Heteroepitaxial Growth of Ba0.5Sr0.5TiO3/SrRuO3 on YSZ/Si by Off-Axis Sputtering

1994 ◽  
Vol 361 ◽  
Author(s):  
S.Y. Hou ◽  
J. Kwo ◽  
R.K. Watts ◽  
J.-Y. Cheng ◽  
R.J. Cava ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Degree Of Crystallinity ◽  
Heteroepitaxial Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Dielectric Constant And Loss ◽  
Bst Films ◽  
High Degree ◽  
Room Temperature Dielectric Constant

ABSTRACTWe demonstrate an epitaxial heterostructure of Ba0.5Sr0.5 TiO3/SrRuO3/YSZ on Si for potential charge storage applications. The dielectric Ba0.5Sr0.5TiO3 (BST) and conductive oxide SrRuO3 are both grown (110) oriented on YSZ (100) buffered Si by 90° off-axis sputtering. These films showed a high degree of crystallinity with minimal interdiffusion at the interfaces as examined by X-ray diffraction, Rutherford backscattering spectroscopy, and cross-section transmission electron microscopy. The in-plane epitaxial alignment of the films is BST/SRO 〈111〉 // YSZ 〈110〉 with a four-fold degeneracy. The dielectric constant and loss tangent of the epi-BST films are 360 and 0.01 at 10 kHz. The leakage current density is < 4×10∼−7 A/cm2 at 1 V. The room temperature dielectric constant (ε) of the BST films shows a roll-off in the 1–10 MHz range. This is attributed to the existence of a series resistance in the measurement circuit, which likely arises from the SrRuO3 electrode.

Well-defined colloidal tin(IV) oxide particles

1990 ◽  
Vol 5 (5) ◽  
pp. 1083-1091 ◽  
Author(s):  
Manuel Ocaña ◽  
Egon Matijević
Keyword(s):  
Dielectric Constant ◽  
Infrared Spectra ◽  
Particle Morphology ◽  
Spherical Particles ◽  
Degree Of Crystallinity ◽  
Narrow Size Distribution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Additional Information ◽  
Oxide Particles

Spherical and rod-like SnO2 particles of narrow size distribution have been obtained by aging at 100°C acidified tin(IV) chloride solutions in the presence of urea or formamide. It was shown that spherical particles, the x-ray diffraction of which was characteristic of cassiterite, consisted of a large number of much smaller subunits. The rod-like particles had the same structure, but of higher degree of crystallinity. Infrared spectra of these powders were evaluated in terms of the theory of the average dielectric constant (TADC), in order to gain additional information on the particle morphology and the state of aggregation.

Preparation and Characterization of Ce-Doped Ba0.2Sr0.8TiO3 Ferroelectric Ceramics

2010 ◽  
Vol 97-101 ◽  
pp. 1091-1096
Author(s):  
Dong Fang Han ◽  
Qun Tang ◽  
Qing Meng Zhang ◽  
Lei Wang ◽  
Ju Du
Keyword(s):  
Dielectric Constant ◽  
Xrd Analysis ◽  
Ferroelectric Ceramics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structure And Property ◽  
Dielectric Constant And Loss ◽  
Ce Content ◽  
Doping Ratio

The structure and property of Ce-doped Ba0.2Sr0.8TiO3 (BST) were investigated as a function of Ce content. The density experiment results confirmed that increasing the Ce doping ratio caused the decrease in shrinkage factor of BST in the sintering procedure. Additionally, both Scanning Electron Microscope (SEM) and X-ray diffraction (XRD) analysis showed that the grain size of Ce-doped BST was dependent on the Ce content. Further more, the dielectric constant and dielectric loss had a curve relationship with increasing Ce content. The improvement of the electrical properties of Ce doping BST may be related to the decrease in the concentration of oxygen vacancies. According to the research, the diameter of grain, the dielectric constant and loss factor of the 1mol% Ce-doped Ba0.2Sr0.8TiO3 were 500nm, 365.8 and 0.0063, respectively.

Microstructure and Properties of Nanosemicrystalline Si3N4 Ceramics with Doped Sintering Additives: Part I. Microstructural Characterization of Nanosemicrystalline Si3N4 Powders

1998 ◽  
Vol 13 (9) ◽  
pp. 2580-2587 ◽  
Author(s):  
K. H. Ryu ◽  
J-M. Yang
Keyword(s):  
Microstructural Characterization ◽  
Degree Of Crystallinity ◽  
Chemical Compositions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sintering Additives ◽  
Transmission Electron ◽  
Wet Chemical ◽  
Si3n4 Ceramics

The characteristics of nanosized silicon nitride powders with doped Y2O3 and Al2O3 fabricated by a plasma-reacted chemical process were investigated. The chemical compositions of the powders were analyzed by wet chemical analysis. The morphology and the size distribution were determined by transmission electron microscopy (TEM). TEM with energy dispersive spectroscopy (EDS) was used to verify the existence of sintering additives in each individual particle. The crystal structure of the powders was identified by the selected area diffraction pattern (SADP). X-ray diffraction (XRD) technique was used for phase analysis and the measurement of degree of crystallinity. The characteristics of chemical bonding was analyzed by using Fourier transform infrared spectroscopy (FTIR).

scholarly journals SYNTHESIS OF In-CONTAINING HIGH-SILICA ZEOLITE OF ZSM-5 TYPE

2017 ◽  
Vol 60 (8) ◽  
pp. 84
Author(s):  
Khasay R. Samedov ◽  
Ulviya A. Mamedova ◽  
Kerim G. Ragimov ◽  
Zarema A. Jabbarova
Keyword(s):  
Degree Of Crystallinity ◽  
Molar Ratio ◽  
X Ray Diffraction ◽  
Solid Product ◽  
X Ray ◽  
Type Zeolite ◽  
High Silica ◽  
Tetrabutylammonium Iodide ◽  
High Degree ◽  
Ratio Of Components

High silicate zeolite ZSM-5 on the basis of SiO2–In2O3–NaOH with an organic structure forming agent tetrabutylammonium iodide (TBAI) was synthesized in the temperature range of T = 150–220°C, pH = 9-12, τ = 48-240 h. As initial components, silica gel MSKO containing 86% SiO2, tetrabutylammonium iodide (TBAI), chemically pure NaOH and metallic indium (In) were used which mixed by hydrothermal synthesis. At the end of the synthesis, the solid product was separated from the mother liquor, washed on the filter with distilled water from an excess of alkali and dried at 120 °C, calcined at 550 °C (16 h). The products of hydrothermal crystallization were determined by X-ray (RFA – on the device D2-Phaser "Bruker"), differential thermal (DTA- STA-449 F3 Jupiter NETZSCH), by X-ray diffraction (XRD of brand SRM-18) and infrared spectroscopy (IR on FTIR spectroscopy, Nicolefisio VSA) analysis methods. During the synthesis, it was experimentally established that at T = 200 °C; τ = 240 h; pH≈9-10 molar ratio of components 5.78SiO2∙0.058In2O3∙0.625Na2O∙0.11H2O∙0.95 ((C4H9) 4NJ) – MFI-type zeolite is crystallized. When comparing XRF data with literature data, they were referred to a type zeolite of ZSM-5 differing in high degree of crystallinity. The following chemical composition of the synthesized zeolite (wt.%) was established by the X-ray diffraction (SRM-18) method: SiO2 – 94.01; In2O3 – 4.92; Na2O – 1.06 corresponding to the formula 0.96Na2O:In2O3:88SiO2:10H2O.Forcitation:Samedov Kh.R., Mamedova U.A., Ragimov K.G., Jabbarova Z.A. Synthesis of In-containing high-silica zeolite of ZSM-5 type.Izv. Vyssh. Uchebn. Zaved. Khim. Khim. Tekhnol. 2017. V. 60. N 8. P. 84-87.

SYNTHESIS OF YTTRIA-STABILIZED CUBIC ZIRCONIA NANOCRYSTALS BY ULTRASONIC–MICROWAVE ROUTE

NANO ◽  
2010 ◽  
Vol 05 (05) ◽  
pp. 271-277 ◽  
Author(s):  
JIAN-DONG WANG ◽  
CHONG-XIAO LUO ◽  
JIN-KU LIU ◽  
YI LU ◽  
GUANG-MING LI
Keyword(s):  
Average Particle Size ◽  
Degree Of Crystallinity ◽  
Average Particle ◽  
Stabilized Zirconia ◽  
Uniform Size ◽  
X Ray ◽  
Microwave Assisted ◽  
Transmission Electron ◽  
High Degree ◽  
Microwave Assisted Method

The yttria-stabilized zirconia (YSZ) nanocrystals with uniform size, high purity, and high degree of crystallinity, were prepared by ultrasonic–microwave-assisted method. The structure, optical properties and morphologies of YSZ nanocrystals were characterized by X-ray powder diffraction (XRD), Raman spectroscopy, UV–vis absorption, scanning electron microscope (SEM) and transmission electron microscopy (TEM). The SEM and TEM images of the YSZ nanocrystals indicate that the product is a mono-dispersion structure with an average particle size of about 25 nm.

Silica/Polyurea Composite: Preparation, Characterization and Study of Dielectric Constant

2016 ◽  
Vol 13 (10) ◽  
pp. 7234-7237
Author(s):  
Botong Wang ◽  
Zebo Xu ◽  
Zhiqiang Wang
Keyword(s):  
Electron Microscopy ◽  
Dielectric Constant ◽  
Hydrogen Bonds ◽  
Ultraviolet Spectroscopy ◽  
Core Shell ◽  
X Ray Diffraction ◽  
Modified Silica ◽  
X Ray ◽  
Transmission Electron ◽  
Core Shell Structure

Silica/polyurea composite was prepared after surface modification of silica nanoparticles. Silica/polyurea composite was characterized by Fourier-transform infrared spectroscopy, ultraviolet spectroscopy, X-ray diffraction and transmission electron microscopy. The results indicate that the helical polyurea has been successfully grafted onto the surfaces of the modified silica. Silica/polyurea composite exhibits clearly core–shell structure. The ultraviolet absorption and crystallizability of silica/polyurea are changed due to the shell of helical polyurea, which possesses regular singlehanded conformation and interchain hydrogen bonds. The dielectric constant of silica/polyurea was also investigated. The result indicates that the interfacial interactions between organic shell and inorganic core increase the dielectric constant value being increased to 6.42 for silica/polyurea. The interchain hydrogen bonds of helical polyurea could also be the reason for the increasing of dielectric constant.

Epitaxial growth of skutterudite (CoSb3) thin films on (001) InSb by pulsed laser deposition

2001 ◽  
Vol 16 (9) ◽  
pp. 2467-2470 ◽  
Author(s):  
J. C. Caylor ◽  
M. S. Sander ◽  
A. M. Stacy ◽  
J. S. Harper ◽  
R. Gronsky ◽  
...  
Keyword(s):  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Heteroepitaxial Growth ◽  
X Ray Diffraction ◽  
Epitaxial Relationship ◽  
X Ray ◽  
Zinc Blende ◽  
Transmission Electron ◽  
Zinc Blende Structure

Heteroepitaxial growth of the cubic skutterudite phase CoSb3 on (001) InSb substrates was achieved by pulsed laser deposition using a substrate temperature of 270 °C and a bulk CoSb3 target with 0.75 at.% excess Sb. An InSb (a0 = 4 0.6478 nm) substrate was chosen for its lattice registry with the antimonide skutterudites (e.g., CoSb3 with a = 0 4 0.9034 nm) on the basis of a presumed 45° rotated relationship with the InSb zinc blende structure. X-ray diffraction and transmission electron microscopy confirmed both the structure of the films and their epitaxial relationship: (001)CoSb3 ∥ (001)InSb; [100]CoSb3 ∥ [110]InSb.

SYNTHESIS OF NANOCRYSTALLINE YIG USING MICROWAVE-HYDROTHERMAL METHOD

2009 ◽  
Vol 23 (17) ◽  
pp. 3637-3642 ◽  
Author(s):  
K. SADHANA ◽  
R. S. SHINDE ◽  
S. R. MURTHY
Keyword(s):  
Sintering Temperature ◽  
Microwave Sintering ◽  
Complex Permeability ◽  
X Ray Diffraction ◽  
X Ray ◽  
Microwave Hydrothermal ◽  
Transmission Electron ◽  
Dielectric Constant And Loss ◽  
Iron Garnet ◽  
Sintering Method

The aim of present research is to study the influence of sintering temperature on the preparation of nanocrystalline Yttrium Iron garnet (YIG) with improved magnetic properties. The nanocrystalline YIG powders were synthesized using Microwave-Hydrothermal (M-H) method. The synthesized powders were characterized using X-ray diffraction (XRD) and Transmission Electron Microscope (TEM). The powders were sintered at various temperatures using microwave sintering method. The sintered samples were characterized using XRD. The complex permeability, dielectric constant and loss tangent of sintered YIG ceramic were also measured and discussed in this paper

Dielectric and Piezoelectric Properties of Gd-modified (1-x) BiFeO3-xPbTiO3 Ceramics with a Morphotropic Phase Boundary

2013 ◽  
Vol 1507 ◽  
Author(s):  
Dalei Wang ◽  
Shundong Bu ◽  
Guoxi Jin ◽  
RuiDai ◽  
Dengren Jin ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Composition Range ◽  
Piezoelectric Properties ◽  
X Ray Diffraction ◽  
Wide Composition Range ◽  
X Ray ◽  
Dielectric Constant And Loss ◽  
Dielectric And Piezoelectric Properties

ABSTRACT(1-x)(Bi0.8Gd0.2)FeO3-xPbTiO3 (BGF-PT) solid solutions ceramics of x=0.55,0.50,0.4975, 0.49 and 0.45 were prepared by the mixed oxide method. Gd3+ of 20 at% was introduced into the Bi3+ site to improve the dielectric and piezoelectric properties of BFPT without causing the significant reduction of Curie temperature (Tc). X-ray diffraction analysis shows a transformation from the tetragonal (T) to rhombohedral (R) phase with the increase of BGF content. The morphotropic phase boundary was determined by measuring the dielectric and piezoelectric properties of BGF-PT within a wide composition range. BGF-PT for x=0.4975 shows the coexistence of T and R phases with the dielectric constant and loss of about 895 and 0.031 respectively at the frequency of 102 Hz.

Effect of Sintering Parameters and Ta2O5 Doping on the Microstructure and Dielectric Properties of BaTiO3 Based Ceramics

2014 ◽  
Vol 608 ◽  
pp. 247-252 ◽  
Author(s):  
Md. Fakhrul Islam ◽  
Rubayyat Mahbub ◽  
Adnan Mousharraf
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Room Temperature ◽  
Tantalum Oxide ◽  
X Ray Diffraction ◽  
X Ray ◽  
Xrd Techniques ◽  
Titanate Ceramics ◽  
The Relationship ◽  
Room Temperature Dielectric Constant

The main focus of the research was to correlate the composition and sintering parameters with the microstructure and dielectric properties of Ta2O5 (Tantalum Oxide) doped BaTiO3 (Barium Titanate) ceramics. Ta2O5 was doped at three different percentages viz. 0.5, 1.0 and 1.5 mole%. The doped samples were then sintered using both single and double stage sintering techniques. Thereafter field emission scanning electron microscope (FESEM) and X-ray diffraction (XRD) techniques were used to examine the structure of the samples with particular focus on the incorporation of Ta5+ions into the BaTiO3 crystal lattice. Finally, the dielectric properties were analyzed using impedence analyzer and the relationship between the properties and structure of doped BaTiO3 was established. From the research, it can be stated that double stage sintering yielded best dielectric properties. The best stable value of room temperature dielectric constant (k) of 19000 was obtained for 1.5mole % Ta2O5 doped BaTiO3 sample, sintered at 1320°C for 0 hour and 1280°C for 6 hours due to the combination of high percent theoretical density (%TD) and optimum grain size. At a temperature range of 30°C to 60°C, this combination of composition and sintering parameters yielded dielectric constant in the range of 18000-19000.

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