Laser Melting and Recrystallization of Bulk Si by Nanosecond UV Laser Pulses
Keyword(s):
Uv Laser
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ABSTRACTLaser ablation of semiconductors presents an increasing interest for both thin film growth and surface modification. We present herein a study of the damage produced in bulk silicon by nanoseconds UV laser pulses with energy above the melting threshold. This study is carried out with a Raman microprobe. Polarized microRaman was used to reveal the main changes in the melted and recrystallized volume. These changes were observed in the liquid/solid boundaries, where tensile stress due to the induced thermal wave is more important. The morphology of the melted region evidences matter accumulation at such a boundary.
Keyword(s):
1998 ◽
Vol 37
(Part 1, No. 12B)
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pp. 6984-6990
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Keyword(s):
Keyword(s):
2008 ◽
Vol 254
(23)
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pp. 7838-7842
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1998 ◽
Vol 102
(38)
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pp. 7393-7399
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