Two Step Growth and Characterization of BaF2/Si(III) Heterostructures
AbstractThe influence of growth conditions on structural perfections and epitaxial relation in BaF2 films on Si(111) are considered. It is shown that rotational-twin-free BaF2 films (A-type orientation) can be grown on Si(111) by two step growth method. It is also shown that a mixed (A+B)-type orientation, which usually observed in BaF2 films grown by conventional one step growth method, can be converted into A-type orientation by postgrowth annealing. The correlation between type of epitaxial orientation in BaF2 films and structures of interface is discussed.
2010 ◽
Vol 89
(1)
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pp. 130-132
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1990 ◽
Vol 41-42
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pp. 512-515
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