Surface modifications of fullerite induced by pulsed laser irradiation

1995 ◽  
Vol 397 ◽  
Author(s):  
P. Milani ◽  
M. Manfredini
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Pulsed Laser ◽  
Surface Modifications ◽  
Periodic Patterns ◽  
Pulsed Nd:Yag Laser ◽  
Transmission Electron ◽  
Scanning Electron ◽  
Pulsed Laser Irradiation

ABSTRACTThe formation of periodic patterns on fullerite thin film surfaces is observed after irradiation with a pulsed Nd:Yag laser (1064 nm). C60 disruption and subsequent coalescence of the fragments take place, resulting in the formation of carbon nanotubes and polyhedral hollow graphitic particles. The effects of irradiation have been characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Raman scattering.

Transmission electron microscopy and high resolution scanning electron microscopy of Co-Ni-Pt thin film magnetic recording media

1989 ◽  
Vol 47 ◽  
pp. 570-571
Author(s):  
L. Chan ◽  
T. Yamashita ◽  
R. Sinclair
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Hysteresis ◽  
Exchange Interactions ◽  
Magnetic Media ◽  
Transmission Electron ◽  
Hysteresis Properties ◽  
Scanning Electron

In thin film magnetic media, the magnetic hysteresis properties and micromagnetic domain behavior are strongly influenced by both interparticle exchange interactions and by magnetostatic interactions. The exchange interactions are short-range in nature; therefore, they are very sensitive to interparticle separation. Consequently, the magnetic hysteresis properties and the recording behavior of the thin film magnetic media can be drastically altered by the introduction of grain separation during the film deposition process. In this study, thin film media of a CoNiPt alloy of one composition was processed under two different conditions. Transmission electron microscopy (TEM) and high resolution scanning electron microscopy (HRSEM) were used to investigate and explain the difference in magnetic hysteresis characteristics of the films.The structure of the thin film media consisted of a 600 Å thick CoNiPt alloy sputtered on textured 130mm diameter NiP-plated aluminum substrates. A single sputtering parameter was varied to produce two types of films, labelled type I and type II, which exhibited significant differences in their magnetic recording characteristics.

scholarly journals Nanoporous Ge thin film production combining Ge sputtering and dopant implantation

2015 ◽  
Vol 6 ◽  
pp. 336-342 ◽  
Author(s):  
Jacques Perrin Toinin ◽  
Alain Portavoce ◽  
Khalid Hoummada ◽  
Michaël Texier ◽  
Maxime Bertoglio ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Ion Implantation ◽  
High Dose ◽  
Transmission Electron ◽  
Scanning Electron ◽  
Thin Film Production

In this work a novel process allowing for the production of nanoporous Ge thin films is presented. This process uses the combination of two techniques: Ge sputtering on SiO2 and dopant ion implantation. The process entails four successive steps: (i) Ge sputtering on SiO2, (ii) implantation preannealing, (iii) high-dose dopant implantation, and (iv) implantation postannealing. Scanning electron microscopy and transmission electron microscopy were used to characterize the morphology of the Ge film at different process steps under different postannealing conditions. For the same postannealing conditions, the Ge film topology was shown to be similar for different implantation doses and different dopants. However, the film topology can be controlled by adjusting the postannealing conditions.

FABRICATION OF CARBON NANOSTRUCTURES BY LASER ASSISTED CHEMICAL REACTION

NANO ◽  
2006 ◽  
Vol 01 (01) ◽  
pp. 73-76 ◽  
Author(s):  
JONGBOK PARK ◽  
SUNGHO JEONG ◽  
OK HWAN CHA ◽  
MUN SEOK JEONG ◽  
DO-KYEONG KO ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atmospheric Pressure ◽  
Carbon Nanostructures ◽  
Room Temperature ◽  
Simple Method ◽  
Pulsed Nd:Yag Laser ◽  
Transmission Electron ◽  
Scanning Electron

In this work, a simple method is reported for the synthesis of bundles of carbon nanostructures under room temperature and atmospheric pressure. A pulsed Nd:YAG laser (355 nm, 10 Hz) is focused into the mixture of ferrocene and xylene solutions to produce the nanostructures in which ferrocene plays the role of a catalyst while xylene is the carbon source for nanostructure growth. During the period of irradiation, the color of solution turns into dark brown from transparent orange. Upon the completion of irradiation, typically for an hour, a variety of bundles of carbon nanostructures are found in the solution. Raman spectroscopy, scanning electron microscopy (SEM), and transmission electron microscopy (TEM) are used to investigate the nanostructures.

Characterization of Silicon thin Film Deposited by E-Beam Evaporator for Flexible Display

2005 ◽  
Vol 862 ◽  
Author(s):  
In-Hyuk Song ◽  
Sang-Myeon Han ◽  
Jung-Hyun Park ◽  
Min-Koo Han
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Silicon Film ◽  
X Ray Diffraction ◽  
Silicon Thin Film ◽  
Flexible Display ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

AbstractThe structure and crystal growth of the silicon thin film deposited by e-beam evaporator have been studied with use of scanning electron microscopy (SEM), x-ray diffraction and transmission electron microscopy (TEM). The silicon thin film is deposited at room temperature for flexible display. It is found that the silicon film deposited by e-beam evaporator has polysilicon structure by scanning electron microscopy (SEM). SEM image also shows that grain size of the silicon film is about 50nm. X-ray diffraction of the silicon thin film represents that the orientation of the silicon film is (201). We have also investigated the structure and the crystal growth of the silicon film after the silicon film is irradiated by XeCl excimer laser with various energy densities. Transmission electron microscopy shows that the irradiated silicon thin film has low intra-grain defects and sharp grain boundary.

Ultrastructural Analysis of the Salivary Glands of Gromphadorhina Portentosa (Schaum)

1977 ◽  
Vol 35 ◽  
pp. 638-639
Author(s):  
P.J. Dailey
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Salivary Glands ◽  
Secretory Vesicles ◽  
The Past ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
Gromphadorhina Portentosa ◽  
Scanning Electron ◽  
Topographical Relief

The structure of insect salivary glands has been extensively investigated during the past decade; however, none have attempted scanning electron microscopy (SEM) in ultrastructural examinations of these secretory organs. This study correlates fine structure by means of SEM cryofractography with that of thin-sectioned epoxy embedded material observed by means of transmission electron microscopy (TEM).Salivary glands of Gromphadorhina portentosa were excised and immediately submerged in cold (4°C) paraformaldehyde-glutaraldehyde fixative1 for 2 hr, washed and post-fixed in 1 per cent 0s04 in phosphosphate buffer (4°C for 2 hr). After ethanolic dehydration half of the samples were embedded in Epon 812 for TEM and half cryofractured and subsequently critical point dried for SEM. Dried specimens were mounted on aluminum stubs and coated with approximately 150 Å of gold in a cold sputtering apparatus.Figure 1 shows a cryofractured plane through a salivary acinus revealing topographical relief of secretory vesicles.

Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

1978 ◽  
Vol 36 (2) ◽  
pp. 82-83 ◽  
Author(s):  
Nakazo Watari ◽  
Yasuaki Hotta ◽  
Yoshio Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Fine Structure ◽  
Light Microscopy ◽  
Thin Sections ◽  
Transmission Electron ◽  
Identical Cell ◽  
Electron Microscopes ◽  
Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

Scanning and Transmission Microscopy of Nematocyst Batteries in Epitheliomuscular Cells of Hydra

1971 ◽  
Vol 29 ◽  
pp. 410-411 ◽  
Author(s):  
Jane A. Westfall ◽  
S. Yamataka ◽  
Paul D. Enos
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Osmium Tetroxide ◽  
External Surface ◽  
Three Dimensional ◽  
Surface Structures ◽  
Transmission Microscopy ◽  
Transmission Electron ◽  
Freeze Dried ◽  
Scanning Electron

Scanning electron microscopy (SEM) provides three dimensional details of external surface structures and supplements ultrastructural information provided by transmission electron microscopy (TEM). Animals composed of watery jellylike tissues such as hydras and other coelenterates have not been considered suitable for SEM studies because of the difficulty in preserving such organisms in a normal state. This study demonstrates 1) the successful use of SEM on such tissue, and 2) the unique arrangement of batteries of nematocysts within large epitheliomuscular cells on tentacles of Hydra littoralis.Whole specimens of Hydra were prepared for SEM (Figs. 1 and 2) by the fix, freeze-dry, coat technique of Small and Màrszalek. The specimens were fixed in osmium tetroxide and mercuric chloride, freeze-dried in vacuo on a prechilled 1 Kg brass block, and coated with gold-palladium. Tissues for TEM (Figs. 3 and 4) were fixed in glutaraldehyde followed by osmium tetroxide. Scanning micrographs were taken on a Cambridge Stereoscan Mark II A microscope at 10 KV and transmission micrographs were taken on an RCA EMU 3G microscope (Fig. 3) or on a Hitachi HU 11B microscope (Fig. 4).

Copper Localization in Cirrhotic Rat Liver by Scanning Electron Microscopy

1969 ◽  
Vol 27 ◽  
pp. 38-39 ◽  
Author(s):  
J. C. Russ ◽  
E. McNatt
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Endoplasmic Reticulum ◽  
Electron Microscope ◽  
Copper Acetate ◽  
Lead Citrate ◽  
Dense Bodies ◽  
Transmission Electron ◽  
Electron Mode ◽  
Scanning Electron

In order to study the retention of copper in cirrhotic liver, rats were made cirrhotic by carbon tetrachloride inhalation twice weekly for three months and fed 0.2% copper acetate ad libidum in drinking water for one month. The liver tissue was fixed in osmium, sectioned approximately 2000 Å thick, and stained with lead citrate. The section was examined in a scanning electron microscope (JEOLCO JSM-2) in the transmission electron mode.Figure 1 shows a typical area that includes a red blood cell in a sinusoid, a disse, and a portion of the cytoplasm of a hepatocyte which contains several mitochondria, peribiliary dense bodies, glycogen granules, and endoplasmic reticulum.

Identification of calcium oxalate crystals in dried or fixed tobacco leaf

1984 ◽  
Vol 42 ◽  
pp. 288-289
Author(s):  
Vicki L. Baliga ◽  
Mary Ellen Counts
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Calcium Oxalate ◽  
Growth And Development ◽  
Polarized Light ◽  
Calcium Oxalate Crystals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Calcium is an important element in the growth and development of plants and one form of calcium is calcium oxalate. Calcium oxalate has been found in leaf seed, stem material plant tissue culture, fungi and lichen using one or more of the following methods—polarized light microscopy (PLM), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and x-ray diffraction.Two methods are presented here for qualitatively estimating calcium oxalate in dried or fixed tobacco (Nicotiana) leaf from different stalk positions using PLM. SEM, coupled with energy dispersive x-ray spectrometry (EDS), and powder x-ray diffraction were used to verify that the crystals observed in the dried leaf with PLM were calcium oxalate.

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