Evaluation of Anisotropic Film Structure of Amorphous Alloy by Computer Simulation

1995 ◽  
Vol 389 ◽  
Author(s):  
A. SATO ◽  
H. YAMAMOTO
Keyword(s):  
Film Growth ◽  
Perpendicular Magnetic Anisotropy ◽  
Film Plane ◽  
Film Structure ◽  
Dynamics Simulation ◽  
Transition Metal Alloy ◽  
Atomic Pair ◽  
Distribution Index ◽  
Amorphous Binary Alloy ◽  
Anelastic Deformation

ABSTRACTA film growth of a virtual GdCo amorphous binary alloy was studied with a molecular dynamics simulation. A deviation of the atomic environment δ and an atomic pair distribution index η were calculated to evaluate the atomic structure of the prepared film. It was found that an anisotropic atomic distribution is induced in the film. The value of δ for a Gd atom environment is of the order of 10−4 and is almost in quantitatively agreement with the experimental value. The anelastic deformation is affected by the roughness of the substrate and becomes large in the film deposited on a smooth substrate. The value of η shows that the atomic pairs preferentially orient toward a horizontal film plane. The obtained results strongly support a single ion model as a main origin of a perpendicular magnetic anisotropy experimentally observed in amorphous rare earth-transition metal alloy films.

Molecular Dynamics Simulation of Copper Thin Film Growth on β-Ta (002) Substrate

2002 ◽  
Vol 721 ◽  
Author(s):  
Youhong Li ◽  
James B. Adams
Keyword(s):  
Thin Film ◽  
Molecular Dynamics ◽  
Film Growth ◽  
Copper Film ◽  
Film Structure ◽  
Thin Film Growth ◽  
Dynamics Simulation ◽  
Copper Metallization ◽  
Copper Thin Film ◽  
Force Matching

AbstractTantalum can be used both as a diffusion barrier and an adhesion layer for copper metallization for semiconductor devices. Experiments show that β-Ta (200) substrates promote (111) texture growth in copper films. In this study, we first create an embedded atom method (EAM) Cu-Ta potential developed by our force matching method (FMM); then the potential is used for Molecular Dynamics (MD) simulations of initial copper thin film growth on β-Ta substrates. Both Cu/Ta interfacial structures and copper film structure are investigated. The relevance to (111) texturing is discussed.

Microstructural characterization of YBaCuO Films on LaAlO3 substrates

1989 ◽  
Vol 47 ◽  
pp. 180-181
Author(s):  
E. L. Hall ◽  
A. Mogro-Campero ◽  
N. Lewis ◽  
L. G. Turner
Keyword(s):  
Dielectric Constant ◽  
Single Crystal ◽  
Film Growth ◽  
Microstructural Characterization ◽  
Lattice Parameter ◽  
Film Plane ◽  
Substrate Material ◽  
High Loss ◽  
Amorphous Substrates ◽  
High Dielectric

There have been a large number of recent studies of the growth of Y-Ba-Cu-O thin films, and these studies have employed a variety of substrates and growth techniques. To date, the highest values of Tc and Jc have been found for films grown by sputtering or coevaporation on single-crystal SrTiO3 substrates, which produces a uniaxially-aligned film with the YBa2Cu3Ox c-axis normal to the film plane. Multilayer growth of films on the same substrate produces a triaxially-aligned film (regions of the film have their c-axis parallel to each of the three substrate <100> directions) with lower values of Jc. Growth of films on a variety of other polycrystalline or amorphous substrates produces randomly-oriented polycrystalline films with low Jc. Although single-crystal SrTiO3 thus produces the best results, this substrate material has a number of undesireable characteristics relative to electronic applications, including very high dielectric constant and a high loss tangent at microwave frequencies. Recently, Simon et al. have shown that LaAlO3 could be used as a substrate for YBaCuO film growth. This substrate is essentially a cubic perovskite with a lattice parameter of 0.3792nm (it has a slight rhombohedral distortion at room temperature) and this material exhibits much lower dielectric constant and microwave loss tangents than SrTiO3. It is also interesting from a film growth standpoint since it has a slightly smaller lattice parameter than YBa2Cu3Ox (a=0.382nm, b=c/3=0.389nm), while SrTiO3 is slightly larger (a=0.3905nm).

Molecular Dynamics Simulations of Structures of Amorphous Carbon Films via Deposition

2011 ◽  
Vol 194-196 ◽  
pp. 2220-2224
Author(s):  
Hui Qing Lan ◽  
Zheng Ling Kang
Keyword(s):  
Molecular Dynamics ◽  
Amorphous Carbon ◽  
Growth Dynamics ◽  
Carbon Films ◽  
Film Structure ◽  
Dynamics Simulation ◽  
Carbon Ions ◽  
Amorphous Carbon Films ◽  
Dynamics Simulations ◽  
The Impact

The growth of amorphous carbon films via deposition is investigated using molecular dynamics simulation with a modified Tersoff potential. The impact energy of carbon atoms ranges from 1 to 50 eV and the temperature of the diamond substrate is 300 K. The effects of the incident energy on the growth dynamics and film structure are studied in a detail. Simulation results show that the mobility of surface atoms in the cascade region is enhanced by impacting energetic carbon ions, especially at moderate energy, which favors the growth of denser and smoother films with better adhesion to the substrate. Our results agree qualitatively with the experimental observation.

Mesoscopic Models of Sintering of Metallic Clusters. A Study by Molecular Dynamics Simulations

1999 ◽  
Vol 570 ◽  
Author(s):  
A.M. Mazzone
Keyword(s):  
Molecular Dynamics ◽  
Film Growth ◽  
Simulation Method ◽  
Melting Behavior ◽  
Dynamics Simulation ◽  
Metallic Clusters ◽  
Macroscopic Models ◽  
Mesoscopic Models ◽  
Dynamics Simulations ◽  
Low Dimensional

ABSTRACTMotivated by the ulbiquitous role of clusters in film growth, we study coalescence of metallic clusters (Ag.Cu.Pb). of size from 50 to 300, with an isothermal molecular dynamics simulation method using classical forces. A comparison is made between the melting behavior of the isolated clusters, onl one side. and classical theories of sintering, on the other side. An evident failure of the macroscopic models appears from this comparison and this casts considerable doubts on the adequacy of continuum models for low dimensional systems.

Perpendicular magnetic anisotropy and magneto‐optical properties of evaporated (Fe,Co)–rare‐earth amorphous binary alloy films

1988 ◽  
Vol 64 (10) ◽  
pp. 5492-5494 ◽  
Author(s):  
A. Yoshihara ◽  
M. Takahashi ◽  
T. Shimamori ◽  
T. Wakiyama ◽  
M. Miyazaki ◽  
...  
Keyword(s):  
Optical Properties ◽  
Rare Earth ◽  
Magnetic Anisotropy ◽  
Binary Alloy ◽  
Perpendicular Magnetic Anisotropy ◽  
Alloy Films ◽  
Amorphous Binary Alloy

Magnetostriction and Microstructure of As-Deposited and Annealed Co Thin Films

2001 ◽  
Vol 674 ◽  
Author(s):  
Winfried Brückner ◽  
Michael Hecker ◽  
Jürgen Thomas ◽  
Detlev Tietjen ◽  
Claus M. Schneider
Keyword(s):  
Thin Films ◽  
Magnetic Fields ◽  
Magnetic Anisotropy ◽  
Grain Growth ◽  
Spontaneous Magnetization ◽  
Perpendicular Magnetic Anisotropy ◽  
Transverse Magnetic ◽  
Film Plane ◽  
Appreciable Change

ABSTRACTThe magnetostriction of as-sputtered and annealed 400 nm thick Co films has been studied in longitudinal and transverse magnetic fields. The appreciable change of the magnetostriction behavior after annealing above 250 °C is correlated to grain growth and to the related change of the texture (from nearly randomly distributed hcp-Co crystallites to a c-axes texture perpendicular to the film plane). The magnetostriction behavior in the annealed samples cannot be explained by a domain magnetization within the film plane. It is assumed that a rotation of the spontaneous magnetization out of the film plane occurs due to the development of a perpendicular magnetic anisotropy.

Structural Properties of Anisotropic PtCo(001) and PtFe(001) Thin Films on MgO(001)

1993 ◽  
Vol 311 ◽  
Author(s):  
Bruce M. Lairson ◽  
Mark R. Visokay ◽  
Sean B. Brennan ◽  
Robert Sinclair ◽  
Bruce M. Clemens
Keyword(s):  
Structural Properties ◽  
Perpendicular Magnetic Anisotropy ◽  
Film Plane ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Axis Orientation ◽  
Superlattice Structure ◽  
Natural Superlattice ◽  
Epitaxial Multilayers ◽  
Magneto Optic

ABSTRACTWe report structural properties of PtFe and PtCo intermetallic compounds with perpendicular magnetic anisotropy and a preferred c-axis orientation perpendicular to the film plane, formed from initially epitaxial multilayers. These materials represent particular cases of a more general class of anisotropic magnetic compounds with the CuAu(1) natural superlattice structure. They possess high magneto-optic Kerr rotations and magnetizations, suggesting them as likely candidates for magneto-optic and perpendicular magnetic recording media.

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