In Situ Straining Experiments On Fe70AL30 Single Crystals

1994 ◽  
Vol 364 ◽  
Author(s):  
G. Molenat ◽  
H. Rösner ◽  
E. Nembach
Keyword(s):  
Mechanical Properties ◽  
Electron Microscope ◽  
Single Crystals ◽  
Yield Stress ◽  
Transmission Electron Microscope ◽  
Intermetallic Alloys ◽  
Temperature Range ◽  
Transmission Electron

AbstractWith an aim to contributing to the understanding of the mechanical properties of Fe3Al-based intermetallic alloys, Fe-30 at. % Al single crystals have been strained in a transmission electron microscope below and in the temperature range of the yield stress anomaly (at 300K and 573K respectively).

In situ observation of the motion of ferroelectric domain walls in Bi4Ti3O12 single crystals

2016 ◽  
Vol 49 (5) ◽  
pp. 1645-1652 ◽  
Author(s):  
Wanneng Ye ◽  
Lingli Tang ◽  
Chaojing Lu ◽  
Huabing Li ◽  
Yichun Zhou
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Single Crystals ◽  
Transmission Electron Microscope ◽  
Domain Walls ◽  
Domain Switching ◽  
Ferroelectric Domain ◽  
In Situ Observation ◽  
Transmission Electron

Five types of ferroelectric domain walls (DWs) are present in Bi4Ti3O12 single crystals (Ye et al., 2015). Here their motion was investigated in situ using transmission electron microscopy and optical microscopy. The motion of P (a)-90° DWs, P (a)-180° DWs and P (c)-180° DWs was observed through electron beam poling in a transmission electron microscope. The growth of new P s(a)-180° nanodomains was frequently seen and they tended to nucleate at preexisting P s(a)-90° DWs. Irregularly curved P (c)-180° DWs exhibit the highest mobility, while migration over a short range occurs occasionally for faceted P s(a)-90° DWs. In addition, the motion of P s(a)-90° DWs and the growth/annihilation of new needle-like P s(a)-90° domains in a 20 µm-thick crystal were observed under an external electric field on an optical microscope. Most of the new needle-like P s(a)-90° domains nucleate at preexisting P s(a)-90° DWs and the former are much smaller than the latter. This is very similar to the situation for P s(a)-180° domain switching induced by electron beam poling in a transmission electron microscope. Our observations suggest the energy hierarchy for different domains of P s(c)-180° ≤ P s(a)-180° ≤ P s(a)-90° ≤ new needle-like P s(a)-90° in ferroelectric Bi4Ti3O12.

Dislocation structures in deformed Ni3Al

1989 ◽  
Vol 47 ◽  
pp. 304-305
Author(s):  
Raja Subramanian ◽  
I.M. Robertson ◽  
H.K. Birnbaum
Keyword(s):  
Boundary Layer ◽  
Electron Microscope ◽  
Grain Boundary ◽  
Transmission Electron Microscope ◽  
Cohesive Energy ◽  
Intermetallic Alloys ◽  
Transmission Electron ◽  
Deviation From Stoichiometry

The improvement of the ductility of Ni3Al by the addition of boron has revived interest in intermetallic alloys. Addition of up to about 500 wt. ppm of boron increases the ductility of Ni3Al by as much as 50%. This improvement is dependent on the deviation from stoichiometry with optimum effect being obtained for the Ni-rich composition. The ductility enhancement has been attributed to the boron increasing the cohesive energy of the grain boundary and to a disordered boundary layer easing the slip process through the grain boundary.The dislocation structures produced in deformed Ni3Al with and without boron has been examined in the transmission electron microscope . Samples were deformed to a 3 % strain in bulk form while others were deformed in situ in the transmission electron microscope. (Details of the in situ TEM straining technique can be found in ref.)

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

scholarly journals In-Situ Stretching Patterned Graphene Nanoribbons in the Transmission Electron Microscope

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Zhongquan Liao ◽  
Leonardo Medrano Sandonas ◽  
Tao Zhang ◽  
Martin Gall ◽  
Arezoo Dianat ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Graphene Nanoribbons ◽  
Transmission Electron

scholarly journals In situ disordering of monoclinic titanium monoxide Ti5O5 studied by transmission electron microscope TEM

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
А. А. Rempel ◽  
W. Van Renterghem ◽  
А. А. Valeeva ◽  
M. Verwerft ◽  
S. Van den Berghe
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Titanium Monoxide ◽  
Transmission Electron
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