Amorphous-to-crystalline transition in Tb33Fe66 films studied via EXAFS

1993 ◽  
Vol 321 ◽  
Author(s):  
V. G. Hams ◽  
B. N. Das ◽  
W. T. Elam ◽  
N. C. Koon
Keyword(s):  
Conversion Electron ◽  
Quantitative Measurement ◽  
Radial Distance ◽  
Heat Treatments ◽  
Exafs Data ◽  
X Ray ◽  
Fe Sites ◽  
Sputter Deposited ◽  
X Ray Absorption

AbstractThe amorphous-to-crystalline transition in sputter-deposited amorphous Tb33Fe66 films has been studied using a conversion-electron extended X-ray absorption (EXAFS) technique. Modeling of the EXAFS data using theoretical and empirical standards allowed the quantitative measurement of coordination, radial distance, and disorder of local atom shells around the Fe sites after varying degrees of heat treatments.

Sampling depth in conversion-electron detection used for x-ray absorption

1992 ◽  
Vol 46 (11) ◽  
pp. 7144-7152 ◽  
Author(s):  
T. Girardeau ◽  
J. Mimault ◽  
M. Jaouen ◽  
P. Chartier ◽  
G. Tourillon
Keyword(s):  
Conversion Electron ◽  
Sampling Depth ◽  
X Ray ◽  
Electron Detection ◽  
X Ray Absorption

Conversion-electron extended X-ray absorption fine structure of ion-implanted nanocrystalline evaporated films

1990 ◽  
Vol 2 (41) ◽  
pp. 8113-8122 ◽  
Author(s):  
M Jaouen ◽  
P Bouillaud ◽  
T Girardeau ◽  
P Chartier ◽  
J Mimault ◽  
...  
Keyword(s):  
Fine Structure ◽  
Conversion Electron ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Ion Implanted

X-ray absorption near-edge structure of hexagonal ternary phases in sputter-deposited TiAlN films

2013 ◽  
Vol 561 ◽  
pp. 87-94 ◽  
Author(s):  
R. Gago ◽  
F. Soldera ◽  
R. Hübner ◽  
J. Lehmann ◽  
F. Munnik ◽  
...  
Keyword(s):  
Edge Structure ◽  
X Ray ◽  
Sputter Deposited ◽  
X Ray Absorption

Muffin-tin potentials in EXAFS analysis

2015 ◽  
Vol 22 (5) ◽  
pp. 1258-1262 ◽  
Author(s):  
B. Ravel
Keyword(s):  
Fine Structure ◽  
Data Analysis ◽  
Potential Surface ◽  
Cartesian Coordinates ◽  
Exafs Data ◽  
X Ray ◽  
Exafs Analysis ◽  
Standard Tool ◽  
X Ray Absorption ◽  
Original Cluster

Muffin-tin potentials are the standard tool for calculating the potential surface of a cluster of atoms for use in the analysis of extended X-ray absorption fine-structure (EXAFS) data. The set of Cartesian coordinates used to define the positions of atoms in the cluster and to calculate the muffin-tin potentials is commonly also used to enumerate the scattering paths used in the EXAFS data analysis. In this paper, it is shown that these muffin-tin potentials are sufficiently robust to be used to examine quantitatively contributions to the EXAFS data from scattering geometries not represented in the original cluster.

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