The Martensitic Transformation and Extra Reflections Appearing Prior to the Transformation in AuCd Alloy

1996 ◽  
Vol 459 ◽  
Author(s):  
T. Ohba ◽  
K. Otsuka
Keyword(s):  
Martensitic Transformation ◽  
Synchrotron Radiation ◽  
Experimental Error ◽  
Parent Phase ◽  
Phonon Softening ◽  
X Ray ◽  
X Ray Scattering ◽  
Structure Factors ◽  
Small Crystals ◽  
Crystal Structural

ABSTRACTAuCd alloy is a typical martensitic alloy. The crystal structural of the ζ2' (trogonal) martensite was recently determined and the analysis indicated the possibility of phonon softening. Despite a large absorption coefficient of Cd phonon softening was actually observed by using an isotope 114Cd. In the present study, precise x-ray scattering studies were performed with a rotating anode x-ray source and synchrotron radiation at Photon Factory in KEK, using small crystals. The structure factors of the parent phase and the diffraction profiles along <110> direction were measured with four circle diffractometers. The structure factors decrease when approaching the transformation temperature. Superstructure reflections were observed prior to the onset of the transformation. They are very weak and rather sharp and appear at q = (1/3,1/3,0) within the experimental error, i. e. at the commensurate position.

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

scholarly journals Static Atomic Displacements in Crystalline Solid Solution Alloys

1996 ◽  
Vol 437 ◽  
Author(s):  
Gene Ice ◽  
Cullie Sparks ◽  
J. Lee Robertson ◽  
J. Ernest Epperson ◽  
Xiaogang Jiang
Keyword(s):  
Synchrotron Radiation ◽  
Crystalline Solid ◽  
Local Order ◽  
Chemical Order ◽  
X Ray ◽  
Atomic Displacements ◽  
X Ray Scattering ◽  
New Information ◽  
Z Contrast

AbstractAtom size differences induce static displacements from an average alloy lattice and play an important role in controlling alloy phase stability and properties. The details of this role however, are difficult to study; chemical order and displacements are strongly interrelated and static displacements are hard to measure. Diffuse x-ray scattering measurements with tunable-synchrotron radiation can now measure element-specific static displacements with an accuracy of ± 0.1 pm and can simultaneously measure local chemical order out to 20 shells or more. Ideal alloys for diffuse scattering analysis with synchrotron radiation, are those that have previously been the most intractable: alloys with small Z contrast, alloys with only local order and alloys with small size differences. The combination of precise characterization of local chemical order and precise measurement of static displacement provides new information that challenges existing alloy models. We report on an ongoing systematic study of static displacements in the Fe/Ni/Cr alloys and compare the observed static displacements to the static displacements predicted by current theories. The availability of more brilliant 3rd generation hard x-ray sources will greatly enhance these measurements.

Diffuse x-ray scattering from InGaAs/GaAs quantum dots

2003 ◽  
Vol 799 ◽  
Author(s):  
Rolf Köhler ◽  
Daniil Grigoriev ◽  
Michael Hanke ◽  
Martin Schmidbauer ◽  
Peter Schäfer ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Synchrotron Radiation ◽  
Diffuse Scattering ◽  
Data Evaluation ◽  
X Ray ◽  
X Ray Scattering ◽  
Gaas Matrix ◽  
Wetting Layers ◽  
Ray Scattering

ABSTRACTMulti-fold stacks of In0.6Ga0.4As quantum dots embedded into a GaAs matrix were investigated by means of x-ray diffuse scattering. The measurements were done with synchrotron radiation using different diffraction geometries. Data evaluation was based on comparison with simulated distributions of x-ray diffuse scattering. For the samples under consideration ((001) surface) there is no difference in dot extension along [110] and [-110] and no directional ordering. The measurements easily allow the determination of the average indium amount in the wetting layers. Data evaluation by simulation of x-ray diffuse scattering gives an increase of Incontent from the dot bottom to the dot top.

FitGISAXS: software package for modelling and analysis of GISAXS data using IGOR Pro

2010 ◽  
Vol 43 (4) ◽  
pp. 929-936 ◽  
Author(s):  
David Babonneau
Keyword(s):  
Software Package ◽  
Form Factors ◽  
Grazing Incidence ◽  
Three Dimensions ◽  
Scattering Data ◽  
Stratified Medium ◽  
X Ray ◽  
X Ray Scattering ◽  
Structure Factors ◽  
Scripting Language

A software package for performing modelling and analysis of GISAXS (grazing-incidence small-angle X-ray scattering) data within the distorted-wave Born approximation has been developed using the IGOR Pro scripting language (http://www.wavemetrics.com). The tool suite uses a slab-model approach with the Abélès matrix method to calculate X-ray reflectivity curves, electric field intensity distributions and GISAXS intensities from supported or buried scatterers arranged in two or three dimensions in a stratified medium. Models are included to calculate the scattered intensity for monodisperse, polydisperse and interacting particles with various size distributions, form factors and structure factors. The source code for the entire package is freely available, allowing anyone to develop additional tools.

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