Roughness Characterization by Optical Spectroscopy of CoSi2 Thin Films

1996 ◽  
Vol 440 ◽  
Author(s):  
S. Bocelli ◽  
G. Guizzetti ◽  
F. Marabelli ◽  
S. Hatziconstantinidou ◽  
C.S. Petersson

AbstractSpecular and diffuse reflectance and spectroscopic ellipsometry were used to characterize a series of Cosi2 films obtained by heat treatment on a Co/Ti bilayer. The surface quality is strongly affected by etching procedures. The intrinsic optical properties of the CoSi2 film exhibit a small dependence on the growth technique.

2008 ◽  
Vol 69 (11) ◽  
pp. 2652-2659 ◽  
Author(s):  
M.M. El-Nahass ◽  
M.B. El-Den ◽  
H.M. El-Mallah ◽  
F.S. Abu-Samaha

2016 ◽  
Vol 4 (33) ◽  
pp. 7775-7782 ◽  
Author(s):  
Paul F. Ndione ◽  
Zhen Li ◽  
Kai Zhu

Spectroscopic ellipsometry analysis of optical transitions and optical constants in hybrid organic–inorganic perovskite alloys.


2020 ◽  
pp. 2050044
Author(s):  
SAHAR MORADI ◽  
HASSAN SEDGHI

Nanostructured Fe:SnO2 thin films were deposited on glass substrates through sol–gel spin coating method. Films were synthesized with different iron quantities including 0%, 4%, 8% and 12% (wt.%). The effects of Fe concentration on optical properties of films were investigated by spectroscopic ellipsometry (SE) technique. SE measured ([Formula: see text]) parameters for films in the wavelength range between 300[Formula: see text]nm to 800[Formula: see text]nm. Optical properties including the refractive index, extinction coefficient, transmittance, dielectric constants and optical conductivity were determined by fitting the SE measured ([Formula: see text]) parameters and data obtained from the optical model-based analysis. Results showed that the transmittance values increase by increment of Fe concentration from 0% to 12%. The bandgap energy ([Formula: see text] of prepared thin films was also calculated. [Formula: see text] values were between 3.44 and 3.58[Formula: see text]eV. Dispersion parameters including the high frequency dielectric constant ([Formula: see text] and the ratio of free carrier concentration to effective mass (N/m[Formula: see text] were then obtained for the prepared films.


2014 ◽  
Vol 571 ◽  
pp. 675-679 ◽  
Author(s):  
C.C. Shen ◽  
C.C. Tseng ◽  
C.T. Lin ◽  
L.J. Li ◽  
H.L. Liu

2008 ◽  
Vol 370 (1) ◽  
pp. 126-131 ◽  
Author(s):  
D. Chvostová ◽  
V. Železný ◽  
L. Pajasová ◽  
D. Šimek ◽  
M. Jelínek ◽  
...  

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