The Growth of Amorphous CuxTi1-x Films: Relationship Between Intrinsic Stresses and Microstructure Observed by STM

1994 ◽  
Vol 356 ◽  
Author(s):  
U. Von Hülsen ◽  
U. Geyer ◽  
S. Dina ◽  
G. von Minnigerode
Keyword(s):  
Surface Topography ◽  
Film Growth ◽  
Critical Value ◽  
Metal Films ◽  
Scanning Tunneling ◽  
Growth Stages ◽  
Tunneling Microscopy ◽  
Tensile Stresses ◽  
Compressive Stresses ◽  
Ti Films

AbstractThe evolution of the surface topography of thin amorphous Cu-Ti films during the film growth is investigated by scanning tunneling microscopy. The films begin to grow with smooth surfaces until the film thickness reaches a critical value. Then, within a small thickness interval, a grainy microstructure of the film develops which looks very similar to the microstructure of polycrystalline films. Measurements of the intrinsic macroscopic stress in these films during the film growth show compressive stresses in the early growth stages. Then a change to tensile stresses accompanies the change in the surface topography within the same thickness interval. Both, the surface topography and the intrinsic stresses, are always correlated and depend on the deposition temperature and on the film composition. We discuss implications of these observations on the origin of macroscopic intrinsic tensile stresses in amorphous transition metal films.

scholarly journals Surface Roughening, Columnar Growth and Intrinsic Stress Formation in Amorphous CuTi Films

1996 ◽  
Vol 441 ◽  
Author(s):  
U. v. Hulsen ◽  
P. Thiyagarajan ◽  
U. Geyer
Keyword(s):  
Electron Beam Evaporation ◽  
Intrinsic Stress ◽  
Scanning Tunneling ◽  
Surface Roughening ◽  
Growth Stages ◽  
Tunneling Microscopy ◽  
Columnar Growth ◽  
Compressive Stresses ◽  
Stress Formation

AbstractThe growth of amorphous CuTi films, prepared by electron beam evaporation, is investigated by Scanning Tunneling Microscopy (STM), Small Angle Neutron Scattering (SANS) and in situ measurements of intrinsic mechanical stresses (ISM). In early growth stages the films develop compressive stresses and, with increasing film thickness, a crossover to tensile stresses. In the same thickness range the STM investigations show a change in the growth mode. Our experiments suggest a transition from planar growth with statistical surface roughening to columnar growth.

Scanning tunneling microscopy of the topology of vapour-deposited and electro-deposited metal films

1989 ◽  
Vol 47 ◽  
pp. 20-21
Author(s):  
J.B. Liu ◽  
Boyd Clark ◽  
J.Z. Duan ◽  
R.M. Fisher
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Film Growth ◽  
Metal Films ◽  
Critical Conditions ◽  
Scanning Tunneling ◽  
Internal Stresses ◽  
Detailed Knowledge ◽  
Film Material ◽  
Tunneling Microscopy ◽  
Direct Knowledge

The fracture and subsequent spontaneous delamination of thin metal films under the influence of excessive internal stresses, resulting from low temperature deposition and processing, can be extremely deleterious to the long term serviceability of IC devices. The conditions for fracture are determined by the magnitude of the residual stress, which can be measured by x-ray diffraction techniques, the fracture toughness of the thin film material and the size of any internal or sinface flaws that may be present.In order to establish the size and depth of microcracks at the surface, high resolution scanning (SEM) and transmission electron microscopy (TEM) and scanning tunneling microscopy (STM) are being used to define the topology of the surfaces of vapour-deposited films for comparison with electroplated films of the same metal. Direct knowledge of the surface relief is required to predict the onset of through-thickness cracking or to derive the fracture energy of the film material by detecting the critical conditions for cracking. Detailed knowledge of surface structures also is useful for understanding the mechanisms of film growth, including information on the crystallography of surface facets and growth steps.

An approach to imaging of living cell surface topography by scanning tunneling microscopy

1991 ◽  
Vol 177 (2) ◽  
pp. 636-643 ◽  
Author(s):  
Etsuro Ito ◽  
Tetsuo Takahashi ◽  
Kiyoshi Hama ◽  
Tohru Yoshioka ◽  
Wataru Mizutani ◽  
...  
Keyword(s):  
Cell Surface ◽  
Scanning Tunneling Microscopy ◽  
Surface Topography ◽  
Living Cell ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Structure, bonding, and growth at a metal–organic interface in the weak chemisorption regime: Perylene–Ag(111)

2004 ◽  
Vol 19 (7) ◽  
pp. 2028-2039 ◽  
Author(s):  
M. Eremtchenko ◽  
D. Bauer ◽  
J.A. Schaefer ◽  
F.S. Tautz
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Organic Semiconductors ◽  
Film Growth ◽  
Field Effect Transistors ◽  
Analytical Techniques ◽  
Model Systems ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Resolution Electron ◽  
Metal Organic

Organic semiconductors on single-crystalline metal surfaces are model systems for injection contacts in organic field-effect transistors (OFET) and light-emitting diodes. They allow us to classify possible metal–organic interaction scenarios and to elucidate general tendencies, which most likely will also be found at metal–organic interfaces in real devices. In this contribution, we report a comprehensive investigation of the interface of perylene, a promising material for OFETs, with the close-packed noble metal surface Ag(111), using high-resolution electron energy loss spectroscopy, low-energy electron diffraction, and scanning tunneling microscopy as surface analytical techniques. The most important findings are: In the monolayer, molecules are oriented flat and form an incommensurate, most probably fluid overlayer. The molecules interact electronically with the substrate and become weakly metallic. Scanning tunneling microscopy reveals a propensity of perylene molecules toward a specific adsorption site on Ag(111), if the influence of intermolecular interactions is inhibited. Film growth at room temperature is similar to Stranski–Krastanov type. Finally, co-planar adsorption of perylene on Ag(111) is metastable, and annealing the monolayer at 420 K leads to a structural transformation of the film. The perylene–Ag(111) interface can therefore be classified as weakly interacting.

Surface topography of oxidized HOPG by scanning tunneling microscopy

Carbon ◽  
1997 ◽  
Vol 35 (1) ◽  
pp. 35-44 ◽  
Author(s):  
D. Tandon ◽  
E.J. Hippo ◽  
H. Marsh ◽  
E. Sebok
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Surface Topography ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

The Morphology of Cu Clusters on SrTiO3(001) at Initial Stages of Metal Film Growth

1994 ◽  
Vol 357 ◽  
Author(s):  
Y. Liang ◽  
D. L. Carroll ◽  
D. A. Bonnell
Keyword(s):  
Vapor Deposition ◽  
Metal Film ◽  
Elevated Temperatures ◽  
Film Growth ◽  
Three Dimensional ◽  
Scanning Tunneling ◽  
Low Density ◽  
Tunneling Microscopy ◽  
Defect Sites ◽  
Island Density

AbstractCopper overlayers deposited on nearly stoichiometric SrTiO3(001) have been investigated with scanning tunneling microscopy (STM). Vapor deposition of Cu on a SrTiO3(001) surface at ambient temperature leads to the formation of three dimensional islands (clusters). The distribution of Cu islands appears to be inhomogeneous with two characteristic morphologies. In regions with a low density of Cu islands the Cu was always associated with step edges or defect sites. In regions with a high density of Cu islands the islands exhibit a random but nearly close packed morphology. The variation of Cu island density is indicative of diffusion of Cu clusters on the SrTiO3(001) surface. Diffusion was further confirmed by annealing the Cu/SrTiO3 at elevated temperatures yielding agglomeration of Cu clusters.

A STUDY OF THE DIFFUSION OF Pb ON THE Au(111) SURFACE BY STM AND EAM-MD SIMULATIONS

1999 ◽  
Vol 06 (05) ◽  
pp. 793-800 ◽  
Author(s):  
M. C. ROBINSON ◽  
A. J. SLAVIN ◽  
K. DE'BELL
Keyword(s):  
Film Growth ◽  
Md Simulations ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Qualitative Comparison ◽  
Embedded Atom ◽  
Surface Reconstructions ◽  
Diffusion Phenomena ◽  
The Impact ◽  
Herringbone Structure

Surface reconstructions often result in novel growth morphologies, and are therefore of potential technological interest. The Au(111) surface will reconstruct into the [Formula: see text] "herringbone" structure. Low coverages (up to 0.3 monolayers) have been studied with scanning tunneling microscopy (STM) at room temperature, to determine the impact of the reconstruction on diffusion and thin film growth. The same system has been studied using embedded-atom model molecular dynamics (EAM-MD). These simulations, in addition to providing morphological information, permit qualitative comparison of diffusion phenomena. Experimental results indicate that initial sites for Pb adsorption are located at the herringbone kinks. For higher coverages, Pb prefers hcp and fcc stacking regions, avoiding the herringbone ridges. The reconstruction is removed for some coverage between 0.05 and 0.2 monolayers. STM and EAM results will be compared.

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