Atomic Force Microscopy of Carbon Nanotubes and Nanoparticles

1994 ◽  
Vol 359 ◽  
Author(s):  
Ping Li ◽  
Klaus Satftler
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Pyrolytic Graphite ◽  
Graphite Substrate ◽  
Spherical Type ◽  
Carbon Vapor ◽  
Force Microscopy ◽  
Sapphire Substrates ◽  
Atomic Force ◽  
Carbon Structures

ABSTRACTVery hot carbon vapor was deposited on highly-oriented pyrolytic graphite (HOPG) and on sapphire substrates. Using atomic force microscopy, the obtained carbon structures are analyzed. It is found that carbon nanotubes and cones had formed on the graphite substrate but not on sapphire. Instead, spherical-type nanoparticles are analyzed on sapphire. A particle with double-conical shape is found on the graphite substrate. The two observed cone angles 19° and 60° are explained by perfect network closure of sectors of curled graphene sheets.

Nanomanipulation by atomic force microscopy of carbon nanotubes on a nanostructured surface

2003 ◽  
Vol 543 (1-3) ◽  
pp. 57-62 ◽  
Author(s):  
S. Decossas ◽  
L. Patrone ◽  
A.M. Bonnot ◽  
F. Comin ◽  
M. Derivaz ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Nanostructured Surface ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Effects of tip-nanotube interactions on atomic force microscopy imaging of carbon nanotubes

Nano Research ◽  
2012 ◽  
Vol 5 (4) ◽  
pp. 235-247 ◽  
Author(s):  
Rouholla Alizadegan ◽  
Albert D. Liao ◽  
Feng Xiong ◽  
Eric Pop ◽  
K. Jimmy Hsia
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

Scanning Tunneling Microscopy and Atomic Force Microscopy Investigation of Organic Tetracyanoquinodimethane Thin Films

1997 ◽  
Vol 12 (8) ◽  
pp. 1942-1945 ◽  
Author(s):  
H. J. Gao ◽  
H. X. Zhang ◽  
Z. Q. Xue ◽  
S. J. Pang
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Pyrolytic Graphite ◽  
Film Surface ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Investigation

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) investigation of tetracyanoquinodimethane (TCNQ) and the related C60-TCNQ thin films is presented. Periodic molecular chains of the TCNQ on highly oriented pyrolytic graphite (HOPG) substrates were imaged, which demonstrated that the crystalline (001) plane was parallel to the substrate. For the C60-TCNQ thin films, we found that there were grains on the film surface. STM images within the grain revealed that the well-ordered rows and terraces, and the parallel rows in different grains were generally not in the same orientation. Moreover, the grain boundary was also observed. In addition, AFM was employed to modify the organic TCNQ film surface for the application of this type of materials to information recording and storage at the nanometer scale. The nanometer holes were successfully created on the TCNQ thin film by the AFM.

Identifying Individual Single-Walled and Double-Walled Carbon Nanotubes by Atomic Force Microscopy

Nano Letters ◽  
2008 ◽  
Vol 8 (11) ◽  
pp. 3568-3571 ◽  
Author(s):  
Tristan DeBorde ◽  
J. Caleb Joiner ◽  
Matthew R. Leyden ◽  
Ethan D. Minot
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Double Walled Carbon Nanotubes ◽  
Walled Carbon Nanotubes

scholarly journals Hexagonal Boron Nitride Tunnel Barriers Grown on Graphite by High Temperature Molecular Beam Epitaxy

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Yong-Jin Cho ◽  
Alex Summerfield ◽  
Andrew Davies ◽  
Tin S. Cheng ◽  
Emily F. Smith ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Temperature ◽  
Molecular Beam Epitaxy ◽  
Boron Nitride ◽  
Photoelectron Spectroscopy ◽  
Molecular Beam ◽  
Hexagonal Boron Nitride ◽  
Graphite Substrate ◽  
Force Microscopy ◽  
Atomic Force

Abstract We demonstrate direct epitaxial growth of high-quality hexagonal boron nitride (hBN) layers on graphite using high-temperature plasma-assisted molecular beam epitaxy. Atomic force microscopy reveals mono- and few-layer island growth, while conducting atomic force microscopy shows that the grown hBN has a resistance which increases exponentially with the number of layers, and has electrical properties comparable to exfoliated hBN. X-ray photoelectron spectroscopy, Raman microscopy and spectroscopic ellipsometry measurements on hBN confirm the formation of sp2-bonded hBN and a band gap of 5.9 ± 0.1 eV with no chemical intermixing with graphite. We also observe hexagonal moiré patterns with a period of 15 nm, consistent with the alignment of the hBN lattice and the graphite substrate.

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