Electron-Phonon Scattering in Si-Doped GaN
Keyword(s):
Si Doped
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ABSTRACTPhonon-plasmon scattering in non-resonant Raman spectroscopy is used to determine the free electron concentration in Si doped GaN films. For various doping concentration and variable temperature the correlation with magneto-transport data is established. The freeze-out of the carrier concentration at low temperature is thus observed in a purely optical detection scheme. We observe a very long transient time of several hours for the carrier concentration as a reaction to temperature variation. This indicates an indirect capture and emission process with a very small cross section. The value of the Faust-Henry coefficient is determined.
2015 ◽
Vol 3
(40)
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pp. 10442-10450
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1978 ◽
Vol 39
(C6)
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pp. C6-1052-C6-1053
Keyword(s):
1981 ◽
Vol 42
(C6)
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pp. C6-462-C6-464
2014 ◽
Vol 5
(3)
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pp. 982-992
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