Nucleation of Dislocations in SIGe Layers

1993 ◽  
Vol 319 ◽  
Author(s):  
P.M. Mooney ◽  
F.K. Legoues ◽  
J.O. Chu
Keyword(s):  
Activation Energy ◽  
Low Temperature ◽  
Diffraction Study ◽  
Epitaxial Layer ◽  
Tilt Angle ◽  
New Method ◽  
Misfit Dislocations ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nucleation Of Dislocations

AbstractWe present an x-ray diffraction study of the variation of the tilt angle between a relaxed Si1−xGex epitaxial layer and the Si (001) substrate. Such measurements provide the basis for a new method to determine the nucleation activation energy of misfit dislocations. We show that the nucleation activation energy for 60° dislocations in the case of the multiplication mechanism observed in graded SiGe layers grown by UHV-CVD at low temperature is 4 eV.

Micro X-Ray Diffraction Study of Polycrystalline MgB 2 Wire and Evaluation of Carbon Doping Effect Via Low-Temperature Sintering

2019 ◽  
Author(s):  
Minoru Maeda ◽  
Dipak Patel, Dr. ◽  
Hiroaki Kumakura, Dr. ◽  
Gen Nishijima, Dr. ◽  
Akiyoshi Matsumoto, Dr. ◽  
...  
Keyword(s):  
Low Temperature ◽  
Diffraction Study ◽  
Carbon Doping ◽  
Doping Effect ◽  
Low Temperature Sintering ◽  
X Ray Diffraction ◽  
X Ray

Apparent Activation Energy in Low Temperature Aging of Y-TZP Ceramics

2010 ◽  
Vol 105-106 ◽  
pp. 100-103
Author(s):  
Qi Fei Xie ◽  
Cheng Wang ◽  
Qing Feng Zan ◽  
Li Min Dong
Keyword(s):  
Activation Energy ◽  
Low Temperature ◽  
Apparent Activation Energy ◽  
Coordinate Systems ◽  
X Ray Diffraction ◽  
X Ray ◽  
Low Temperature Aging ◽  
Diffraction Patterns ◽  
Straight Lines ◽  
Temperature Aging

Apparent activation energy in low temperature aging of two kinds of Y-TZP ceramic was studied in this paper. The ceramics were processed into small pieces, and aging in 100°C, 110°C, 120°C, 130°C and 140°C respectively. The content of monoclinic phase was calculated by X-ray diffraction patterns and the microstructure was scanned by SEM. According to MAJ law and Arrhenius formation, straight lines were fitted in coordinate systems of ln (ln (1/(1 − f )))-ln t and ln b-1/T, and the kinetic parameters of low temperature aging of Y-TZP ceramic were calculated according to these lines. The results revealed that grain size significantly affected apparent activation energy of Y-TZP ceramics.

Low temperature x-ray diffraction study of the phases of C70

1995 ◽  
Vol 94 (1) ◽  
pp. 37-40 ◽  
Author(s):  
J. Janaki ◽  
G.V.N. Rao ◽  
V.Sankara Sastry ◽  
Y. Hariharan ◽  
T.S. Radhakrishnan ◽  
...  
Keyword(s):  
Low Temperature ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray

Neutron and X-Ray Diffraction Study of the Low-Temperature Chemical and Magnetic Structure of Alpha-Manganese

1970 ◽  
Vol 2 (3) ◽  
pp. 670-677 ◽  
Author(s):  
J. A. Oberteuffer ◽  
J. A. Marcus ◽  
L. H. Schwartz ◽  
G. P. Felcher
Keyword(s):  
Low Temperature ◽  
Diffraction Study ◽  
Magnetic Structure ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Low temperature x-ray diffraction study on phase transitions

2012 ◽  
Vol 400 (2) ◽  
pp. 022118
Author(s):  
H Suzuki ◽  
H Kaneko ◽  
Y Xue ◽  
N Shumsun ◽  
A Savinkov ◽  
...  
Keyword(s):  
Phase Transitions ◽  
Low Temperature ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Anomalous lattice expansion of RuSr2Eu1.5Ce0.5Cu2O10−δ (Ru-1222) magneto superconductor: A low temperature X-ray diffraction study

2006 ◽  
Vol 445-448 ◽  
pp. 97-101 ◽  
Author(s):  
V.P.S. Awana ◽  
Rajeev Ranjan ◽  
Rajeev Rawat ◽  
L.S. Sharath Chandra ◽  
M. Peurla ◽  
...  
Keyword(s):  
Low Temperature ◽  
Diffraction Study ◽  
Lattice Expansion ◽  
X Ray Diffraction ◽  
X Ray
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