X-Ray Absorption Study of Ti and Cr Reactions with Triazine and Polyimide

1993 ◽  
Vol 323 ◽  
Author(s):  
K. Konstadinidis ◽  
R. L. Opila ◽  
M. A. Marcus ◽  
K. Short ◽  
A. E. White ◽  
...  

AbstractIn this paper we present results on the use of x-ray absorption spectroscopy and in particular extended x-ray absorption fine structure (EXAFS) to study non-destructively buried interfaces between polymers and metals. In particular we study the interaction between isolated metal atoms (Ti or Cr) and the surrounding polymer matrix (polyimide or triazine). The metal atoms have been introduced into the polymer matrix using ion-implantation. We find that Cr forms a π complex with the aromatic structures of polyimide and triazine in agreement with model compound and XPS data. Ti on the other hand seems to form Ti-O-C bonds with both polymers.

1991 ◽  
Vol 244 ◽  
Author(s):  
D. Sunil ◽  
H. Rafailovich ◽  
C. Sokolov ◽  
H. D. Gafney ◽  
S. A. Schwarz ◽  
...  

ABSTRACTX-ray absorption and Mossbauer spectroscopy were used to study chemical and magnetic properties of photodeposited Fe in Porous Vycor Glass(PVG). Extended X-ray Absorption Fine Structure(EXAFS) measurements of Fe samples show that after photolyzation, the Fe atoms are surrounded by two shells of six oxygen atoms and eight Fe atoms. The Fe-O and Fe-Fe distances are 1.84 °A and 1.99 °A respectively. After heating to 650 °C and 1200 °C shortening of bond lengths are observed. The second shell of Fe in unheated and heated to 650 °C samples have Fe-Fe distances of 3.0 °A and 2.98 °A respectively. Samples consolidated at 1200 °C show the Fe atoms to be surrounded by two shells of Fe atoms at 2.86 and 3.03 °A. This data together with Mossbauer and XANES spectra suggest that Fe exists in two different configrations, one is an Fe-Fe compound and the other is an octahedral Fe oxide similar to Fe2O3.


1989 ◽  
Vol 159 ◽  
Author(s):  
E. V. Barrera ◽  
M. W. Ruckman ◽  
S. M. Heald

ABSTRACTSurface extended x-ray absorption fine structure (SEXAFS) measurements on the nanometer level were made for AI/M interfaces where M was Cu or Ni. The samples were studied immediately after deposition and after heat treatments. Significant differences in interface reactions were observed depending on deposition direction (Cu on Al or Al on Cu) and the amount of mixing was also related to whether M was Cu or Ni. The SEXAFS measurements revealed that there were no detectable amounts of C or O present. One percent Zn was observed to be in the Al layers. The results obtained from the as-deposited interfaces correlate well with data obtained from buried interfaces of like element combinations.


Author(s):  
R.D. Leapman

Extended X-ray Absorption Fine Structure (EXAFS) analysis makes use of synchrotron radiaion to measure modulations in the absorption coefficient above core edges and hence to obtain information about local atomic environments. EXAFS arises when ejected core electrons are backscattered by surrounding atoms and interfere with the outgoing waves. Recently, interest has also been shown in using inelastic electron scattering1-4. Some advantages of Extended X-ray-edge Energy Loss Fine Structure (EXELFS) are: a) small probes formed by the analytical electron microscope give spectra from μm to nm sized areas, compared with mm diameter areas for the X-ray technique, b) EXELFS can be combined with other techniques such as electron diffraction or high resolution imaging, and c) EXELFS is sensitive to low Z elements with K edges from ˜200 eV to ˜ 3000 eV (B to Cl).


1987 ◽  
Vol 48 (C9) ◽  
pp. C9-1049-C9-1052
Author(s):  
P. BELOUGNE ◽  
B. DEROIDE ◽  
J. M. ESTEVA ◽  
R. C. KARNATAK ◽  
J. V. ZANCHETTA

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  

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