Sol-Gel Lithium Silicate Electrolyte Thin Films

1994 ◽  
Vol 346 ◽  
Author(s):  
E. Mouchon ◽  
L. C. Klein ◽  
V. Picard ◽  
M. Greenblatt

ABSTRACTFor more than a decade, the sol-gel process has been used to prepare lithium silicate gels that have potential applications as solid electrolytes in lithium batteries and electrochromic windows. The interest in these Li2O-SiC2 materials is their fast and stable ionic conductivity from room temperature up to 350°C. Typically these materials have been prepared with 15 mole % Li2O in bulk samples, but rarely in thin films. This work was undertaken to prepare chemically stable lithium silicate thin films with up to 30 mole % Li2O. Lithium nitrate was used as the lithium precursor. Solutions were evaluated for gelling time and homogeneity. Thin films were made by dip coating. After heat treatment at 200, 250 and 300°C, films were characterized for surface quality, thickness and microstructure using electron microscopy, x-ray diffraction analysis and profilometry. Transparency was investigated in the visible range (350–800 nm).

2007 ◽  
Vol 14 (02) ◽  
pp. 219-224 ◽  
Author(s):  
F. E. GHODSI ◽  
S. A. KHAYATIYAN

The NiO thin films were prepared from NiCl 2 · 6 H 2 O precursor by using sol–gel route. The films were deposited on a glass substrate using dip-coating technique. The optical and structural properties of the NiO thin films were investigated with respect to dipping rate, number of layers, and annealing temperature. The microstructure of NiO thin films and powder were examined by X-ray diffraction (XRD). Various diffraction peaks of NiO powder were observed in the XRD pattern. The morphology of the films was studied by using scanning electron microscopy (SEM). The optical characteristics of the samples were determined by using UV–visible spectrophotometer. The results show that the NiO thin films are transparent in the visible range. Optical constants (refractive index, extinction coefficient…) were changed by varying dipping rate, number of layers, and annealing temperature.


2005 ◽  
Vol 12 (05n06) ◽  
pp. 793-797 ◽  
Author(s):  
F. E. GHODSI ◽  
M. MAFAKHERI ◽  
A. NOVINROOZ

Thin films of Al 2 O 3 were prepared by the sol–gel process. Dip-coating technique was used for deposition of the Al 2 O 3 thin films onto glass substrates. Optical and structural properties of the films were investigated with respect to the annealing temperature (100–500°C). The structure of these films was determined by X-ray diffraction (XRD). Scanning electron microscopy (SEM) was performed for the analysis of surface morphology. For determination of the optical constants of Al 2 O 3 thin films, UV-Visible spectrophotometry measurements were carried out. Annealing temperature affects the structural and optical properties of the Al 2 O 3 thin films. The refractive index and extinction coefficient of the films at 550 nm wavelength increase from 1.56 to 1.66, and from 3.41 × 10-5 to 5.54 × 10-5, respectively while optical band gap and thickness of the films decrease from 4.15 eV to 4.11 eV, and 360 nm to 260 nm, respectively, by increasing annealing temperature from 100°C to 500°C.


1994 ◽  
Vol 341 ◽  
Author(s):  
Nelcy Della ◽  
Santina Mohallem

AbstractThin films of pure barium titanate have been prepared by the sol-gel process from organomettalic sols containing titanium alkoxides and barium acetate (molar ratio [Ba]/[Ti]=l). It leads to transparent, homogeneous and adherent coatings. The influence of various parameters such as chemical concentration, viscosity, withdrawal speed and temperature of densification on film thickness is described. The films were characterized by X-ray diffraction during their heat treatment. Their crystallization temperature was observed to be around 450°C. No variations in the optical properties were observed during the crystallization, and it occurred without the appearance of cracks or pinholes. Tetragonal BaTiO3 structure was observed, and the ferroeletric properties were investigated as functions of thickness and grain size.


2014 ◽  
Vol 1082 ◽  
pp. 451-454
Author(s):  
Tao Bai ◽  
Shi Gen Zhu

Various rare earth (La3+) doped titaniumdioxide(TiO2) thin films (La3+-doped TiO2) have been successfully prepared on a glass substrate by a sol–gel dip coating route using titanium tetraisopropoxide and lanthanum chloride as the initial materials. After the La3+-doped TiO2 thin films were calcined at 500°C for 1h, the effect of La3+-doping on the properties of films were investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM) and thermogravimetric- differential scanning calorimeter techniques (TG/DTG). The XRD results showed that all La3+-doped TiO2 thin films contained only a single crystalline phase of anatase TiO2 after calcining at 500°C for 1h. Moreover, the XRD results also revealed that the crystallinity and crystalline size decreased with increased La3+-doping. SEM micrographs showed that all La3+- doped TiO2 thin films have smooth surfaces containing granular nanocrystallines and are without cracks. TG/DTG measurement showed that there was a significant weight loss of the TiO2 precursor calcined in the temperature range from ambient to 660 °C, which was due to the volatilizing of water and organic and the phase transformation.


2002 ◽  
Vol 737 ◽  
Author(s):  
R.E. Melgarejo ◽  
M.S. Tomar ◽  
A. Hidalgo ◽  
R.S. Katiyar

ABSTRACTNd substituted bismuth titanate Bi4-xNdxTi3O12 were synthesized by sol-gel process and thin films were deposited on Pt substrate (Pt/TiO2/SiO2/Si) by spin coating. Thin films, characterized by X-ray diffraction and Raman spectroscopy, shows complete solid solution up to the composition x < 1. Initial results indicate that the ferroelectric polarization increases with increasing Nd content in the film with 2Pr = 50μC/cm2 for x = 0.46, which may have application in non-volatile ferroelectric memory devices.


2010 ◽  
Vol 93-94 ◽  
pp. 231-234
Author(s):  
B. Hongthong ◽  
Satreerat K. Hodak ◽  
Sukkaneste Tungasmita

Strontium substituted hydroxyapatite(SrHAp) were fabricated both in the form of powder as reference and thin film by using inorganic precursor reaction. The sol-gel process has been used for the deposition of SrHAp layer on stainless steal 316L substrate by spin coating technique, after that the films were annealed in air at various temperatures. The chemical composition of SrHAp is represented (SrxCa1-x)5(PO4)3OH, where x is equal to 0, 0.5 and 1.0. Investigations of the phase structure of SrHAp were carried out by using X-ray diffraction technique (XRD). The results showed that strontium is incorporated into hydroxyapatite where its substitution for calcium increases in the lattice parameters, and Sr3(PO4)2 can be detected at 900°C. The SEM micrographs showed that SrHAp films exhibited porous structure before develop to a cross-linking structure.


2009 ◽  
Vol 24 (8) ◽  
pp. 2541-2546 ◽  
Author(s):  
Eisuke Yokoyama ◽  
Hironobu Sakata ◽  
Moriaki Wakaki

ZrO2 thin films containing silver nanoparticles were prepared using the sol-gel method with Ag to Zr molar ratios [Ag]/[Zr] = 0.11, 0.25, 0.43, 0.67, 1.00, 1.50, and 2.33. After dip coating on glass substrate, coated films were annealed at 200 and 300 °C in air. X-ray diffraction peaks corresponding to crystalline Ag were observed, but a specific peak corresponding to ZrO2 was not observed. At the molar ratio [Ag]/[Zr] = 0.25, the particle size of Ag distributed broadly centered at 17 nm for an annealing temperature of 200 °C and at 25 nm for 300 °C. The films annealed in air at 200 °C showed an absorption band centered at 450 nm because of the silver surface plasmon resonance, whereas films heated at 300 °C in air caused a red shift of the absorption to 500 nm. The absorption peak was analyzed using the effective dielectric function of Ag-ZrO2 composite films modeled with the Maxwell-Garnett expression.


2020 ◽  
Vol 978 ◽  
pp. 384-389
Author(s):  
Sritama Roy ◽  
Saswati Soumya Dash ◽  
Prasanna Kumar Sahu ◽  
Smita Mishra ◽  
Jyoti Prakash Kar

Zinc Oxide (ZnO) thin films were produced by the sol gel dip coating process on the p-type silicon substrate with various withdrawal speeds changing from 1 to 4 cm/min, respectively. The films were annealed at a temperature of 500 °C for an hour in air ambient. The thin film thickness was found to be raised with the rise in withdrawal speed. The uniform distribution of the grains was appeared for all the films. The evolution of c-axis oriented (002) peak was revealed from X-ray diffraction (XRD) studies. The microstructural and optical properties of ZnO films were investigated by Raman, FTIR and photoluminescence spectroscopy (PL). The resistive switching properties of ZnO based memristors were studied by performing the current-voltage (I-V) measurements, where the thin films coated with lower withdrawal speed, have shown better switching property with rapid rise and fall of current during SET and RESET process, respectively.


2019 ◽  
Vol 07 (01n02) ◽  
pp. 1950002
Author(s):  
Nadir Lalou ◽  
Ahmed Kadari

This work proposes the synthesis of nanocrystalline calcium oxide (CaO) pure and doped with different concentrations of lithium (Li[Formula: see text]) ions by sol–gel process. Calcium nitrate (Ca(NO[Formula: see text]4H2O; 99.99%) and lithium nitrate (LiNO3; 99.99%) were used as precursors. The synthesized powders were characterized by several techniques such as: UV-Vis transmission spectroscopy, Fourier Transform Infra-red spectroscopy (FT-IR) and X-ray diffraction (XRD). The main objective of this paper is to study the influence of lithium (Li[Formula: see text] ratio) on the structural and optical properties of synthesized powders. The band gap values decreased with the increasing of Li[Formula: see text] ions in CaO lattice; the slight change in the band gap was directly related to the energy transfer between the CaO excited states and the 2s levels of Li[Formula: see text] ions. The influence of Li[Formula: see text] doping on the physical properties of CaO nanocrystalline will be studied for the first time in this work; no literature has previously published this kind of impurities.


1994 ◽  
Vol 9 (8) ◽  
pp. 2133-2137 ◽  
Author(s):  
Hideki Yoshioka

Thin films in the system (1 - x) PbTiO3−xLa2/3TiO3 were prepared by the sol-gel and dip-coating methods. Phases deposited in the films and the lattice parameters as a function of the composition were investigated by the x-ray diffraction method. The solid solutions with a perovskite structure were formed as a single phase with x up to 0.9. For the composition of x = 1.0, metastable La-Ti-O perovskite phase with a small amount of the impurity phase, La2Ti2O7, was obtained. Simulation of x-ray diffraction patterns based on the defect structure model shows that the structure of the La-Ti-O perovskite phase includes randomly distributed cation vacancies at the A-site, namely (La2/3□1/3)TiO3.


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