Atomic Force Probe of Mesoscopic Dielectric and Viscoelastic Fluctuations Near the Glass Transition

1996 ◽  
Vol 455 ◽  
Author(s):  
L. E. Walther ◽  
N. E. Israeloff
Keyword(s):  
Glass Transition ◽  
Viscoelastic Properties ◽  
Variable Temperature ◽  
Force Microscopy ◽  
Glass Forming ◽  
Atomic Force ◽  
Large Fluctuations ◽  
Modulation Techniques ◽  
First Results ◽  
Piezoresistive Cantilevers

ABSTRACTWe report a new experimental approach to study the glass transition and glassy dynamics on a mesoscopic scale. Non contact atomic force microscopy is employed to measure dielectric fluctuations of glass forming polymers such as PVAc. Force modulation techniques, performed with the same instrument, allow us to study viscoelastic properties. A custom-built variable temperature UHV AFM with exceptional thermal stability utilizing piezoresistive cantilevers was used. First results on PVAc include large fluctuations of the viscoelastic properties as a function of applied stress below the glass transition.

Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode

2018 ◽  
Vol 184 ◽  
pp. 199-208 ◽  
Author(s):  
P. Biczysko ◽  
A. Dzierka ◽  
G. Jóźwiak ◽  
M. Rudek ◽  
T. Gotszalk ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Load Force ◽  
Force Microscopy ◽  
Force Modulation ◽  
Atomic Force ◽  
Modulation Mode ◽  
Piezoresistive Cantilevers

scholarly journals Nucleation and Growth of Supported Metal Clusters at Defect Sites on Mgo and NaCl (001) Surfaces: The Cases of Pd and Ag

1999 ◽  
Vol 570 ◽  
Author(s):  
J. A. Venables ◽  
G. Haas ◽  
H. Brune ◽  
J.H. Harding
Keyword(s):  
Deposition Temperature ◽  
Metal Clusters ◽  
Variable Temperature ◽  
Nucleation And Growth ◽  
Force Microscopy ◽  
Atomic Force ◽  
Defect Sites ◽  
Wide Range ◽  
Adsorption Surface

ABSTRACTNucleation and growth of metal clusters at defect sites is discussed in terms of rate equation models, which are applied to the cases of Pd and Ag on MgO(001) and NaCl(001) surfaces. Pd/MgO has been studied experimentally by variable temperature atomic force microscopy (AFM). The island density of Pd on Ar-cleaved surfaces was determined in-situ by AFM for a wide range of deposition temperature and flux, and stays constant over a remarkably wide range of parameters; for a particular flux, this plateau extends from 200 K ≤ T ≤ 600 K, but at higher temperatures the density decreases. The range of energies for defect trapping, adsorption, surface diffusion and pair binding are deduced, and compared with earlier data for Ag on NaCl, and with recent calculations for these metals on both NaCl and MgO

scholarly journals 3P-311 Viscoelastic Properties of Many Living Cells Investigated by Atomic Force Microscopy(The 46th Annual Meeting of the Biophysical Society of Japan)

2008 ◽  
Vol 48 (supplement) ◽  
pp. S175
Author(s):  
Shinichiro Hiratsuka ◽  
Yusuke Mizutani ◽  
Masahiro Tsuchiya ◽  
Koichi Kawahara ◽  
Hiroshi Tokumoto ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Annual Meeting ◽  
Viscoelastic Properties ◽  
Living Cells ◽  
Force Microscopy ◽  
Atomic Force ◽  
Biophysical Society

Viscoelastic properties of doxorubicin-treated HT-29 cancer cells by atomic force microscopy: the fractional Zener model as an optimal viscoelastic model for cells

2019 ◽  
Vol 19 (3) ◽  
pp. 801-813 ◽  
Author(s):  
Maricela Rodríguez-Nieto ◽  
Priscila Mendoza-Flores ◽  
David García-Ortiz ◽  
Luis M. Montes-de-Oca ◽  
Marco Mendoza-Villa ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cancer Cells ◽  
Viscoelastic Properties ◽  
Viscoelastic Model ◽  
Zener Model ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fractional Zener Model ◽  
Ht 29

Multi-Frequency Atomic Force Microscopy Combining Amplitude- and Frequency-Modulation Techniques

2012 ◽  
Vol 1422 ◽  
Author(s):  
Santiago D. Solares ◽  
Gaurav Chawla
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Complementary Information ◽  
Control Loops ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Of Operation ◽  
Modulation Techniques ◽  
Different Response ◽  
Amplitude And Frequency Modulation

ABSTRACTMulti-frequency atomic force microscopy (AFM) offers additional response signals in comparison to traditional dynamic AFM. Furthermore, depending on the mode of operation used, the higher eigenmode responses are generally not directly influenced by the topographical acquisition control loops, such that they can explore a fuller range of tip-sample interactions. In this work we describe the implementation of multi-frequency imaging schemes that enable the acquisition of topographical, phase and frequency shift contrast in tapping-mode operation. This type of characterization can be especially useful for soft, highly dissipative samples, such as polymers, for which the various response channels can exhibit significantly different response, thus providing complementary information. We discuss typical results obtained as well as important challenges that need to be addressed in order to develop a fully quantitative technique.

scholarly journals Viscoelastic properties of cells: Modeling and identification by atomic force microscopy

Mechatronics ◽  
2018 ◽  
Vol 50 ◽  
pp. 271-281 ◽  
Author(s):  
Michael R.P. Ragazzon ◽  
J. Tommy Gravdahl ◽  
Marialena Vagia
Keyword(s):  
Atomic Force Microscopy ◽  
Viscoelastic Properties ◽  
Force Microscopy ◽  
Atomic Force

A Plate-Like Sensor for the Identification of Sample Viscoelastic Properties Using Contact Resonance Atomic Force Microscopy

2021 ◽  
pp. 1-9
Author(s):  
Matteo Aureli ◽  
Ryan Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Viscoelastic Properties ◽  
Ritz Method ◽  
Theoretical Derivation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modal Damping ◽  
Stiffness And Damping ◽  
Data Estimation ◽  
Contact Resonance

Abstract In this paper, we present a new contact resonance atomic force microscopy based method utilizing a square, plate-like microsensor to accurately estimate viscoelastic sample properties. A theoretical derivation, based on Rayleigh-Ritz method and on an “unconventional” generalized eigenvalue problem, is presented and a numerical experiment is devised to verify the method. We present an updated sensitivity criterion that allows users, given a set of measured in-contact eigenfrequencies and modal damping ratios, to select the best eigenfrequency for accurate data estimation. The verification results are then presented and discussed. Results show that the proposed method performs extremely well in the identification of viscoelastic properties over broad ranges of non-dimensional sample stiffness and damping values.

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