Mean Square ◽  
X Ray Diffraction ◽  
X Ray ◽  
Statistical Measures ◽  
Diffraction Patterns

Spotty diffraction rings arise when the size distribution of crystallites illuminated by the incident beam includes crystallites that are large compared with the size of the beam. In this article, several statistical measures are used in conjunction to quantify spottiness and relate it to a crystallite size distribution: the number of peaks, the normalized root mean square intensity variation and the fractal dimension. These are demonstrated by way of example using synchrotron X-ray diffraction patterns collected duringin situcorrosion of mild steel in carbon dioxide-saturated aqueous brine.

scholarly journals Development of a soft X-ray angle-resolved photoemission system applicable to 100 µm crystals

2011 ◽  
Vol 18 (6) ◽  
pp. 879-884 ◽  
Author(s):  
Takayuki Muro ◽  
Yukako Kato ◽  
Tomohiro Matsushita ◽  
Toyohiko Kinoshita ◽  
Yoshio Watanabe ◽  
...  
Keyword(s):  
Electronic States ◽  
Spot Size ◽  
Optical Microscope ◽  
Photoemission Spectroscopy ◽  
Beam Spot ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy ◽  
Clear Band ◽  
Sample Position

A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleavedin situwith a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ–Xdirection reflecting the bulk electronic states were observed with a photon energy of 879 eV.

Microbeam x-ray diffraction and its applications in the semiconductor industry

1992 ◽  
Vol 50 (2) ◽  
pp. 1760-1761
Author(s):  
Patrick W. DeHaven
Keyword(s):  
Driving Forces ◽  
Semiconductor Industry ◽  
Incident Beam ◽  
Spot Size ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Small Areas ◽  
Average Grain Size ◽  
On Chip

X-ray diffraction(XRD) from polycrystalline materials is a powerful structural probe, capable of obtaining information on phase(s), crystallite orientation, average grain size, and residual stress. One problem in the application of XRD to the analysis of semiconductor chips and multi-chip carriers is that there is often the need to obtain information from individual features, which can range in size from several hundred microns on chip carriers to sub-micron on semiconductor devices. Conventional powder diffractometers are designed to irradiate an area of several square millimeters, and cannot be used to examine individual micron-sized features. This need to obtain diffraction information from very small areas has been one of the driving forces behind the development of x-ray microbeam diffraction.The design of a microdiffractometer involves modification of the incident x-ray beam, the sample holder, and the x-ray detector. The incident beam must be focused down to a spot size consistent with the feature to be examined.

An easy to use X-ray collimator for Mao-Bell type diamond anvil cell

2006 ◽  
Vol 21 (4) ◽  
pp. 320-322 ◽  
Author(s):  
P. Ch. Sahu ◽  
N. R. Sanjay Kumar ◽  
N. V. Chandra Shekar ◽  
N. Subramanian
Keyword(s):  
High Pressure ◽  
Diamond Anvil Cell ◽  
Radiation Safety ◽  
Incident Beam ◽  
X Ray Diffraction ◽  
X Ray ◽  
Safety Requirements ◽  
Diamond Anvil ◽  
Special Precaution

An incident beam X-ray collimator for Mao-Bell type diamond anvil cell (DAC) has been developed. Alignment of the collimator is carried out in situ while viewing the image of the collimated X-ray spot formed on a thin layer of fluorescent material spread on the diamond anvil culets with the help of a microscope. Special precaution has been taken to meet the radiation safety requirements during alignment and routine use. This collimator is of immense help for laboratory based high pressure X-ray diffraction experiments.

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