Interface Roughness: What is it and How is it Measured?
Keyword(s):
ABSTRACTA panel discussion on interface roughness was held at the Fall 1992 Materials Research Society meeting. We present a summary of the results presented by the invited speakers on the application and interpretation of X-ray reflectivity, atomic force microscopy (AFM), scanning tunneling microscopy (STM), photoluminescence and transmission electron microscopy. A transcript of the moderated discussion is provided in the final section.
1989 ◽
Vol 47
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pp. 778-779
Keyword(s):
1993 ◽
Vol 175
(7)
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pp. 1946-1955
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