Atomic Force Microscopy and Raman Spectroscopy Study of Strain Relaxation in InGaAs ON GaAs(100) Grown by Chemical Beam Epitaxy Using Unprecracked Monoethylarsine

1994 ◽  
Vol 355 ◽  
Author(s):  
Seong-Ju Park ◽  
Seung-Bock Kim ◽  
Jeong Sook Ha ◽  
Jeong-Rae Ro ◽  
El-Hang Lee ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Strain Relaxation ◽  
Chemical Beam Epitaxy ◽  
Spectroscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy and Raman spectroscopy study of the early stages of carbon nanowall growth by dc plasma-enhanced chemical vapor deposition

Carbon ◽  
2012 ◽  
Vol 50 (8) ◽  
pp. 2698-2702 ◽  
Author(s):  
Akihiko Yoshimura ◽  
Hirofumi Yoshimura ◽  
Seog Chul Shin ◽  
Ken-ichi Kobayashi ◽  
Makoto Tanimura ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
Spectroscopy Study ◽  
Dc Plasma ◽  
Force Microscopy ◽  
Early Stages ◽  
Atomic Force

scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

1994 ◽  
Vol 76 (6) ◽  
pp. 3443-3447 ◽  
Author(s):  
J. M. Yáñez‐Limón ◽  
F. Ruiz ◽  
J. González‐Hernández ◽  
C. Vázquez‐López ◽  
E. López‐Cruz
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Carbon Films ◽  
Force Microscopy ◽  
Atomic Force

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy and Raman spectroscopy of Pb1−xSnxTe surfaces polished after treatment with H2O2–HBr–ethylene glycol etchants

2019 ◽  
Vol 10 (8) ◽  
pp. 2717-2722
Author(s):  
G. P. Malanych ◽  
O. F. Kolomys ◽  
A. A. Korchovyi ◽  
N. V. Safriuk ◽  
V. M. Tomashyk
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Ethylene Glycol ◽  
Force Microscopy ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document