scholarly journals Transmission Electron Microscopy Study of Thick Copper-304 Stainless Steel Multilayers

1993 ◽  
Vol 311 ◽  
Author(s):  
M. A. Wall ◽  
T. W. Barbee ◽  
T. Weihs
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Stainless Steel ◽  
304 Stainless Steel ◽  
Orientation Relationships ◽  
Plan View ◽  
Transmission Electron ◽  
Bcc Structure ◽  
20 Nm ◽  
Fcc Structure

ABSTRACTThick (10 to 25 μm), free-standing, equal layer thickness, Copper(Cu)-304 Stainless Steel(SS) multilayer foils, having periods of lnm to 100 nm, synthesized by magnetron sputter deposition, have been examined by plan view and cross-sectional transmission electron microscopy. Multilayer growth morphology, individual layer structure and crystallographic phase orientation relationships were characterized in this study. Electron Energy Loss filtered imaging of a 20 nm period multilayer cross-section was also performed and showed that nickel had diffused into the Cu layers from the SS during synthesis. X-ray powder diffraction scans were performed and analyzed. A pure deposit of 304SS was synthesized and had a metastable BCC structure. Multilayer samples having periods of 20 nm were found to have a coherent layered Cu(FCC)- SS(FCC) structure. At larger periods (50 & 100 nm) a bimodal Cu(FCC)-SS(FCC & BCC) structure was formed. These observations show that the 304SS will grow with a metastable BCC structure when sputter deposited. When layered with Cu(FCC) the 304SS has its equilibrium FCC structure at layer thicknesses up to 10nm as a result of epitaxy with the copper. At larger SS layer thicknesses the SS appears to locally transform to the metastable BCC structure during synthesis, refining the grain structure of the depositing SS layer and the subsequent Cu layer. This transformation significantly increases the strength of the larger period multilayer.

Transmission Electron Microscopy of Martensitic Transformation in Xe-implanted Austenitic 304 Stainless Steel

2005 ◽  
Vol 20 (7) ◽  
pp. 1751-1757 ◽  
Author(s):  
Guoqiang Xie ◽  
Minghui Song ◽  
Kazutaka Mitsuishi ◽  
Kazuo Furuya
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Stainless Steel ◽  
Phase Transformation ◽  
Steel Specimen ◽  
304 Stainless Steel ◽  
Face Centered Cubic ◽  
Orientation Relationships ◽  
Transmission Electron ◽  
Bcc Phase

Thin film specimens of austenitic 304 stainless steel implanted with 100 keV Xe ions at room temperature were investigated. Microstructural evolution and phase transformation were characterized and analyzed in situ with conventional and high-resolution transmission electron microscopy. The phase transformation in a sequence from austenitic γ face-centered cubic (fcc) to hexagonal close-packed (hcp), and then to a martensitic α body-centered cubic (bcc) structure was observed in the implanted specimens. The fraction of the induced α(bcc) phase increased with increasing Xe ion fluence. Orientation relationships between the induced α(bcc) phase and austenitic γ(fcc) matrix were determined to be (011)α//(111)γ and [111]α//[011]γ. The relationship was independent of the induced process of the martensitic phase transformation for austenitic 304 stainless steel specimen, in agreement with the Kurdjumov–Sachs (K-S) rule. It is suggested that the phase transformation is induced mainly by the formation of the highly pressurized Xe precipitates, which generate a large stress level in stainless steels.

Sputtered and Reactively Grown Epitaxial GdAIO3 Films as Buffer Layers for C-Oriented YBa2Cu3O7-δ Films on R-Sapphire

1995 ◽  
Vol 401 ◽  
Author(s):  
S. Senz ◽  
H. Sieber ◽  
N. D. Zakharov ◽  
M. Lorenz ◽  
H. Hochmuth ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Cross Sections ◽  
Film Growth ◽  
Buffer Layers ◽  
Orientation Relationships ◽  
Ybco Films ◽  
Transmission Electron ◽  
20 Nm ◽  
Growth Methods

AbstractThin films of the orthorhombic perovskite GdAlO3 were grown on R-plane sapphire single crystals. Two different film growth methods were used, viz. (i) a chemical reaction of a Gd-O plasma with the sapphire crystals, and (ii) the reactive radio frequency (r.f.) sputtering of a GdAlO3 target. Subsequently, YBa2Cu3O7-δ (YBCO) films were deposited onto the GdAlO3 buffer by pulsed laser deposition (PLD). The GdAlO3 and YBCO films were investigated by Xray diffraction pole figure analysis and transmission electron microscopy (TEM), including highresolution transmission electron microscopy of cross sections. Independent of the deposition method the GdAlO3 films grew according to the nearly equivalent orientation relationships The GdAlO3 grains are additionally tilted by angles up to ± 3° around the sapphire [11.1] axis. On top of these buffer layers the YBCO films grew with c-orientation and with an in-plane rotation of 45°. YBCO films of 200 nm thickness on GdAlO3 buffer layers with a thickness of 10 to 20 nm showed a Tc > 87 K and a jc(77 K) > 3×106 A/cm2.

TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film

2010 ◽  
Vol 16 (6) ◽  
pp. 662-669 ◽  
Author(s):  
S. Simões ◽  
F. Viana ◽  
A.S. Ramos ◽  
M.T. Vieira ◽  
M.F. Vieira
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Cross Section ◽  
Ion Beam ◽  
Microstructural Characterization ◽  
Multilayer Thin Films ◽  
Tem Analysis ◽  
Plan View ◽  
Transmission Electron

AbstractReactive multilayer thin films that undergo highly exothermic reactions are attractive choices for applications in ignition, propulsion, and joining systems. Ni/Al reactive multilayer thin films were deposited by dc magnetron sputtering with a period of 14 nm. The microstructure of the as-deposited and heat-treated Ni/Al multilayers was studied by transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in plan view and in cross section. The cross-section samples for TEM and STEM were prepared by focused ion beam lift-out technique. TEM analysis indicates that the as-deposited samples were composed of Ni and Al. High-resolution TEM images reveal the presence of NiAl in small localized regions. Microstructural characterization shows that heat treating at 450 and 700°C transforms the Ni/Al multilayered structure into equiaxed NiAl fine grains.

Structural Investigation of Photoluminescent Porous Si by Transmission Electron Microscopy

1992 ◽  
Vol 281 ◽  
Author(s):  
S. Shih ◽  
K. H. Jung ◽  
D. L. Kwong
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Sample Preparation ◽  
Structural Investigation ◽  
Amorphous Material ◽  
Porous Si ◽  
Plan View ◽  
Mesh Structure ◽  
Transmission Electron ◽  
Minimal Damage

ABSTRACTWe have developed a new, minimal damage approach for examination of luminescent porous Si layers (PSLs) by transmission electron microscopy (TEM). In this approach, chemically etched PSLs are fabricated after conventional plan-view TEM sample preparation. A diffraction pattern consisting of a diffuse center spot, characteristic of amorphous material, is primarily observed. However, crystalline, microcrystalline, and amorphous regions could all be observed in selected areas. A crystalline mesh structure could be observed in some of the thin areas near the pinhole. The microcrystallite sizes were 15–150 Å and decreased in size when located further from the pinhole.

scholarly journals Transmission electron microscopy analysis of the crystallography of precipitates in Mg–Sn alloys aged at high temperatures

2014 ◽  
Vol 47 (5) ◽  
pp. 1729-1735 ◽  
Author(s):  
Xin Nie ◽  
Yimin Guan ◽  
Dongshan Zhao ◽  
Yu Liu ◽  
Jianian Gui ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Three Dimensional ◽  
Dark Field ◽  
Peak Hardness ◽  
Invariant Line ◽  
Orientation Relationships ◽  
Transmission Electron Microscopy Analysis ◽  
Transmission Electron ◽  
Annular Dark Field

The crystallographic orientation relationships (ORs) of precipitated β-Mg2Sn particles in Mg–9.76 wt% Sn alloy aged at 573 K for 5 h, corresponding to its peak hardness, were investigated by advanced transmission electron microscopy (TEM). OR-3 of (110)β//(0001)αand [\overline 111]β//[1\overline 210]αand OR-4 of (110)β//(0001)αand [001]β//[2\overline 1\overline 10]αare the key ORs of β-Mg2Sn particles in the alloy. The proportions of β-Mg2Sn particles exhibiting OR-3 and OR-4 were determined as 75.1 and 24.3%, respectively. Crystallographic factors determined the predominance of OR-3 in the precipitated β-Mg2Sn particles. This mechanism was analyzed by a three-dimensional invariant line model constructed using a transformation matrix in reciprocal space. Models of the interface of precipitated β-Mg2Sn and the α-Mg matrix were constructedviahigh-resolution TEM and atomic resolution high-angle annular dark-field scanning TEM.

Direct Deposition Reactions Between Nickel and Silicon Substrates

1993 ◽  
Vol 311 ◽  
Author(s):  
Lin Zhang ◽  
Douglas G. Ivey
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Silicon Substrates ◽  
Silicide Formation ◽  
Cross Sectional ◽  
Deposition Rates ◽  
Plan View ◽  
X Ray ◽  
Si Substrates ◽  
Transmission Electron

ABSTRACTSilicide formation through deposition of Ni onto hot Si substrates has been investigated. Ni was deposited onto <100> oriented Si wafers, which were heated up to 300°C, by e-beam evaporation under a vacuum of <2x10-6 Torr. The deposition rates were varied from 0.1 nm/s to 6 nm/s. The samples were then examined by both cross sectional and plan view transmission electron microscopy (TEM), energy dispersive x-ray spectroscopy and electron diffraction. The experimental results are discussed in terms of a new kinetic model.

Dislocations and stacking faults in stainless steel

1957 ◽  
Vol 240 (1223) ◽  
pp. 524-538 ◽  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Stainless Steel ◽  
Grain Boundaries ◽  
Stacking Faults ◽  
Stacking Fault ◽  
Stacking Fault Energy ◽  
Thin Sections ◽  
Partial Dislocations ◽  
Transmission Electron

Further experiments by transmission electron microscopy on thin sections of stainless steel deformed by small amounts have enabled extended dislocations to be observed directly. The arrangement and motion of whole and partial dislocations have been followed in detail. Many of the dislocations are found to have piled up against grain boundaries. Other observations include the formation of wide stacking faults, the interaction of dislocations with twin boundaries, and the formation of dislocations at thin edges of the foils. An estimate is made of the stacking-fault energy from a consideration of the stresses present, and the properties of the dislocations are found to be in agreement with those expected from a metal of low stacking-fault energy.

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