Roughness Characterization by Optical Spectroscopy of CoSi2 Thin Films
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AbstractSpecular and diffuse reflectance and spectroscopic ellipsometry were used to characterize a series of Cosi2 films obtained by heat treatment on a Co/Ti bilayer. The surface quality is strongly affected by etching procedures. The intrinsic optical properties of the CoSi2 film exhibit a small dependence on the growth technique.
2010 ◽
Vol 45
(4)
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pp. 464-473
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2008 ◽
Vol 69
(11)
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pp. 2652-2659
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Effects of alloying on the optical properties of organic–inorganic lead halide perovskite thin films
2016 ◽
Vol 4
(33)
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pp. 7775-7782
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