Densification of Sio Gel Films by Synchrotron Radiation and its Dependence on Photon Energy

1994 ◽  
Vol 375 ◽  
Author(s):  
Hiroaki Imai ◽  
Koichi Awazu ◽  
Masaru Yasumori ◽  
Hiroshi Hirashima ◽  
Hideo Onuki
Keyword(s):  
Refractive Index ◽  
Infrared Spectroscopy ◽  
Synchrotron Radiation ◽  
Energy Dependence ◽  
Photon Energy ◽  
Oh Groups

AbstractThe interaction of synchrotron radiation (SR) emitted from a polarizing undulator with SiO2 gel films was investigated by ellipsometry and infrared spectroscopy. The photon energy in SR was varied in the range of 6.4−17.8 eV using an Onuki-type undulator in order to study the energy dependence of the interaction. We found that an increase of refractive index, a decrease of thickness of the films and a loss of OH groups were induced by photons with energies above ˜9 eV although any changes were not observed with photons below ˜7 eV. These results suggest that SiO2 gel films are densified through electronic processes stimulated by the energetic photons.

A contribution to evaluation of influence of medium in electronic and infrared spectroscopy

1982 ◽  
Vol 47 (4) ◽  
pp. 1060-1068 ◽  
Author(s):  
Vojtěch Bekárek ◽  
Jan Juřina
Keyword(s):  
Refractive Index ◽  
Infrared Spectroscopy ◽  
Correlation Coefficient ◽  
Solvent Effects ◽  
Electronic Spectra ◽  
Relative Permittivity ◽  
Solvent Parameters

Dependence of ET(30) of solvent parameters on relative permittivity (ε) and refractive index (n) of solvent has been found for forty solvents in the form ET(30)=29.87 + 72.03 (ε - 1/(2ε + 1)-29.16(ε - 1) (n 2 - 1)/(2ε + 1) (2n2 + 1), the correlation coefficient being 0.958. Relation has been discussed between ET(30) and π solvent parameters and significance of the term (ε - 1). (n2 - 1)/(2ε + 1) (2n2 + 1) has been tested for evaluation of solvent effects in electronic spectra.>

Photon energy dependence of graphite valence band photoelectron intensity

2010 ◽  
Vol 181 (2-3) ◽  
pp. 193-196 ◽  
Author(s):  
Masaru Takizawa ◽  
Hidetoshi Namba ◽  
Fumihiko Matsui ◽  
Hiroshi Daimon
Keyword(s):  
Valence Band ◽  
Energy Dependence ◽  
Photon Energy

scholarly journals Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4–250 eV

2020 ◽  
Vol 27 (1) ◽  
pp. 75-82
Author(s):  
Mikhail Svechnikov ◽  
Nikolay Chkhalo ◽  
Alexey Lopatin ◽  
Roman Pleshkov ◽  
Vladimir Polkovnikov ◽  
...  
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Synchrotron Radiation ◽  
Initial Data ◽  
Absorption Coefficient ◽  
Energy Range ◽  
Transmission Coefficient ◽  
Radiation Source ◽  
Optical Constants ◽  
Free Standing

In this work, the refractive index of beryllium in the photon energy range 20.4–250 eV was experimentally determined. The initial data include measurements of the transmittance of two free-standing Be films with thicknesses of 70 nm and 152 nm, as well as reflectometric measurements of similar films on a substrate. Measurements were carried out at the optics beamline of the BESSY II synchrotron radiation source. The absorption coefficient β was found directly from the transmission coefficient of the films, and the real part of the polarizability δ was calculated from the Kramers–Kronig relations. A comparison is carried out with results obtained 20 years ago at the ALS synchrotron using a similar methodology.

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