Contact-Free Determination of Scattering Times in Heterojunction Device Structures
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ABSTRACTIn this paper we present contact-free measurement techniques which are important for the evaluation of heterojunctions of interest for optical as well as high-speed devices. The techniques are the microwave-detection of Shubnikov-de Haas oscillations, photoluminescence-detected magneto-oscillations, and optically detected cyclotron resonance using microwaves (ODCR) as well as far-infrared lasers (FIR-ODCR). The techniques are illustrated by several examples, and the possibilities to determine 2D carrier concentrations, effective masses, and scattering times in the heterojunction structures are discussed.
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1993 ◽
Vol 184
(1-4)
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pp. 164-167
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2016 ◽
Vol 217
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pp. 100-108
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2016 ◽
Vol 231
(2)
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pp. 364-383
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